Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Power System Analysis Software
DSATools
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DSATools™ is a suite of leading-edge power system analysis tools that provides the capabilities for a complete assessment of system security, including all forms of stability. DSATools™ offers a complete toolset for power system planning and operational studies. In addition to rich modeling capabilities and advanced computational methods, the software is packed with useful study tools that enable significant productivity improvements.
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Product
Time-Series Data Analysis Software
OS-2000 Series
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OS-2000 series have been received well as time-series data analysis software which can perform flexible data-edit from huge amount of time-series data. The OS-2000 series can handle original format of other company's recorder and general-purpose formats of CSV and WAVE. In addition, simultaneous display, layout and overlapping can be performed smoothly without restrictions by the kind of data format or the number of sampling frequency.
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Product
Thermal-Optical Analysis
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As with other current organic carbon and elemental carbon (OC/EC) procedures, Thermal-Optical analysis is method-defined. However, this unit has been designed to specifically address some of the problems observed in other methods in assigning carbon to either the organic or the elemental fraction.
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Product
Spectrum Analysis For P50xxB Up To 44 GHz
S970907B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
C and C++ Testing, Static Analysis, Code Review
C++test
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Parasoft C++test is a complete C/C++ developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes. Available for common enterprise and embedded environments.
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Product
DFT Testability Analysis Software
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Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Product
Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
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*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Product
3D Sound Intensity Analysis Software
DS-0225A
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Finding out the position where the noise is occurring, and grasping the state of acoustic propagation are important ways to find effective noise countermeasure or improvement of acoustic environment.
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Product
Spectrum Analysis For P50xxB Up To 53 GHz
S970908B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
Automated Routine Analysis of Waters by Purge & Trap Concentration
AQUATek LVA
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The AQUATek LVA is a full automation solution for routine analysis of waters by purge and trap concentration. It utilizes a fixed volume loop that is filled with liquid sample, internal and/or surrogate standards are added, and then the sample is transferred to the Lumin or Stratum PTC. Upon completion of the purge step by the concentrator, the AQUATek LVA then initiates a clean up cycle where the sample loop and concentrator sparger are cleaned with 90o C water via the two-stage water heater.
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Product
Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
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*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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Product
Spectrally Controlled Interferometry For Measurement And Analysis
SCI
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Directly measure all surfaces and angles in one setup, for an ROI of < 1 year.
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Product
Multifunction Data Collection and Analysis System
9000
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The Model 9000 DME System is a high performance multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
Spectrum Analysis, Up To 26.5 GHz
S930902B
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The S930902B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 26.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Contactless One-Point Wafer Thickness Gauge
MX 30x
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The MX30x series are manual one-point Thickness gauges for silicon wafers.
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Product
SSA-J Precision Clock Jitter Analysis Software
E5001A
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To meet the demanding needs of today's advanced digital communication systems, Keysight offers Precision Clock Jitter Analysis software (E5001A SSA-J) for more precise and accurate characterization and evaluation of clock-signal jitter.
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Product
Visual Analysis Tool for GNSS Receiver Data
Panorama
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Panorama is the flagship tool when it comes to analyzing receiver data. When engineers use Panorama they spend more time looking at plots and making decisions, instead of making plots and writing reports. Panorama takes receiver data (.csv files) from PANACEA and RxStudio (other ODS products) and turns it into over 60 engineering plots ready to view at the click of your mouse. These plots give engineers and analysts the ability to view summary level data, head to head comparisons, receiver specific results, and 3D LLA replays using STK.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
Gas Analysis
QGA
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Hiden Analytical supplies precise and user-friendly tools for quantitative gas and vapour analysis. Our compact Hiden QGA system is a high performance gas analyser configured for real-time continuous monitoring of multiple species with an extremely wide dynamic range.
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Product
System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Product
Particulate & Source Analysis System
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Encompass the identification of microscopic particles.
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Product
Light Analysis
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Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic photodiodes (uncalibrated and calibrated), photodetectors (biased, amplified, and avalanche), CCD and CMOS arrays, position detectors, integrating spheres, and photomultiplier tubes. The Beam Characterization category contains beam profilers (camera and scanning slit), a wavefront sensor, spectrometers, and interferometers, while the Polarimetery link leads to a selection of instruments used to measure and control the polarization of light.
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Product
Spectrum Analysis For P50xxB Up To 9 GHz
S970902B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
Hematology Analyzer with Simultaneous Blood Analysis & CRP Measurement
Microsemi CRP LC-667G
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World exclusive concept: Simultaneous blood analysis + CRP measurement, along with data management. - CBC+CRP results in 4 minutes (15 tests / hour)- CBC results in 1 minute (55 tests / hour)- 19 parameters- Open Tube
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Product
Gas Analysis
Si-CA 030
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The Si-CA 030 offers everything heating engineers need to inspect and maintain residential and commercial boilers, with wireless connection to our smartphone app and automatic generation of servicing reports and certificates.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Quality Measurement Tools for Voice, Audio/Visual and Data Payload analysis
PEXQ
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PEXQ is OPTICOM’s latest product for Windows offering a complete portfolio of quality measurement tools for voice, audio/visual and data payload analysis based on human perception. PEXQ provides mandatory features in the area of R&D for the development of new multimedia codecs as well as for multimedia equipment manufacturers. Besides lab testing PEXQ is also ideal for network operators and carriers to measure quality of service. PEXQ is founded on well established internationally standardized measurement algorithms such as PESQ (ITU-T Rec. P.862, P.862.1 (narrow band), P.862.2 (wide band); Perceptual Evaluation of Speech Quality) and completely new metrics for video quality testing like PEVQ (Perceptual Evaluation of Video Quality).
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Product
*Structural Analysis
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Guangzhou Amittari Instruments Co.Ltd
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
