Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Signal Analysis
FFT Analysis
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The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Image Analysis
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In today's demanding environment where quality assurance is an everyday requirement Aprotec have sought to find present day retrofit solutions that compliment fully functional older machinery.
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Beverage Analysis
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Analyze multiple quality control parameters of your beverages in parallel, within 3 to 5 minutes only. See all parameters on a bright, easily customized 10.4’’ touchscreen display. Anton Paar’s modular beverage analysis solutions are quickly adapted to your needs in a Plug and Play fashion. In any case, the sample filling and measurement process is completely transparent and traceable.
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Acoustics Analysis
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The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Wafer Internal Inspection System
INSPECTRA® IR Series
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An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Wafer Prober
Prexa
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The latest fully automated 300mm wafer prober. The system offers excellent productivity and advanced functions, contributing to KGD (known good die) testing for advanced packaging.
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Gas Analysis
HPR-20 EPIC
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The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Vibration Analysis
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The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Wafer Demounting And Cleaning Machines
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Demounting and cleaning to high throughput fully automatic ingot after cutting in the slicing machine and wire saw.
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Gas Analysis
HPR-20 TMS
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The Hiden HPR-20 TMS Transient MS is configured for fast event gas analysis of gases and vapours at pressures near atmosphere. Ideal for fast gas switching experiments the MS features the Hiden QIC quartz-lined 0.9 m sampling interface.
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In-Process Wafer Inspection System
7945
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Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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FTIR Analysis
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Anton Paar offers state-of-the-art Fourier-transform infrared (FTIR) instrumentation with the possibility to automate and connect to other Anton Paar benchmark instruments. It combines FTIR spectroscopy with comprehensive data analysis to provide rapid results and increase efficiency in the laboratory. A high-resolution touchscreen with a user interface inspired by modern smartphones enables operators to conduct the most intuitive FTIR analysis available on the market. Anton Paar’s FTIR specialists and a worldwide service network are ready to support you with your spectroscopy applications.
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Grease Analysis
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Maintenance Reliability Group, LLC
MRG Labs follows grease sampling and analysis standards outlined in ASTM D7718 and ASTM D7918. Grease analysis is a valuable tool for determining the condition of the lubricant and discovering abnormal conditions in equipment that may otherwise lead to unexpected failures. Our customized grease test slates are designed to identify the specific failure modes that may be damaging the component.
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Corrosion Analysis
Resipod
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Resipod is a fully integrated 4-point Wenner probe, designed to measure the electrical resistivity of concrete in a completely non-destructive test. It is the most accurate instrument available, extremely fast and stable and packaged in a robust, waterproof housing designed to operate in a demanding site environment. The Resipod is the successor of the classic CNS Farnell Resistivity Meter.Surface resistivity measurement provides extremely useful information about the state of a concrete structure. Not only has it been proven to be directly linked to the likelihood of corrosion and the corrosion rate, recent studies have shown that there is a direct correlation between resistivity and chloride diffusion rate and even to determination of early compressive strength. This makes it one of the most versatile NDT methods for concrete.
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Live-Cell Analysis System
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Analyze your cells for days, weeks or even months as they sit stationary in the stable environment of your tissue culture incubator.
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Ballistics Analysis Software
BallAX 4
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BallAX 4 is used to acquire and analyse measurement data from firearms, guns, artillery, projectiles and grenades using different ammunition and explosive propellants. Data gathered by the software aids in determining the accuracy and consistency of a projectile before it exits a firearm. Manufacturers of firearms ranging from basic hunting rifles to critical military artillery will benefit from the precision data afforded by this industry-specific software module.
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Signal Analysis
Super-Resolution Spectrum
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Super-resolution Spectrum is used for spectral signal analysis with high frequency resolution. The program is used in diagnostics and monitoring systems of buildings and for analyzing non-stationary signals. The Software enables solving the following tasks:
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Mercury Porosimetry Analysis
AutoPore V
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The AutoPore V Series Mercury Porosimeters can determine a broader pore size distribution more quickly and accurately than other methods. This instrument also features enhanced safety features and offers new data reduction and reporting characteristics of your material.
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Failure Analysis
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Failure analysis on electronic components is a continuous challenging task. The smaller transistor dimensions, increasing functional complexity and changing device packaging styles requires new tools and skills for sample preparation, fault localization techniques, high resolution imaging and analysis.
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Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Wafer Probe Loadboards/PIB
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DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Bioacoustic Analysis and Experimentation
SIGNALtm
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Is the recognized standard in bioacoustic analysis for accuracy, flexibility, mathematical power and automation.
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Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
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The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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Root Cause Failure Analysis
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Maintenance Reliability Group, LLC
Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.
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Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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Thermal Analysis
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Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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Silicon & Compound Wafers
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Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
