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Coating Thickness Gauges
Application of coating thickness gauge:used for measuring thickness and corrosion of pressure vessels, chemical equipment, boilers,oil storage tanks, etc. in industries of petroleum, shipbuilding, power station, and machine manufacturing.
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Photovoltaic/Solar Metrology System
Multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
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Probes, Cables & Detectors
Probe has a mica window that has a thickness of 1.8 to 2.0 mg/cm2. This allows detection of alpha radiation as low as 3.0 MeV when in close proximity to the window. Beta radiation in excess of 35 keV and X-ray or gamma radiation greater than 6 keV can also be deteched. The detector is provided with a BNC connector. It can be used with most count rate and survey meters which accept Geiger Mueller (GM) detectors operating at 900V DC.
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Grid Electrode
Grid electrode is produced by the deposition of the platinum, gold or carbon onto the quartz glass. The dimension of the glass is 8 x 27 mm, with a 1 mm of the thickness, and the grid line is 100 m width with a distance of the 150 m between lines.
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Non-contact Film Thickness Measurement
ALTO-IRT-7000
ALTO-IRT-7000 (IMPEDANCE RESONANCE TECHNOLOGY ) FILM THICKNESS METROLOGY TOOL UTILIZES NON-CONTACT CAPACITIVE AND EDDY CURRENT TECHNOLOGY TO ANALYZE MICRO SECTORS ON COATED SURFACES THAT ARE 1000 TIMES SMALLER THAN ANY COMPARABLE EDDY CURRENT PRODUCTS. BUT MOST IMPORTANTLY, THIS UNIQUE IRT TECHNOLOGY ALLOWS FOR SOPHISTICATED ANALYSES OF THE CONTINUOUS AND DISCRETE FILMS BELOW 50 ANGSTROMS, DRAMATICALLY IMPROVING THE ACCURACY OF QUALITY CONTROL READINGS.
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In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
UVISEL
The UVISEL Spectroscopic Phase Modulated Ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties. It features rapid measurement capability with data acquired every 50 ms for powerful control of thin film uniformity across the entire web.The design of the UVISEL ellipsometric heads allows simple integration into roll-to-roll systems, while the software provides advanced communication capabilities suited to roll-to-roll production.
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Ultrasonic Thickness Gauge
UTG-1500
The new PHASE II UTG-1500 is a hand held microprocessor controlled ultrasonic thickness gauge specifically designed for measuring the thickness of metallic and non-metallic materials such as aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave-conductor as long as it has parallel top and bottom surfaces.
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RF Front-end
The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Ultrasonic Thickness Gage
27MG
The Olympus 27MG is an affordable ultrasonic thickness gage designed to make accurate, measurements from one side on internally corroded or eroded metal pipes, tanks, and other equipment. It weighs only 12 oz. (340 g) and is ergonomically designed for easy, one-hand operation. Thickness range 0.50 mm to 635 mm (0.020 in. to 25.0 in.) depending on material, transducer, surface conditions, temperature.
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Paper Thickness Tester
DRK107A
Shandong Drick Instruments Co., Ltd.
DRK107A Paper Thickness Tester is professionally applied to testing the thickness of paper specimens.
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Materials Metrology
Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs.Our technologies enable customers to accurately detect and quantify small variations in film composition and thickness, thereby influencing better device functionality, and improved manufacturing yield.
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EHC-03 Basic Corrosion Thickness Gages
EHC-03
Danatronics is pleased to welcome our EHC-03 to our corrosion thickness gage family. The EHC-03 is designed to accurately and non-destructively measure metal structures subject to corrosion.
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Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10 DUPLEX
The professional for duplex measuring. The specialist for measuring the thickness of duplex layers from automotive to roof panels.
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Acoustic Microscope
AMI D9650Z
The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.
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Distance, Coating and Thickness Meters
PeakTech Prüf- und Messtechnik GmbH
This professional laser distance measuring device with multi-line LCD display, which has a backlight, was specially designed for high-precision distance measurements.
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Cross Sections and Metallography
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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EHC-09 Ultrasonic Corrosion Thickness Gage - Color
EHC-09C
Danatronics offers our EHC-09 Color Wave series as the top of the line gages for corrosion applications. The EHC-09 Color Wave offers many standard and practical features including a sunlight readable color display with live A-Scan, echo to echo to ignore coatings, B-Scan, 100K thickness reading datalogger with interface to Microsoft excel. The Color Wave is available in 4 models including the EHC-09C, EHC-09DLC, EHC-09CW and EHC-09DLCW. The vibrate on alarm is a world’s first and is great for loud environments!
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Customized Ellipsometers
~0.1 nm thickness difference can be seen by IE-1000.Thickness distribution of thin film can be imaged.Thickness and optical images of semiconductor device, display, and bio samples.IE-1000 can show the images which can not be seen by conventional microscope.Defect of semiconductor and display can be seen directly.Easy and fast operation.
