In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
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Product
Flexible Test Environments and Integration Services for your Integrated System Tests
TESTERLYZER® Frame 4.0
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The TESTERLYZER® Frame 4.0 provides a flexible test environment for vehicle control units in an integrated system and is easily accessible from all sides. Customized adaption is provided for panel designs, control unit holders and cable adapters. A TESTERLYZER® I-Box 4.0 is a standard component of the TESTERLYZER® Frame 4.0 and provides the basis for a wide range of structures for the testing of control units, software and services relating to vehicles in research and development. The backbone of the I-Box provides all signals required with distribution to standardized adapter sockets and interfaces. The modular assembly structure ensures swift and safe setting up of the required test environment.
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Airbag Test System
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Dongguan City Simplewell Technology Co. Ltd.
Airbag Test System by Simplewell
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Test System
Tessy
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TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
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Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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System
SYS-28
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This 28" box coater has a separately ventable top chamber, to allow for faster parts changes and increased productivity. It also is equipped with our FTC-620 flip controller. The flip and rotation motors can be seen on the top. This system uses a Varian tri-scroll pump and a bottom mounted 16" APD cryopump.
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Wireless In-Circuit Test Fixtures
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Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
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Vibration Test Chamber Gantry Frame System
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Guangdong Test EQ Equipment co., Ltd.
- Structural Design: Monolithic construction with seamless TIG welding for durability and aesthetics. Lever-driven door lock mechanism.- Smart Control System: Features a Chinese/English-language color LCD touchscreen HMI + high-performance PLC, powered by TESTEQ's proprietary software for automated, intelligent, and user-friendly operation.- Energy Efficiency: Incorporates TESTEQ's patented "Static Balance" technology, reducing energy consumption by over 30% during low-temperature stabilization.- Vibration Integration: Gantry Frame System: Worm gear-driven vertical adjustment and lateral positioning via wireless remote.- Advanced Sealing: Custom flexible connectors ensure airtight integration between temperature/humidity chambers and vibration platforms.
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Topside Probing In-Circuit Test Fixtures
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Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.
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Ultrasonic Fatigue Testing System
USF-2000A
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The USF-2000A implements materials fatigue testing at 20 kHz. Consequently, it is possible to evaluate 109 to 1010 order fatigue strength, where it had been difficult to obtain data before. Also, data for 107 cycles can be obtained in about ten minutes.
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Meter Testing System
ASTel
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Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Product
Digital In-Circuit tester
MTS180/300
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Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.
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Electro-Dynamic Vibration Test System (Air Cooled)
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HIACC Engineering & Services Pvt. Ltd.
The air-cooled electro-dynamic vibration test system has a wide frequency range, high reliability, easy to operate and small foot-print area. The force ranges from 1kN to 70kN, and maximum load is from 70 kg to 1000 kg. This product can be integrated with HIACC’s environmental chambers.
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Product
Test System
Series 4x
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The 4x is the next generation test system for discrete semiconductors. Designed with high volume production in mind, the system is also ideal for incoming or general purpose test applications.
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Shock/Bump Test System
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HIACC Engineering & Services Pvt. Ltd.
HIACC’s Shock/Bump Test System is a specialized, automated, and high-performance testing apparatus designed to simulate the impact, shocks, and repetitive jolts that electronic components, electronic products, and packaging experience during transportation or operational use.
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HEV / EV / Grid Emulators and Test Systems
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With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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High Current Discharge Testing System
DTV
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Cold Crank Testing to industry standards: IEC, SAE, BCIDischarge capacity performance testing to thousands of amperes
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Product
In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Ferroelectric Test System
LCII
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Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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Ferroelectric Test System
RT66B
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Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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6-Axis Robotic Automated Testing System
AT6
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The Instron AT6 is a flexible, robot-assisted testing solution featuring six axes of motion, purpose-built to automate tensile, compression, flexural, and lap shear testing in alignment with widely used ASTM and ISO standards. Its modular design accommodates a broad array of materials—including metals, polymers, elastomers, films, composites, and sutures—at force capacities up to 600 kN. Capable of processing up to 500 specimens without operator intervention, the AT6 enables true unattended or “lights-out” operation, significantly increasing throughput around the clock. Optional modules include stations for specimen measurement, automated strain measurement, environmental temperature chambers, and multiple test frames for simultaneous testing. The system also integrates smoothly with auxiliary devices such as durometers, hardness testers, and surface roughness testers, making it a robust solution for high-volume, high-efficiency testing environments.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Electroluminescence Test Systems
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The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Stator Testing System for EV Motor
EVT531
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Shanghai Dean Electrical Co., Ltd
To meet the standard test projects requirement of the international companiesTo control and analysis the programs will reduce the human careless and misjudgmentEasy to edit environment and easy to learnIt can test multiple sets of DUTs simultaneouslyWhen there are several DUTs are tested, it could identify the undesirable sets individuallyThe Impulse/Surge with waveform comparison is a non-destructive analysisPolarity testMaximum saved files will be up to 100 setsIt provides the password functionSpeeding test could save time and improve efficiencyChinese and English pages can be arbitrarily switched
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Silicon-Microphone 8Ch Auto Test System
BK9015
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Based on the BK3011 MEMS Mic Tester, the BK9015 is our fully automatic 8 channel MEMS (Silicon) mic sweep tester. Testing up to 8 DUT's simultaneously, the BK9015 can test 8 mics simultaneously and sort them according to passing grade and cause of failure! Because it uses a sweep test, it can check characteristics for the entire frequency range. Your data can be viewed in real time or stored so you can analyze problems or trends.
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Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Actuation Methods for In-Circuit Test Fixtures
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Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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Coil Test System
CTS
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International Electro-Magnetics, Inc.
The system is controlled by a PC using software written in Visual Basic. It offers visually oriented menus that allow easy coil configuration and test set up procedures.
