Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Wafer Manufacturing
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Scientific Computing International
A procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits on semiconductor wafers in semiconductor device fabrication process.
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Stress Analysis Strain Gages
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Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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CS/ONH-Analysis
G4 PHOENIX DH
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The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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Spectrum Analysis For P50xxB Up To 6.5 GHz
S970901B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Advanced Antenna Acquisition & Analysis
SW-A4
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Introducing Advanced Antenna Acquisition and Analysis (A4), the newest antenna measurement software from NSI-MI, expertly engineered for data collection, analysis, automation, and plotting. A4 builds upon the decades of experience and optimization built into NSI-MI’s legacy software platforms, NSI2000 and MI-3000, while adding modern features and capabilities that meet the challenges of today. A4 seamlessly blends the user-friendly interface of NSI2000 with the performance and versatility of MI-3000. Its intuitive design and powerful Application Programming Interface (API) deliver the adaptability needed to handle even the most challenging measurement tasks. A4 offers multicore, multithreaded support to greatly improve processing time while adding the ability to parallelize analysis and transformation tasks. Choose the perfect solution with NSI-MI's four software tiers, each packed with tailored features to match your specific requirements. Let NSI-MI help you choose the ideal package to fully unlock the potential of your antenna measurement range.
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True Dual-Channel Analysis on iOS
IOScope
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With IOScope, measure loudspeaker impedance, frequency response, and sensitivity. Measure a room impulse response. Tune a large sound reinforcement system, time-align a set of surround sound speakers, or optimize your home stereo. Determine the actual cutoff frequencies of your latest speaker crossover circuit, or teach your students the fundamentals of Fourier analysis of dynamic systems.
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Light Analysis
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Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic photodiodes (uncalibrated and calibrated), photodetectors (biased, amplified, and avalanche), CCD and CMOS arrays, position detectors, integrating spheres, and photomultiplier tubes. The Beam Characterization category contains beam profilers (camera and scanning slit), a wavefront sensor, spectrometers, and interferometers, while the Polarimetery link leads to a selection of instruments used to measure and control the polarization of light.
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Testing and Analysis Equipment
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Parker's testing and analysis equipment provides a quick, easy and accurate means of monitoring conditions in critical applications such as compressed air, water intrusion, and water treatment systems.
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Image Processing and Analysis Software
ENVI
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L3Harris Geospatial Solutions, Inc
ENVI is the industry standard for image processing and analysis software. It is used by image analysts, GIS professionals and scientists to extract timely, reliable and accurate information from geospatial imagery. It is scientifically proven, easy to use and tightly integrated with Esri’s ArcGIS platform.ENVI has remained on the cutting edge of innovation for more than three decades due in part to its support of all types of data including multispectral, hyperspectral, thermal, LiDAR and SAR. ENVI makes deep learning accessible to people through intuitive tools and workflows that don’t require programming. ENVI geospatial image analysis can also be customized through an API and visual programming environment to meet specific project requirements.
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Easy CAN Analysis Tool
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Easy CAN of Peritec made, is CAN analysis tool low price using NI cRIO-CAN and ECU test systems Peritec, PCMCIA-CAN, the USB-CAN.
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Dynamic Imaging Particle Analysis Technology
FlowCam® 8100
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Yokogawa Fluid Imaging Technologies, Inc.
The new FlowCam 8100 particle imaging and analysis system from global laboratory instrumentation manufacturer Fluid Imaging Technologies, Scarborough, Maine, features the company''s most advanced camera with the fastest imaging speed and double the image capture area to increase throughput, increase detection rates, and reveal more images and data. Imaging at up to 120 frames per second, the new FlowCam 8100 automatically detects thousands of individual particles and microorganisms in seconds, takes a high-resolution, digital image of each one detected and measures them in real-time based on their actual size and shape, not by an inference of their size and shape. Sampling at up to 100% efficiency with limited sample volumes as small as 200L, the company said, the FlowCam 8100 measures more than 30 different parameters from basic particle size, count and concentration to color, grayscale and advanced morphological characteristics such as circularity, elongation and fiber curl.
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FTIR Analysis
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Anton Paar offers state-of-the-art Fourier-transform infrared (FTIR) instrumentation with the possibility to automate and connect to other Anton Paar benchmark instruments. It combines FTIR spectroscopy with comprehensive data analysis to provide rapid results and increase efficiency in the laboratory. A high-resolution touchscreen with a user interface inspired by modern smartphones enables operators to conduct the most intuitive FTIR analysis available on the market. Anton Paar’s FTIR specialists and a worldwide service network are ready to support you with your spectroscopy applications.
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Website Analysis Software
Site Content Analyzer 3
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Site Content Analyzer 3 is new generation in website analysis software. It parses website on- and offline for keywords, suggests the most relevant and weighty phrases, analyzes link structure, and many more.
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Java Testing, Static Analysis, Code Review
Jtest
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Parasoft Jtest is a complete Java developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes.
