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Product
16GB DDR4-3200 1GbX8 1.2V ECC Samsung Chip
AQD-D4U16GE32-SE
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16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, ECC.
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Product
Film Thickness Mapping Systems
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Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Product
Glass Thickness Meters
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Shenzhen Linshang Technology Co., Ltd.
As a supplier of laser glass thickness gauge and glass thickness measuring tool, Linshang provides two models of glass thickness gauge that can be used to measure the thickness of various glasses, i.e: single-layer glass, double glazing, triple glazing, multilayer glass, LOW-E glass, and insulating glass, especially suitable for installed glass, such as doors and windows, curtain wall glass, etc.. It can measure the glass thickness as well as the thickness of air space (between the glass). The glass check works on the basis of reflection in the glass.
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Product
Resistors
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SemiGen builds high power tantalum nitride resistor chips to customer specifications. We can manufacture chip resistors using a variety of substrates in various thicknesses to meet your specific needs. Resistors can be produced with element features under 0.002 inch for high density or high value resistor applications. Low noise stable TCR and chip sizes under 0.010 inch x 0.020 inch are routinely processed in production quantities. SemiGen’s series of Thin Film Resistors offer proven stability, low noise, and excellent TCR of both Tantalum Nitride (TaN) and Nichrome (NiC) resistive films. From our standard product offering, to custom requirements, this series of resistors is offered in a large selection of chip size, resistance values, and tolerances.
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Product
Thickness and Flaw Inspection
OmniScan MX ECA/ECT
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With thousands of units being used throughout the world, the OmniScan® MX is a field-proven, reliable instrument that is built to withstand harsh and demanding inspection conditions. Compact and lightweight, its two Li-ion batteries provide up to 6 hours of manual or semi-automated inspection time.
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Product
Erichsen Cupping Testing Machine
GBW Series
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Jinan Testing Equipment IE Corporation
GBW series Erichsen Cupping Testing Machine is designed on the basis of screw universal material testing machine. The Erichsen Cupping Tester is suitable for cupping test of metal sheet and strip steel rolled stock etc to evaluate the plastic deformation performance and ductility. The cupping test for metal sheet thickness range is 0.1mm to 5mm, Max. punching capacity is 300KN, and the pre-tightening device is optional either with hydraulic servo loading pump or manual loading pump.
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Product
Thickness Gauge
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Hildebrand Prüf- und Meßtechnik GmbH
You can select a Thickness Gauge based on a specific standard, a specifiy material or foot diameter and weight/pressure.
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Product
Bally Flexing Tester
TF116
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TESTEX Testing Equipment Systems Ltd.
Bally flexing Tester is designed for flexing resistance test to be and ingor other types of failure at flexing creases. The machines applicable to all flexible materials,in particular leathers, artificial leather below thickness
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Product
Automated Metrology System
EVG®50
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High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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Product
Asphalt Layer Thickness Measurement Devices
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
Non-destructive road layer thickness measuring gauge to measure bituminous road layers or other electrically insulating road layers.
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Product
Underwater Thickness Gauge
Multigauge 4000
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The Multigauge 4100 and 4400 ROV Underwater Thickness Gauges mount onto most types ROV. There are two models in the range, the Multigauge 4100 which has a depth rating of 1000m and the Titanium Multigauge 4400 which has a depth rating of 4000m.
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Product
Line Scan Camera
Piranha4 Polarization
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The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Product
Thickness Gauges
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Bristol Instruments'' optical thickness gauges are a simple and non-destructive way to precisely measure thickness of a variety of transparent and semi-transparent materials. Thickness information is critical in the development and production of materials such as contact and intraocular lenses, and medical products including balloon catheters, stents, bags, and tubing. Bristol combines high accuracy with straightforward operation and rugged design to make these instruments ideal for both laboratory and manufacturing environments.
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Product
PANELMAP
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PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
Time-Resolved Electrochemical Quartz Crystal Microbalance
400C Series
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The quartz crystal microbalance (QCM) is a variant of acoustic wave microsensors that are capable of ultrasensitive mass measurements. Under favorable conditions, a typical QCM can measure a mass change of 0.1-1 ng/cm2. QCM oscillates in a mechanically resonant shear mode under the influence of a high frequency AC electric field which is applied across the thickness of the crystal. Figure 1b below shows an edge view of a QCM crystal undergoing oscillatory shear distortion. The central portions of the top and bottom of the crystal are coated with a typically disk-shaped thin metal film (e.g., gold).
