Olympus Corp.
Manufacture and sales of precision machineries and instruments.
- 484-896-5000
- 2951 Ishikawa-machi
Hachioji-shi, Tokyo 192-8507
Japan
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Product
Portable XRF Analyzer
GoldXpert
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XRF is a widely used, proven, and accepted method of chemistry analysis and determination of purity and fineness of precious metals. XRF analysis is a multielemental testing alternative that is quicker and less expensive than fire assay and chemical tests. XRF provides on-the-spot analysis of your silver, platinum, and PGM metals and impurities, making it an easy way to boost customer confidence and ensure dealer reliability.
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Product
Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Product
Micro Spectrophotometer
USPM-RU III
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The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
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Product
Consumer/ Rohs Benchtop XRF Analyzers
Xpert
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The Xpert for Consumer/RoHS, a convenient, compact & lightweight XRF analyzer for regulatory compliance programs, provides accurate Pass/Fail results within seconds. It is completely independent of an external PC and can be powered by battery for ease of transport to wherever testing is needed.
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Product
Lead Paint Handheld XRF Analyzer
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DELTA Lead Based Paint Handheld XRF Analyzers test for Lead (Pb) in seconds. These reliable, tube-based units are light in weight and ergonomically designed for all-day testing. They start fast and stay fast - no isotope fade. And, they have a low total cost of ownership. Before you begin structural repair - grinding, cutting or painting - screen for Pb; then, check your work area after clean-up.
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Product
Benchtop XRD System
BTX
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The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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Product
Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Product
Portable Flaw Detector
EPOCH 6LT
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Portable and easy to use, the EPOCH 6LT flaw detector is an ergonomic, rugged instrument that delivers user comfort and more uptime. Weighs just 1.95 pounds (890 g) with a grip-oriented weight distribution for one-handed operation with minimal wrist fatigue. Rotary knob and simple button design make it easy to use, even when wearing gloves. Engineered to IP65/67 and drop tested. Clear, bright screen for readable A-scans in any light. The EPOCH 6LT flaw detector’s workflow is simple and straightforward. Despite the instrument’s small size, it has the features and functions to meet the requirements of nearly any conventional ultrasonic inspection application.
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Product
Portable XRF Analyzer
X-5000
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The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
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Product
Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Product
Normal Incidence Shear Wave Transducers
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Single element normal incidence Shear Wave Transducers contact transducers introduce shear waves directly into the test piece without the use of refracted wave mode conversion. We recommend the use of our SWC shear wave couplant for general purpose testing.
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Product
Mining and Geochemistry Handheld XRF Analyzer
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DELTA Mining & Geochemistry Handheld XRF Analyzers provide immediate results to help determine the next course of action for the entire process - exploration, ore grade/process control, environmental sustainability. On-site detection of metals, minerals & contaminants. GPS-GIS-XRF for instant metal mapping, time, cost savings
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Product
Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Product
Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Product
Hall Effect Thickness Gage
Magna-Mike 8600
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The Magna-Mike® 8600 is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.
