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Rotating Machinery Analysis
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The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
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Partial Discharge Measurement and Analysis System
UHF 800
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Our UHF 800 is a system for measuring and analyzing partial discharges in the ultra-high frequency (UHF) range in testing environments with high levels of external noise.
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Safety Analysis
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Ensure System Safety and Cybersecurity. Dramatically decrease analysis efforts with efficient application of quality, safety, reliability and cybersecurity analysis methods at the system, item, software, hardware and PCB levels.
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EMI Check & Resonance Analysis Software
EMI Stream
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At the placement design stage, EMI Stream software examines optimal locations for parts by using actual .dsn files and verifies the effects of the proposed EMI solution. EMI Stream can analyze resonance which occurs between the power and ground planes by analyzing the resonance which occurs and changing the locations of capacitors.
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Proactive Downstream Spectrum Analysis
SpectraVizion
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SpectraVizion is an innovative, software-based diagnostics tool that leverages new advancements in remote spectrum capture, allowing cable operators to address downstream spectrum impairments proactively, before subscribers call in with service complaints. “Troubleshooting downstream spectrum issues has always been a reactive process for cable operators,” said Arthur Skinner, Vice President of Worldwide Sales for ZCorum. “Often they’re not aware they have an issue until a customer calls, and that’s when they then send a technician to the home with a hand-held meter to start a search for the problem.” SpectraVizion takes the guesswork out of problem identification and location by presenting on a simple dashboard a list of devices that are experiencing common downstream issues like Standing Waves, FM Noise, Suck-outs, Roll-off and Tilt. The tool leverages the spectrum data available from cable modems and set-top boxes that support full band capture, and advanced detection algorithms automatically identify devices experiencing downstream impairments. The operator can click on any device in the list to view a capture of the full spectrum from that day, or up to 30 days in the past.
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Wafer Inspection Products
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Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
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Microwave Furnace for Ash, Bone Content & Carbohydrate Analysis
Phoenix
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The Phoenix line of microwave muffle furnaces offers unmatched versatility and speed in a rugged, easy-to-use system. Choose from two configurations and a variety of options!
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Measurement Analysis Equipment
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Facility fault diagnosis measuring instrument with technology that accurately tracks the heating part and abnormal noise generating part during operation of machinery using thermal imaging camera and microphone
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Protocol Analysis
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GL's protocol analyzer provides monitoring a communication link in accordance with industry protocol standards by non-intrusively tapping the network under test. The simple framework of the protocol analysis software helps you easily identify the improper sequence of protocol messages, and filter out frames causing the protocol violation.
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Neutrals, Radicals and Ions Analysis
HPR-60 MBMS
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The Hiden HPR-60 molecular beam mass spectrometer is a compact skimmer inlet MS for the analysis of atmospheric plasma and reactive gas phase intermediates.
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Finite Element Analysis
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Response Dynamics Vibration Engineering, Inc.
An understanding of structural dynamics is very important to sound Finite Element Analysis (FEA). We have been performing FEA analysis for over 30 years and in most cases we have used experimental data to guide our modeling. While our engineers have had undergraduate and graduate courses in FEA, it is the years of modeling and analysis of existing structures that has taught us the most by forcing a thoughtful analysis of the key structural dynamics and then going though the process of making adjustments to boundary conditions, expanding the dynamics of the model in places, and making simplifications and approximations where possible.
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Portable Data Acquisition & Analysis System
LapCAT III
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# 4, 8, or 16 channels# 1 MHz aggregate 12 bit sampling. Resolution is 0.024% of full scale# 13 recording durations, user selected: 132 msec to 1320 sec# Digital Triggering from any channel, with +/- slope or window# 6 full scale gain ranges, user selected: 0.4, 1, 2, 4, 10, and 20 volts full scale - with a 10mV/g accelerometer these equal 40g, 100g, 200g, 400g 1000g and 2000g full scale - higher or lower ranges by different sensor selection
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LED Type Wafer Alignment Sensor Controller
HD-T1
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Panasonic Industrial Devices Sales Company of America
The HD-T1 Series is a new Wafer Alignment Sensor that uses a safe red LED light beam, with a resolution of 30µm, to achieve the same high level performance as Laser Sensors. The HD-T1 Sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image Sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style Sensor is developed for use in almost all fields of industry, e.g. tire manufacturing or Semiconductor production (Wafer Printed Circuit Boards).
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Hematology Analyzer with Simultaneous Blood Analysis & CRP Measurement
Microsemi CRP LC-667G
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World exclusive concept: Simultaneous blood analysis + CRP measurement, along with data management. - CBC+CRP results in 4 minutes (15 tests / hour)- CBC results in 1 minute (55 tests / hour)- 19 parameters- Open Tube
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Malware Analysis Tool
ThreatAnalyzer®
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See how you can defend your network from targeted attacks, advanced malware and Zero-days with ThreatAnalyzer®, the industry''s premier malware analysis sandbox. Our dynamic malware analysis sandbox (formerly known as CWSandbox) is used to dig deep into malware to reveal its impact on your organization so you can respond quickly – knowing what''s happening on your network and what systems or data are at the greatest risk.
