In-Circuit Debuggers
See Also: Debuggers, In-circuit, Code Debuggers, JTAG Debuggers, Source Debugers, Debugging, In-circuit Emulators
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Product
68HC(S)12 In-Circuit Debugger
ICD12Z
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P&E's ICD12Z for Windows is a powerful tool for debugging code. It uses the HC(S)12 processor's background debug mode (BDM), via one of P&E's hardware interfaces, to give the user access to all on-chip resources.
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Product
Microprocessor Development System
DS-85
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* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Product
Power Architecture 5xx/8xx In-Circuit Debugger
ICDPPCZ
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P&E's ICDPPC for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources. The ICDPPCZ software works with Freescale's MPC5xx/8xx devices.
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Product
In-Circuit Debugger for Power Architecture 55xx/56xx (Nexus)
ICDPPCNEXUS
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P&E's ICDPPCNEXUS for Windows is a powerful tool for debugging code on a Freescale MPC55xx/56xx processor. The debugger comes with P&E's PROGPPCNEXUS flash programmer.
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Product
68HC16 In-Circuit Debugger
ICD16Z
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P&E's ICD12Z for Windows is a powerful tool for debugging code. It uses the HC(S)12 processor's background debug mode (BDM), via one of P&E's hardware interfaces, to give the user access to all on-chip resources.
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Product
68HCS08 In-Circuit Debugger
ICDHCS08
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P&E's ICDHCS08 is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.
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Product
CPU3xx Incircuit Debugger
ICD32Z
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P&E's ICD32 for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.
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Product
In-Circuit Debugger for RS08 Family of Microcontrollers
ICDRS08
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P&E's ICDRS08 is a powerful tool for debugging code. It uses the processor's background debug mode Module(BDM), via any of P&E's RS08 compatible interfaces (see product add-ons for more information), to give the user access to all on-chip resources.
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Product
In-Circuit Debugger for ColdFire V1
ICDCFV1
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P&E's ICDCFV1 is a powerful tool for debugging code that supports Freescale's ColdFire V1 microcontrollers.
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Product
Medalist i1000D
U9401B
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The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
4-Module ICT System, I307x Series 6
E9903G
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Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
In-Circuit Tester
Sparrow MTS 30
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The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
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The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
In-line High-Density ICT System Series 7i
E9988GL
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The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
In-Circuit Testers
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SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
In-Circuit Tester
Eagle MTS180
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The Eagle offers low testing cost for high volume with even the most complex fixture applications. Equipped with a Press-Down-Unit and a combination of analog and hybrid In-Circuit test pins, the MTS180 is in a class for its own. Furthermore, the tester can be equipped with functional test modules to provide even higher fault coverage and thus satisfy the test requirements of a larger number of customers.
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Product
Debugger for HPC
TotalView
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You need special tools for multithreaded, multiprocess, and GPU-specific applications. TotalView is a powerful debugging solution that meets the unique and demanding requirements of HPC developers.
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Product
Analog In-Circuit Tester
406C
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The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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Product
PC Analyzer / Debugger
RapidDriver Explorer
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RapidDriver Explorer is an intelligent tool for PC hardware analysis and debugging. RapidDriver Explorer allows you to start working with your hardware device with just a few clicks of the mouse. Simply install your new hardware, create a new RapidDriver project, and then select your device from the list of PnP devices auto-detected by RapidDriver.
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Product
In-Circuit Testing and Test Engineering
Teradyne Z1890
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2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Product
In-Circuit Test Fixtures
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Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
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Product
JTAG Debugger Software
JSCAN
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JSCAN lets you view and control JTAG pins in real-time without having to touch your board! With a simple click of your mouse, you can set pins HIGH or LOW and observe the results right on your PC.J-SCAN works independently of any logic inside the JTAG device, you do not need any special firmware, code or logic installed. View and control pins in real-time, program FLASH memories, create test macros, for system test, easy to use graphical interface and affordable.
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Product
Hardware Debugger for the Raspberry Pi
TAP-HAT
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The TAP-HAT is a low-cost hardware debugger for the Raspberry Pi®. Its flexible multi-modal design supports USB-connected hardware debugging of a Pi board, connection of external hardware debuggers to a Pi, or use of the Pi as a network attached hardware debugger.
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Product
In-Circuit Testers
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Whether you’re choosing from our stand-alone manually loaded ICT tester all the way to our fully automatic In-line test system, Acculogic has the solution for you!Acculogic’s Scorpion family of automated test equipment and in-circuit fixture-based testers were created with one underlining theme in mind: “Cost-effective Testing”.
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Product
In-Circuit Test System Repairs
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Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
In-Circuit Emulator - 80C186/80C188 Family
DS-186
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* Support for 80C186/8/XL/EA/EB/EC, 8086/8, V20/25/30/40/50 and other Microprocessors * Full-speed Emulation up to 25MHz * 1MB of Zero-Wait-State Mapped Memory * 8K x 32-bit Frames Dynamic Trace Buffer * 1MB Hardware Breakpoints * 115 KBaud RS-232 Communication Link * Numeric Coprocessor Support * OMF Converter * Support for Borland, Microsoft and Intel Compilers * Full Support for C, C++, Pascal and Assembler
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Product
In-Circuit Test System Rentals
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Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.





























