Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Code Analysis
Kiuwan
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Identify code defects & vulnerabilitesto manage your remediation effortsBlazingly fast analysis in a collaborative and unlocalized environment.
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Image Analysis Software
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Olympus image analysis software turns an Olympus microscope into an effective, high-performance analysis station. Its intuitive operation enables smooth image acquisition, filtering, measurement, documentation and archiving.
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Product
Complete Power Analysis System
PK3564-PRO+
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PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
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Hybrid Worst-Case Timing Analysis
TimeWeaver
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AbsInt Angewandte Informatik GmbH
TimeWeaver combines static path analysis with timing measurements to provide worst-case execution time estimates.The tool estimates the worst-case execution time (WCET) of tasks based on the execution time of trace segments obtained from real-time instruction-level tracing. The computed time bounds are valuable for soft real-time systems and provide feedback for optimizing worst-case performance.
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Measurement, Data Analysis, Visualization, Automation
Imc STUDIO
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With imc STUDIO, you are ready to start your measurement in a few minutes. A clearly organized channel configuration list, extensive sorting and filtering functions, numerous assistants, built-in sensor management and support of TEDS are just some of the useful functions for achieving quick, intuitive system configuration.
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Static Code Analysis for Embedded Software
GrammaTech CodeSonar®
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CodeSonar is GrammaTech´s flagship static analysis software. Able to analyze both source code and binary code, it is specifically designed for zero-tolerance defect environments. With its advanced static analysis engine, CodeSonar is one of the most effective tools for eliminating the most costly and hard-to-find software defects early in the application development lifecycle. Compared with other tools, CodeSonar identifies twice as many defects that result in system crashes, leaks, data races, memory corruptions and security vulnerabilities.
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Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Product
Time Domain Analysis
S96010B
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The S96010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on the E5080B.
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Network Analysis
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Network analysis includes a powerful set of analytical tools that allow for simulation, prediction, design and planning of system behavior utilizing an intelligent one-line diagram and the flexibility of a multi-dimensional database.
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Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Product
Fast Electromagnetic Analysis Suite
FEMAS
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FEMAS was created to provide tools for engineers to assist in PCB and system design. Our tools are based on full wave solutions to Maxwell's equations but operate much faster than traditional CEM tools. Multi-Functional! End-to-End Link Path Analysis. S-parameter file concatenation. Time Domain analysis. Frequency Domain analysis. Transmit/Receive Equalization. Causality/Passivity Checking/enforcement. 2D Cross Section Analysis for multi-conductors. S-parameter and waveform plotting.Network parameter conversion. De-Embedding. Signal Analysis.
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Power Analysis Software
PAS
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PAS is SATEC's comprehensive analysis and engineering software designed to program and monitor all SATEC devices. It includes a variety of additional tools to assist in system setup, such as the communication debugging module.
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Circuit Breaker Analysis Systems
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When a fault such as a short circuit or current overload is detected by a protective relay, a trip impulse is sent to the circuit breaker. The circuit breaker must function as specified and interrupt the current as soon as possible or severe damage may occur. The damage caused by a malfunctioning circuit breaker can often be catastrophic, resulting in significant damage to the electrical system.
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X-ray Diffraction and Elemental Analysis
D8 ADVANCE
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The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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Measuring & Analysis Equipment
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Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Sensor Placement & FEA Analysis
GageMap - GM
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APEX Turbine Testing Technologies
Apply strain gages and accelerometers to your finite elementmodel independent of the mesh anywhere you want, or letGagemap do it for you.
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Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Data Acquisition and Analysis Software
Magnifi®
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Eddyfi® Magnifi® is a constantly evolving, integrated electromagnetic inspection data acquisition and analysis software. It boasts an intuitive graphical user interface (GUI) suited to modern devices, powerful reporting functions and data management, as well as simple inspection configurations.
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Harmonic Analysis Software
HI_WAVE
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HI_WAVE simulates resonance and harmonic distortion in industrial, commercial, and utility power systems.
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Spectroscopy & Scientific Analysis Systems
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Advancing Knowledge. Empowering Breakthroughs. Our spectroscopy instruments and software help advance knowledge and understanding of radioactive materials, empowering the next wave of breakthrough science and innovation.
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Gas Analysis
HPR-40 DEMS
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The Hiden HPR-40 DEMS is a bench top or mobile cart mounted module for analysis of dissolved species in electrochemistry. The system is modular and adaptable. The system includes two differential electrochemical mass spectrometry ‘DEMS’ cell inlets, designed for material/ catalysis studies, cell type A, and electrochemical reaction studies, cell type B.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Video Analysis Software
BrainChip Studio
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BrainChip Studio aids law enforcement and intelligence organizations to rapidly search vast amounts of video footage and identify patterns or faces. A result of over 10 years of R&D, it uses an artificial intelligence (AI) technology called a spiking neural network (SNN), a type of neuromorphic computing that simulates the functionality of the human visual tract. Because faces have unique identifying features, the software includes advanced facial detection, extraction and classification algorithms. The SNN technology enables BrainChip Studio to work on low-resolution video and requires only a 24x24 pixel image to detect and classify faces.
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Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Gas Analysis
HPR-20 EGA
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The Hiden HPR-20 EGA gas analysis system is configured for continuous analysis of evolved gases and vapours from thermogravimetric analysers, TGA.
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Log Analysis Reporting Suite
Cyfin
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Cyfin is a customizable employee Web-use forensic log file analyzer and reporting solution. It is used by a variety of business and government organizations around the world. Scalability - Most scalable commercial log data analysis tool. Forensics - Capable of generating extremely detailed user audit reports. Comprehensive - Dashboard charting and trending system. Compatibility - Palo Alto, IronPort, SonicWall, WatchGuard, and many others. Regulatory Compliance - Covers requirements such as CIPA, HIPAA, & others.
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Surface Analysis
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Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