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Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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Multiple Angle Laser Ellipsometer
PH-LE
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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Constant Potential Generator Power Supply Mains 10 to 160 kV
CP160D
The CP160D is the lightest and most compact generator of the CPSERIES. Featuring a built-in Beryllium window, it is the perfect generator for the inspection of light alloys such as aluminum, magnesium or fiber based materials like glass and carbon, as well as the greater thickness of steel. In fact, with its penetration capacity that is capable of reaching up to 37 mm of steel, the CP160D is able to execute many different types of NDT tasks without the need to ever have to add extra accessories.
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Transducers, Cables, Couplants & Test Blocks
Olympus offers a complete selection of transducers, cables, couplants, calibration test blocks, and accessories to meet a wide variety of ultrasonic precision thickness gaging applications.
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Precious Metal Verifier
Measures completely through the sample.* Measures the sample thickness.* Reads through numismatic cases.* Confirms that the metal density is correct.* Available with external wands: Refiners wand measures 50% deeper. Microwand measures down to 3 mm spot size.
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Optics Test Systems
Lens Test
Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Digital Signage Player With Intel® Pentium® Processor N4200 & Celeron® Processor N3350, DisplayPort++, HDMI, 2 GbE LAN And 4 USB
DSP300-318
The DSP300-318 is powered by the onboard Intel® Pentium® processor N4200 and Celeron® processor N3350 (code name: Apollo Lake). It can deliver dazzling visual images and video advertising in 4K resolution. Measuring only 20 mm in thickness, the ultra slim DSP300-318 is sleek enough to fit in a small area behind signage displays and its fanless and cable free design enables easy installation without any environment limitation. The super slim DSP300-318 is designed to be fanless and cableless, which ensures solid reliability and easy maintenance. It supports HDMI and Dual-Mode DisplayPort (DP++) outputs with support for dual displays. The system also has one M.2 Key E 2230 for Wi-Fi and Bluetooth modules, one M.2 Key B 3042 for 4G LTE and one SIM card slots for 3.5G radio connectivity. Additionally, one M.2 Key M 2280 and one optional 64GB eMMC 5.0 are available for storage. The Intel® Apollo Lake-based DSP300-318 offers a cost-effective, compact yet powerful computing platform that allows plenty of digital signage solutions for advertising, brand promotion and digital menu board applications.
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Geotextile Thickness Tester (Wet Sieving)
TG040
TESTEX Testing Equipment Systems Ltd.
Geotextile Thinkness Tester, to determine the thickness of geotextile synthetic materials and related products under pressure and in specified time.
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Wall Thickness Measurement Gauges
ElektroPhysik Dr. Steingroever GmbH & Co. KG
Portable wall thickness measuring device for non-destructive measurement of up to 24 mm. Thickness measurement of all non-magnetic materials such as glass, synthetic materials, stainless steel and composites; can also be used for objects with complex geometries.
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Coating Thickness Gauge for Ferrous and Non-Ferrous Materials
CM8856
* It meets the standards of both ISO2178 and ISO 2361 as well as DIN, ASTM and BS. It can be used both in the laboratory and in harsh field conditions.* The F probes measure the thickness of non-magnetic materials (e.g. paint,plastic, porcelain enamel, copper, zinc,aluminum , chrome etc.) on magnetic materials (e.g. iron, nickel etc.) . often used to measure the thickness ofgalvanizing layer, lacquer layer, porcelain enamel layer, phosphide layer, copper tile, aluminum tile, somealloy tile, paper etc.The N probes measure the thickness of non - magnetic coatings on non-magnetic metals .It is used on anodizing, varnish, paint, enamel,plastic coatings, powder, etc. appliedto aluminum, brass, non-magnetic stainless steel, etc.* Automatic substrate recognition.* Manual or automatic shut down.* Two measurement mode: Single andContinuous* Wide measuring range and highresolution.* Metric/Imperial conversion.* Digital backlit display gives exactreading with no guessing or errors.* Can communicate with PC computerfor statistics and printing by theoptional cable.* Can store 99 groups of measurements.* Statistics is available.2.SPECIFICATIONSDisplay: 4 digits LCD, backlitRange: 0~1250 μm/0~50mil(other ranges can be specified )Min.radius workpiece: F: Convex 1.5mm/Concave 25mmN: Convex 3mm/ Concave 50mmMin. measuring area: 6mmMin.Sample thickness : 0.3mmResolution: 0.1 μm (0~99.9μm);1 μm (over 100μm)Accuracy: ±1~3%n or 2.5 μm or 0.1mil(Whichever is the greater)Bttery Indicator: Low batter indicator.PC interface: with RS-232C interfacePower supply: 2x1.5 AAA(UM-4) batteryOperating condition: Temp. 0~50℃ .Humidity <95% .Size: 126x65x35 mm; 5.0x2.6x1.6 inchWeight: about 81g(not including batteries)Standard accessories:Carrying case ...................1 pc.Operation manual ............ 1 pc.F probe in built .................1 pc.NF probe in built...............1 pc.Calibration foils ..............1set.Substrate (Iron) ................1 pc.Substrate (Aluminium)......1 pc.Optional accessories: RS-232C cable & software:1.USB adaptor for RS-232C2.Bluetooth interface
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Calipers
An instrument used to measure the linear dimensions of an object or hole; namely, the length, width, thickness, diameter or depth of an object or hole.





























