Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Thickness Measurement
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Thickness Tester is a high precision mechanical contact method thickness tester, which can be used to thickness measurement of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Product
Thickness Check Calix
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For the manufacturing of a perfect cold strip, many factors are crucial. Our measuring frames specifically check the thickness-related quality parameters of the strip steel or steel sheet. Free of radioactive radiation, laser sensors are used in the cold strip areas that do not require protection measures with laser class 2, or only low precautions when using laser class 3B sensors. The installation of our measurement systems is quick and uncomplicated for our customers. The CALIX is integrated into the line with its C-shaped frame across the material flow. Our solutions with and without traversing determine all important parameters for quality assurance, including strip thickness, edge thickness, wedge or cambering, and measure the complete thickness profile. Thus, you have full process control in the current production.
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Thick Film Inspection
785
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For thicker coatings such as coal tars, extruded and tape coatings, the Model 785 has a range of infinite voltage settings from 1,000 to 15,000 volts.
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Thickness and Flaw Inspection
OmniScan MX ECA/ECT
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With thousands of units being used throughout the world, the OmniScan® MX is a field-proven, reliable instrument that is built to withstand harsh and demanding inspection conditions. Compact and lightweight, its two Li-ion batteries provide up to 6 hours of manual or semi-automated inspection time.
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Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Wafer Inspection Machine
IV-W2000
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The IV-W2000 is a wafer inspection machine that features on-the-fly scanning and inspection as well as automatic handling of 6/8/12-inch wafers. With the option to have a Chinese language UI, this machine is also known for being intuitive and user-friendly.
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Digital Thickness Gauge
K094
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For carpets, with weight set 20-2000 GM/cm², presser foot 412mm², range 0-25mm x 0.01mm.
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Industrial Protective Coating Thickness Gauge
456 IPC
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The Elcometer 456 Industrial Protective Coating Thickness Gauge1 is designed to measure dry film thickness on shot or grit blasted steel substrates.
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Product
Coating Thickness Meters
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PCE Instruments' accurate, affordable coating thickness gauge, thickness meter, surface testing and film gauge devices are used for material testing, manufacturing quality control and automotive paint inspection applications. Choose from a variety of coating thickness gauge, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum.
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Product
Wafer Tester
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Tokyo Electronics Trading Co., Ltd.
A vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD).
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Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Product
EHC-09 Ultrasonic Corrosion Thickness Gage - Monochrome
EHC-09
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Danatronics most popular thickness gages are those in our EHC-09 series. With thousands of units in the field, our durable, custom molded case with raise rubber keypad is IP54 rated and has proven it can handle your toughest jobs (this is bad help fix). The EHC-09 series is available in 6 models to suit every budget and application. What’s best is our simple upgrade path where all gages are capable of quickly and easily (directly from the keypad) adding any software options. Features include a graphic display with multiple languages, vibrate on alarm, fast minimum, echo to echo to ignore coatings, 100K reading Datalogger with export to excel, B-scan and live A-scan with waveform adjust.
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Product
Compact Passive and Active Resistor Trimming for Thick and Thin Film
LRT 2000C
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*Travel: 6" x 6"*Laser : Fiber Laser Ytterbium 1064 nm*Kerf: 30 to 80 micron Adjustable*Pulse width : 80 nano second*Rap Rate: 1 to 1 million Pulse Per Second*Average Power: 20 watts
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Product
Coating Thickness Gauge - Integral
Elcometer 456
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Whether you are measuring on smooth, rough, thin or curved surfaces, the Elcometer 456 Dry Film Thickness Gauge produces accurate, temperature stable measurements thanks to its ±1% thickness measurement capability and increased reading resolution.
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Product
Single Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Single Wafer Transfer Tools
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Hand Held Ultrasonic Thickness Meter
Multigauge 5600
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On screen user information such as probe frequency and remaining battery. Colour LCD display. Easy to use keypad and menu system.
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Product
Thickness and Flaw Inspection
MultiScan MS5800
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Eddy current testing is a noncontact method used to inspect nonferromagnetic tubing. This technique is suitable for detecting and sizing metal discontinuities such as corrosion, erosion, wear, pitting, baffle cuts, wall loss, and cracks in nonferrous materials.
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Product
Thickness Gauge
Multigauge 5300 GRP
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Designed to check the condition of Glass Reinforced Plastic (GRP) or Engineering Plastics. It can also be used on uncoated metal
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Product
EHC-03 Basic Corrosion Thickness Gages
EHC-03
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Danatronics is pleased to welcome our EHC-03 to our corrosion thickness gage family. The EHC-03 is designed to accurately and non-destructively measure metal structures subject to corrosion.
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Product
WAFER MVM-SEM® E3300 Series
E3310
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The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Product
ITA, G10, 10 Module, 0.88" Thickness
410104375
ITA
ITA, G10, 10 Module, 0.88" ThicknessCompatible with VPC 90-Series modules.
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Product
Batch Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Batch Wafer Transfer Tools
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Product
High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Glass Thickness Meters
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Shenzhen Linshang Technology Co., Ltd.
As a supplier of laser glass thickness gauge and glass thickness measuring tool, Linshang provides two models of glass thickness gauge that can be used to measure the thickness of various glasses, i.e: single-layer glass, double glazing, triple glazing, multilayer glass, LOW-E glass, and insulating glass, especially suitable for installed glass, such as doors and windows, curtain wall glass, etc.. It can measure the glass thickness as well as the thickness of air space (between the glass). The glass check works on the basis of reflection in the glass.
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Coating Thickness Meter for Ferrous and Non-Ferrous Substrates
CM8822
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- Operating principle: magnetic induction/eddy current (F/NF)- Measuring range:0-1000um- Resolution; 0.1/1- Accuracy: 卤1-3%n or 卤2.5um- Min. measuring area: 6mm- Min. sample thickness: 0.3mm - Battery indicator: low battery indicator- Metric/ imperial: convertible- Power supply: 4x1.5V AA(UM-3)battery- Auto power off- Operating conditions:0-+45鈩?/span>(32鈩?/span>-104鈩?/span>),鈮?0%RH- Dimensions: 160x68x32mm- weight: 250g(not including battery)- Optional accessories: other range 0-200um to 15000um
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Current Sensing Resistors, Thick Film Type
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Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
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Radar solution for thickness measurememt of steel & metal
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Our radar sensor solution determines the thickness and the thickness profile of steel plates, steel strips or steel slabs (up to 1600 °C hot) with an accuracy of up to ±10 µm on the roller conveyor. Thanks to robust radar technology, sophisticated signal processing and intelligent radar algorithms, OndoSense radar sensors achieve this high level of precision in thickness measurement even under the difficult production conditions of the steel industry with smoke, steam, dirt, vibrations, fire and extreme temperatures.
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Product
ECHO 7 Ultrasonic Precision Thickness Gage
ECHO 7
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ECHO 7 represents our most advanced thickness gage ever. ECHO 7 offers a 3.5” high resolution sunlight readable color display with live A-Scan, use of a wide variety of contact, delay line and immersion probes from 1-20 Mhz as default and custom created and stored applications setups, B-Scan, datalogger with up to 32GB of SD card memory and interface to Microsoft excel. The ECHO 7 is available in 4 models including the ECHO 7, ECHO 7DL, ECHO 7W and ECHO 7DLW.
