Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Finite Element Analysis (FEA) Solution
Femap
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Siemens Digital Industries Software
Femap is an advanced engineering simulation software program that creates finite element analysis models of complex engineering products and systems, and displays solution results. Femap can virtually model components, assemblies or systems and determine the behavioral response for a given operating environment.
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Product
ESPI Analysis Application
TP601010
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First released by Intel in June 2013, the Enhanced Serial Peripheral Interface (“eSPI”) is designed as a replacement for the Low Pin Count (“LPC”) bus. eSPI supports communication between Embedded Controller (EC), Baseboard Management Controller (BMC), Super-I/O (SIO) and Port-80 debug cards. eSPI was available in the Sky Lake chipset (2015) and is available in the Kaby Lake [current] chipset. Cannonlake will support eSPI and is slated for release the second half of 2017. Icelake is scheduled for release in 2019 and it will mark the first chipset when eSPI becomes mandatory.
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Product
Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
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The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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Aggregation Analysis System For Biopharmaceuticals
Aggregates Sizer
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The "Aggregates Sizer" aggregation analysis system enables the quantitative evaluation of particle amounts in the SVP range as a concentration (unit: μg/mL). Aggregations of biopharmaceuticals can be categorized into 3 ranges: IVP (In-visible Particle), SVP (Sub-visible Particle), and VP (Visible Particle), according to their particle size. Until now, no particle size analyzer could cover the SVP range with a single measurement. Therefore, multiple methods had to be used. Aggregates Sizer completely covers the SVP range.
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Telecommunication Analysis
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Software-Defined WAN for the Enterprise Securely connect users and applications while radically reducing hardware.
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Static Code Analysis Tool
Klockwork
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Klocwork integrates seamlessly into desktop IDEs, build systems, continuous integration tools, and any team's natural workflow. Mirroring how code is developed at any stage, Klocwork prevents defects and finds vulnerabilities on-the-fly, as code is being written.
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Product
Data Analysis Software
APP ClearView
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APP ClearView™ is the ideal data analysis software for engineeres and managers that need system information and answers quickly. It has a wide varity of graphics, math functions, reports, and file manipultion features that allow the user to easily navigate through their data. It supportsimporting of indisustry standrad formats such as COMTRADE (Common Data Transient Data Exchange) version 1996, 1997, and 1999.
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Sound and Vibration Analysis
Compact Analysis
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Compact Analysis is an ArtemiS SUITE module which is focused on the basic functions and the ideal tool for tasks that only require a few clicks.
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Data Acquisition and Analysis Software
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Matec Instrument Companies, Inc.
Matec provides a full suite of Microsoft Windows pc-based data acquisition and analysis software for your ultrasonic testing applications. In addition to our base software packages, our team of software engineers can work with you to develop customized scan forms and algorithms specific to your application demands.
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Multi-omics Analysis Package
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The Multi-omics Analysis Package, developed for metabolic engineering applications, provides the ability to automatically generate metabolic maps and perform a variety of data analysis for the vast data generated in fields like metabolomics, proteomics and flux analysis. It offers a powerful platform to support drug discovery, bioengineering and other life science research applications.
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Product
Terahertz Coating Thickness Analysis
TeraCota
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TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
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Biochemical Oxygen Demand (BOD) Analysis Systems
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MANTECH has a variety of biochemical oxygen demand (BOD) systems to best suit the needs of your laboratory. Whether you need manual or automated, big or small, simple or complex, MANTECH can create the ideal BOD solution for your laboratory. MANTECH’s Automated BOD analysis systems are robust, come with easy to use software, and provide accurate results that stand the test of time.
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Product
Packet Analysis Probe for PCI Express
N4220A/B
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When purchased with a logic analyzer, the application software you order is installed on the instrument hard drive. If you need to add application support after your initial logic analyzer purchase or are controlling a logic analyzer from a host PC, you must install the appropriate software before you can make measurements.
