Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Enhanced Time Domain Analysis With TDR
S97011B
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This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications.
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Product
Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Product
Chemical Analysis and Corrosion Testing
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Performing chemical analysis of metal alloys including both ferrous and non-ferrous alloys.Chemical analysis involves determining the chemical constituents of metals and related materials.An industry leader and co-operating laboratory for qualifying Calibration Standards for Chemical Analysis.Our chemical laboratory processes include Spectroscopy – Optical Emission Inductively Coupled Plasma, gas analysers, wet chemical, Intercrystalline/ Intergranular Corrosion (including G28, G48 etc).
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Product
Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Product
Measuring & Analysis Equipment
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Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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Product
Dynamic Signal Analysis Software
ObserVIEW
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Vibration Research Corporation
View, edit, and analyze waveforms from recorded or live data. This powerful and efficient vibration analysis software package includes specialized modules for waveform recording and test generation.
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Product
Enhanced Time-Domain Analysis With TDR
S95011B
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This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications. All functionality of the S95010B are included (TDR/TDT mode). In addition, the S95011B enables more detailed measurements and evaluations, such as eye-diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S95011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical calibration kits or ECal with DC option (i.e., N469xD or N4433D with Option 0DC) are recommended.
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Product
Pro Antenna Analysis Software
MININEC
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MININEC Pro is an antenna analysis program for Windows and Macintosh computers. Any type of antenna may be analyzed. The physical design of the antenna is entered (such as the lengths of wires and elements). For a given frequency, the feedpoint impedance is calculated, along with theoretical efficiency.
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Product
Surface Form Analysis System
Tropel® FlatMaster®
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Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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Product
Veracode Static Analysis
SAST
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*Find Flaws Accurately, at ScaleScan over 100 languages and frameworks quickly and accurately.*Prioritize and Fix Flaws FastRapidly find and fix vulnerabilities with real-time feedback and reduce flaws introduced in new code by up to 60% with IDE scans.*Deliver a Frictionless Developer ExperienceCode confidently with contextual learning and easy integration with over 40 developer tools and custom APIs.*Streamline Governance, Risk Management, and ComplianceManage and measure the security posture of your applications with enterprise-wide security policies, robust reporting, and comprehensive analytics.
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Product
Data Acquisition Analysis SystemWave Stocker
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This is the really useful equipment which our Solution Teamdeveloped using their experience obtained at their customer' s site.Simultaneous measurement by with sampling of max.16 channels is possible, enabling easy waveform analysis. This can be used for versatile tasks as the measurement at the site, inspection and R & D.
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Product
Liquid Analysis
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Sensors for conductivity measurements and detection of air and gas bubbles.
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Product
Surface Analysis
Dimension FastScan Bio
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The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Product
Pharmaceutical Analysis Contract Services
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Specialist pharmaceutical analysis contract services to support development programs (R&D), regulatory submissions, GMP manufacturing and post-marketing requirements Pharmaceutical analysis contract services can play an important role in your the development process and GMP manufacturing. Concerns about drug safety, costly development programs, complex manufacturing, market demands for evidence-based data and increased regulatory requirements are all issues that can be addressed through a better understanding of your drug substance, drug product or manufacturing process which, in turn, can only be achieved through experienced analytical studies and robust analytical data.
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Product
Time Domain Analysis
S93010A
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The time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
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Product
Noise & Vibration Analysis
DATS Software
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DATS is a comprehensive package of data acquisition, signal processing and reporting tools. It is used mainly for noise and vibration analysis, but can be used for a wide range of engineering and general signal processing tasks.
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Product
Radio Monitoring and Signal Analysis
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Shoghi has a full portfolio of products which fulfill the customer requirements for radio monitoring and signal analysis. Shoghi has a very robust SDR based wideband radio monitoring solution which can be implemented both in static or mobile versions for HF and VHF/UHF frequency bands. The Shoghi Radio Monitoring and DF system is the full-fledged product which provides the facilities for wideband signal reception and advanced signal analysis capabilities in addition to both wideband and narrowband D capabilities. The signal analysis capabilities include the ability to demodulate and decode both narrowband and wideband signals and advanced signal protocol analysis for detection of specific data protocols used in the intercepted RF signals.
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Product
Wafer Tester
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Tokyo Electronics Trading Co., Ltd.
A vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD).
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Product
Data Analysis Software
PV II
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Software to communicate and display data from PQPro™ Power Quality Analyzer.Can connect wirelessly (Bluetooth) to multiple instruments.View real time data numerically, vector diagrams and analog meter format.View downloaded data in graphical form.Multiple graphical pages can be open at the same time.Graphs can be annotated with data boxes and text bubbles.Graphs can be pasted in to Word or Excel files.Export data in CSV format.Export data in PQDIF format.Export section of data file to PV II format.Generate reports with both graphical and tabular data.
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Gas Analysis
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Our infrared gas detectors provide superior sensitivity and reliability that may be translated into a more effective early warning system when monitoring atmospheres for gases at trace levels. Our technology also offers the opportunity to perform sophisticated gas analysis. One example: To assure personal safety during a medical procedure, our gas detectors deliver a precise monitoring of the ratio of exhaled gases of a hospital patient who is under general anesthesiology. Another example, no canary need die in a mine if Dexter gas detectors are installed on the job. Infrared lead detectors, whether mobile or mounted, can be a critical element in your health and safety strategy at home and on the job, whatever life forms it is your responsibility to protect.
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Product
Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
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Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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AdWords analysis software
AdWords Clever Wizard
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AdWords™ Clever Wizard is extremely easy-to-use AdWords suggestion and research software. It's always a good idea to check the keyphrases you are going to use in a Google AdWords campaign for their efficiency and popularity. For each keyphrase AdWords™ Clever Wizard shows the number of searches per month, its KEI, overall ad efficiency, average bid (Google source) and also suggests a number of synonyms you can check right away. Supports Unicode. Allows you to import and export keyphrase lists.
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Stator Wedge Analysis
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Loose stator wedges can lead to coil vibration and erosion of stator insulation. Iris Power stator wedge tightness testing provides a consistent and quantitative means of identifying the location and severity of loose stator wedges in order to plan rewedging or other necessary repairs.
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Product
Image Analysis & Stage Micrometers
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The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Transient Stability Analysis
I*SIM
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PTW I*SIM is a program for transient stability analysis. It is designed to simulate system response during and after transient disturbances such as faults, load changes, switching, motor starting, loss of utility, loss of generation, loss of excitation, and blocked governor events. I*SIM is designed to study today's most challenging simulation problems in one convenient and easy-to-use program.
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Product
CS/ONH-Analysis
G4 ICARUS Series 2
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The combustion analyzer G4 ICARUS Series 2 with high frequency (HF) induction furnace and HighSense™ detection sets new standards in for a rapid and precise carbon (C) and sulfur (S) analysis in inorganic solids.
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Product
Residual Gas Analysis
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Systems for the examination of components present in a vessel or evolved from a process.Measures the concentration of gases and vapours in real time.
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Product
CS/ONH-Analysis
G8 GALILEO
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All state-of-the-art detectors used in the G8 GALILEO are equipped with internal reference channels for utmost stability and allow detection limits in a sub-ppm range (based on 1g sample mass)
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Product
Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Analysis Software
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Analysis software that can streamline how you collect, analyse and report your bat call data.





