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Product
Ignition Pulse Detector
IP-3000A
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IP-3000A Ignition pulse detector is a slim and light weighted detector by using amorphous metals fiber element. It is 1/4 in thickness (mass: approx. 1/50) and 1/3 in weight compared with the previous model of Ono Sokki. Also the IP-3000A can obtain constant output from low to high rotation with high sensitivity.Meeting the needs of structure or mechanism in recent gasoline engines, the IP-3000A can easily clamp around an ignition coil cable (the primary side cord of ignition coil or the current cord of electronic distributor). Moreover, heat-resistant design up to maximum operating temperature of +120 C° enables measurement under harsh environment.The IP-3000A Ignition pulse detector can be used with Ono Sokki’s engine tachometer.
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Product
16GB SO-DDR4-3200 1GbX8 1.2V Samsung Chip
AQD-SD4U16GN32-SE
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16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, Unbuffered.
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Product
Advanced Ultrasonic Thickness Gage
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The 45MG is an advanced ultrasonic thickness gage packed with standard measurement features and software options. This unique instrument is compatible with the complete range of Olympus dual element and single element thickness gage transducers.
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Product
Pulse Holiday Detector
NOVOTEST SPARK-1
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Pulse Holiday Detector NOVOTEST SPARK-1 designed to detect pits, flaws, and holes in different non-metallic insulation coatings (such as polymers, epoxy, bitumen, etc.) and is mostly used for oil and gas metal pipelines and other objects. The device can be used while the pipeline construction, operation or service. Tested coating thickness is up to 12 mm. Such tests are needed to evaluate the oil and gas pipelines corrosion protection reliability.
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Product
kSA RateRat Pro
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kSA RateRat Pro is a compact, convenient and easy-to-use optical metrology tool for thin-film characterization. Its unique capability is to measure, in situ and in real-time, optical constants (n and k), deposition rate and film thickness.
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Product
Aluminum PCB
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The heat dissipation afforded by this construction is dramatically superior to standard FR-4 constructions. The dielectrics used are typically 5 to 10 times as thermally conductive as conventional epoxy-glass and a tenth of the thickness resulting in thermal transfer exponentially more efficient than a conventional rigid PCB. This is so effective that lower copper weights than suggested by the IPC heat-rise charts can be used.
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Product
Ellipsometer
alpha-SE®
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For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds. Works with your materials - dielectrics, semiconductors, organics, and more.
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Product
Scatterometers/ Thin Film Metrology Systems
LittleFoot Series
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The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
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Product
Film Thickness Tester
MX Series
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Qualitest covers a complete and competitive range of Thickness Testers for plastic films, composite films, adhesives, adhesive tapes, laminated films, plastic films, paper and other materials.
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Product
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
UVISEL
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The UVISEL Spectroscopic Phase Modulated Ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties. It features rapid measurement capability with data acquired every 50 ms for powerful control of thin film uniformity across the entire web.The design of the UVISEL ellipsometric heads allows simple integration into roll-to-roll systems, while the software provides advanced communication capabilities suited to roll-to-roll production.
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Product
Spectroelectrochemical Flow Cell
SEC-2F
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Using the spectroelectrochemical flow cell, it is possible to have a different optical path length changing the gasket. We offer, as an optional item, a silicon and Teflon gasket with a 100, 250 and 500 m of the thickness. SEC-2F Spectroelectrochemical flow cell was designed to fit perfectly in the SEC2000 Spectrometer, and it eliminated the use of the optical fiber to connect the Spectrometer to the SEC-2F. Even for another brand of the spectrometer, you can connect the SEC-2F using the collimating lens and optical fiber.
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Product
MOCVD Systems
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For growing high-quality compound semiconductor films, few techniques match the precision of Metal-Organic Chemical Vapor Deposition (MOCVD). They give engineers tight control over film composition and thickness, making them essential for optoelectronics and advanced power transistors.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
Ultrasonic Dual Element Probes
SONOSCAN T
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The ergonomic dual element probes for Non-Destructive Testing from the SONOSCAN Series comply with the DIN EN 12668-2 Standard and can be used to test metals, plastics and ceramics for imperfections such as cracks, inclusions, blowholes and other discontinuities. The transmitter-receiver probes manufactured in Germany are powerful, robust ultrasonic transducers which are compatible with the ultrasonic flaw detector SONOSCREEN ST10 or the thickness gauge SONOWALL 70.