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
LC/MS/MS Method Package For Water Quality Analysis
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Shimadzu provides method files, including pre-registered MRM parameters with optimized quantitative and reference ions, LC separation parameters, and retention times and peak identification parameters for each compound, as well as report templates for outputting quantitation results, as a package. If retention times are adjusted when the system is introduced, based on the HPLC configuration delivered, the analysis process can be started as soon as the specified columns, mobile phases, and standard samples are supplied.
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High Resolution Frequency Response Analysis (FRA) System
TR-AS FRA
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The Frequency Response Analysis (FRA) on power transformers is used for diagnosis at works, after putting into operation and for maintenance on site. The frequency dependent admittance is determined and recorded as fingerprint.
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Neutron Activation Analysis
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Neutron Activation Analysis (NAA) is one of the most sensitive analytical techniques used for multi-element analysis available today. The NAA procedure is capable of providing both quantitative and qualitative results for individual elements, with sensitivities that can be superior to those possible by any other analytical technique. Elemental Analysis Incorporated (EAI), as an innovator in the development and application of radio-nuclear chemistry analytical techniques, now offers its clients the ability to analyze some 75 individual elements (including certain organic elements) by NAA at trace and ultra-trace concentrations. Moreover, by developing scientific liaisons with selected nuclear reactor sites in North America, EAI is able to offer customers the expertise and capabilities of the premier scientists and research facilities available today. Combined with EAI’s tradition of excellence in customer service and technical assistance, EAI is uniquely positioned to assist clients with timely, cost-effective, and reliable trace element analysis for almost every conceivable field of industry or scientific research.
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Seismic Analysis and Monitoring
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Seismic analysis and monitoring have been designed on the base of the contemporary seismic studies. We can offer you a wide range of tools for geophysical surveys, seismic tomography, automated monitoring of bearing structures (structural health monitoring), seismic monitoring of oil piping systems.
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Product
Wafer Inspection System
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JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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Water Silica Analysis
Navigator AW641
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ABB's Navigator 600 Silica analyzer substantially cuts the costs and maintenance associated with silica monitoring in power generation and other large-scale steam and water dependent applications.
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Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
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*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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Product
Cross-Spectrum CPB (Constant Percentage Bandwidth) Analysis
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CPB analysis is used for fractional octave spectral processing of signals coming from the input channels of FFT spectrum analyzers (in real time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals. CPB analysis is used for separating signals into basic constituents in the frequency area in 1/3-, 1/12-, 1/24-octave spectral bands. The software is used for noise spectral analysis within the scope of acoustic and vibrational measurements.
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Acoustics Analysis
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The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Product
DDR4 Protocol Debug And Analysis Solution
U4972A
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The U4972A DDR4 DRAM bundle provides software applications, probing, and hardware options for DDR4 DRAM debug, compliance validation, and analysis. The U4972A bundle includes systemization of hardware (modules installed into chassis) and software loaded onto the M9537A controller.
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Vibration Analysis
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The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Automated Routine Analysis of Waters by Purge & Trap Concentration
AQUATek LVA
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The AQUATek LVA is a full automation solution for routine analysis of waters by purge and trap concentration. It utilizes a fixed volume loop that is filled with liquid sample, internal and/or surrogate standards are added, and then the sample is transferred to the Lumin or Stratum PTC. Upon completion of the purge step by the concentrator, the AQUATek LVA then initiates a clean up cycle where the sample loop and concentrator sparger are cleaned with 90o C water via the two-stage water heater.
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Non-contact Inline P/N Checker Module For Solar Wafer
PN-100BI
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*Principle: Photovoltaic effect with the laser diode*Suitable for production line and tranceportation system*Connect to host PC by LAN to send measurement command and data
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Product
LMK Image Capturing & Analysis Software
LMK LABSOFT
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TechnoTeam Bildverarbeitung GmbH
The LabSoft image capturing and analysis software for the LMK offers a wide functionality for various photometric and colorimetric applications. We are continually expanding the software's functionality by an intensive exchange of experience with our customers. We are also constantly improving the usability of this intuitive software.
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Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Surface Analysis
InSight-450 3DAFM
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Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.
