Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Thickness Meters
Choose from a variety of thickness meter, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum. Explore PCE Instruments' selection of accurate, affordable thickness meter, coating thickness gauge, surface testing and film gauge devices used for automotive paint inspection, material testing and manufacturing quality control applications.
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Coating Thickness gauges.
PELT gauges provide data for the precise control of exacting coating-applications including for automotive paints, wind turbine blade protective coatings, steel coil coatings, and shipping container anti-corrosion coatings. PELT gauges measure coatings on substrates including steel, aluminum, plastics, carbon fiber, composites, glass, and wood.
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Ultrasonic Thickness Gauge
SONOWALL® 50
The SONOWALL 50 features a highly accurate data read out and a large measurement range. An integrated data logger and its user-friendly operation make the device ready for a wide variety of applications. The included software is a convenient tool to store and evaluate the measurements.
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Thin Film Composition and Thickness Monitor
P-1000
The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and applications.
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Ultrasonic Thickness Gauges
Capable of performing measurements on a wide range of material, including metals, plastic, ceramics, composites, epoxies, glass and other ultrasonic wave well-conductive materials.
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Wafer Prober Networking System
PN-300
The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.
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Ultrasonic Thickness Gauge
Shenzhen Linshang Technology Co., Ltd.
Ultrasonic thickness gauges (ultrasonic thickness testers, ultrasonic wall thickness gauges, ultrasonic thickness meters, etc.) measure the wall thickness of materials such as steel, plastic, and more using ultrasonic technology which is ideal for measuring the effects of corrosion on metal, pipes or any structure where access is limited to one side.
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Ultrasonic Thickness Gauges
A widely used nondestructive test technique for measuring the thickness of a material from one side. It is fast, reliable, and versatile, and unlike a micrometer or caliper it requires access to only one side of the test piece.
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Wafer Internal Inspection System
INSPECTRA® IR Series
An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Concrete Coating Thickness Gauge
500
The Elcometer 500 Coating Thickness Gauge accurately measures the thickness of coatings on concrete and other similar substrates* - non destructively.
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Metal Thickness Tester
Multigauge 5500 Waist
Mounts onto a belt or chest harness for hands free use. Bright LED display. Top display for convenient viewing.
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Film and Paper Thickness Gauges
Economical, Accurate, Easy-to-Operate, our line of off-line paper / film thickness gauges are manufactured to meet TAPPI specifications for paper or ASTM specifications for film.
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Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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Thickness Measurement Products
Our film thickness measurement products are available for every application. We stock most of the products listed below for fast delivery. Browse through them or contact one of our Application Engineers, who can immediately assist you with your film thickness measurement needs.
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Thickness Gauging
There are two main types of thickness gauges; the Box Gauge for measuring on aluminium and clad aluminium strip, and the C-frame Gauge for measuring on any non-ferrous strip and foil.
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Equipment Front End Module Wafer Handler
Sigma EFEM
Integration transforms the bond tester into a fully automated system. We offer various types of EFEM (Equipment Front End Module) wafer handlers, to combine with a Sigma W12 for operator-free bond testing.
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UPG-07 Ultrasonic Precision Thickness Gages - Color
UPG-07
100K thickness datalogger with export to Excel 8 0z. Operates on 2 AA batteries Measures all engineering material Store and Recall setup for use with multiple materials All software options are field-upgradeable Vibrate and color change on alarm Illuminate the keypad on alarm condition Inform the operator when to replace the transducer Simple user-interface
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Epi Thickness & Composition System
Element
The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Terahertz Coating Thickness Analysis
TeraCota
TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
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Ultrasonic Thickness Gauge
TI-100K
TI-100K inherits high performance of predecessors including popular TI-45NA, and also have memory function and statistical processing performance.
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Wafer Back Side Cooling System
GR-300 Series
The GR-300 Series can control gases used to cool the back side of wafers that are fixed in position by an electrostatic chuck system.The stability and accuracy of the GR-300 makes it ideal for controlling the flow of Helium and Argon in wafer cooling systems.
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Flaw Detector & Thickness Gauge
DFX-7+
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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Moisture / Thickness / Density Meters
On-line multi IR wavelength analyzer utilizing infrared absorption technology for measuring product constituent and/or thickness.
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Thickness and Flaw Inspection
MultiScan MS5800
Eddy current testing is a noncontact method used to inspect nonferromagnetic tubing. This technique is suitable for detecting and sizing metal discontinuities such as corrosion, erosion, wear, pitting, baffle cuts, wall loss, and cracks in nonferrous materials.
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Coating Thickness Meter for Ferrous and Non-Ferrous Substrates
CM8822
- Operating principle: magnetic induction/eddy current (F/NF)- Measuring range:0-1000um- Resolution; 0.1/1- Accuracy: 卤1-3%n or 卤2.5um- Min. measuring area: 6mm- Min. sample thickness: 0.3mm - Battery indicator: low battery indicator- Metric/ imperial: convertible- Power supply: 4x1.5V AA(UM-3)battery- Auto power off- Operating conditions:0-+45鈩?/span>(32鈩?/span>-104鈩?/span>),鈮?0%RH- Dimensions: 160x68x32mm- weight: 250g(not including battery)- Optional accessories: other range 0-200um to 15000um
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Film Thickness Probe
FTPadv
The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
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Coating Thickness Gauge
CM8855
It meets the standards of both ISO2178 and ISO 2361 as well as DIN, ASTMand BS. It can be used both in the laboratory and in harsh field conditions. The F probes measure the thickness of non-magnetic materials (e.g. paint,plastic, porcelain enamel, copper, zinc, aluminum , chrome etc.) on magneticmaterials (e.g. iron, nickel etc.) . often used to measure the thickness ofgalvanizing layer, lacquer layer,porcelain enamel layer, phosphidelayer, copper tile, aluminum tile, some alloy tile, paper etc. The N probes measure the thickness of non - magnetic coatings on non-magnetic metals .It is used on anodizing, varnish, paint, enamel,plastic coatings, powder, etc. appliedto aluminum, brass, non-magnetic stainless steel, etc. Automatic substrate recognition. Manual or automatic shut down. Two measurement mode: Single and Continuous Wide measuring range and high resolution. Metric/Imperial conversion. Digital backlit display gives exact reading with no guessing or errors. Can communicate with PC computer for statistics and printing by the optional cable. Can store 99 groups of measurements. Statistics is available.2.SPECIFICATIONSDisplay: 4 digits LCD, backlitRange: 0~1250 μm/0~50mil (other ranges can be specified )Min.radius workpiece: F: Convex 1.5mm/Concave 25mmN: Convex 3mm/ Concave 50mmMin. measuring area: 6mmMin.Sample thickness : 0.3mmResolution: 0.1 μm (0~99.9μm);1 μm (over 100μm)Accuracy: ±1~3%n or 2.5 μm or 0.1mil(Whichever is the greater)Bttery Indicator: Low batter indicator.PC interface: with RS-232C interfacePower supply: 2x1.5 AAA(UM-4) batteryOperating condition: Temp. 0~50℃ .Humidity <95% .Size: 126x65x35 mm; 5.0x2.6x1.6 inchWeight: about 81g(not including batteries)Standard accessories:Carrying case ...................1 pc.Operation manual ............ 1 pc.F probe in built .................1 pc.NF probe in built...............1 pc.Calibration foils ..............1set.Substrate (Iron) ................1 pc.Substrate (Aluminium)......1 pc.Optional accessories: RS-232C cable & software:1.USB adaptor for RS-232C2.Bluetooth interface
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ECHO 8 Ultrasonic Corrosion and Precision Thickness Gage
ECHO 8
Danatronics offers our newest ultrasonic precision thickness gage line, the ECHO 8 series. ECHO 8 represents our most advanced thickness gage ever combining dual and single element transducers all in one small package. ECHO 8 offers a 3.5” high resolution sunlight readable color display with live A-Scan, use of a wide variety of dual, contact, delay line and immersion transducers from 1-20 Mhz as default and custom created and stored applications setups, B-Scan, datalogger with up to 32GB of SD card memory and interface to Microsoft excel. The ECHO 8 is available in 4 models including the ECHO 8, ECHO 8DL, ECHO 8W and ECHO 8DLW. The vibrate on alarm feature is the world’s first and is great for loud environments
