In-circuit Emulators
test to validate circuit.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems, ICE
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Product
Microprocessor Development System
DS-85
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* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Product
In-Circuit Emulator
DS-251
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# Real-Time and Transparent In-Circuit Emulator for 251s# Uses Intel and Atmel Licensed Bondout Technology# Standard 256K Emulation Memory# Real-Time Trace up to 128K Frames Deep, 128 Bits Wide# Complex Hardware Breakpoints# Supports Both Binary Mode and Source Mode# MS-Windows Debugger# High-Level Support for Popular C-Compilers# Full Support of Local and Global Variables# On-Line Assembler and Disassembler# Performance Analyzer
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Product
In-Circuit Emulator - 80C186/80C188 Family
DS-186
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* Support for 80C186/8/XL/EA/EB/EC, 8086/8, V20/25/30/40/50 and other Microprocessors * Full-speed Emulation up to 25MHz * 1MB of Zero-Wait-State Mapped Memory * 8K x 32-bit Frames Dynamic Trace Buffer * 1MB Hardware Breakpoints * 115 KBaud RS-232 Communication Link * Numeric Coprocessor Support * OMF Converter * Support for Borland, Microsoft and Intel Compilers * Full Support for C, C++, Pascal and Assembler
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Product
Microprocessor Development System
DS-M8
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# Real-Time and Transparent In-Circuit Emulator# Supports PIC12xxx, PIC14xxx, PIC16xxx, PIC17xxx and others# Uses Microchip Bond-Out Technology# Maximum Frequency Support# Standard 64Kx16 Emulation Memory# 32Kx48 Real-time Trace with Filters and Triggers# 64K Hardware Breakpoints with External Signals# Memory Mapping Capabilities# Software for MS-Windows# Source-Level Debugger for C and Assembler
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Product
Microprocessor Development System
DS-48
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# Real-Time and Transparent In-Circuit Emulator# Supports Philips Telecom Derivatives# Adaptable to 8051 Derivatives# Emulates 1.5V to 6V Microcontrollers# Maximum Frequency of 40MHz# 8K of Internal Memory# DOS and MS-Windows Debuggers# 32K Trace Memory and Logic Analyzer "on the Fly"# 8K Hardware and Conditional Breakpoints
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Product
In-Circuit Emulator
DS-XA
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* Emulates XA Derivatives * 2MByte Code and Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 30MHz @ 5V * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software for Windows NT and 95 or Later * 3.3V And 5V Emulation Support * Support for ROMless and ROM Microcontrollers * PLCC Emulation headers
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Product
In-Circuit Emulator
DS-51
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* Real-Time and Transparent In-Circuit Emulator * Supports Most of the 8051 Derivatives * Emulates 1.5V to 6V Microcontrollers * Maximum Frequency of 42MHz * 64K/512K of Internal Memory with Banking Support * 32K Trace Memory "on the Fly" * 64K Hardware and Conditional Breakpoints * MS-Windows and Keil ?Vision Debuggers * Source-Level Debugger for Assembler, PLM and C * On-Line Assembler and Disassembler * Performance Analyzer * Serially linked to IBM PC at 115 Kbaud
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Product
Regenerative AC Emulator, 600 VAC, 63 A, 45 KVA, 3‑Phase
SL1202A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Scienlab Dual-Range Regenerative AC / Grid Emulator, 600 / 1200 VAC, 63 / 32.5 A, 90 KW / 135 KVA
SL1215A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Regenerative AC Emulator, 600 VAC, 125 A, 90 KVA, 3‑Phase
SL1203A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Regenerative AC Emulator, 1200 VAC, 65 A, 90 KVA, 3‑Phase
SL1213A
AC Emulator
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
In-Circuit Tester
Sparrow MTS 30
In-Circuit Test System
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
Emulator
GCI E84
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The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
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Product
WAN Emulation
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Net.Storm is able to simulate any network condition to check how tolerant your services, protocols and devices are when quality / capacity degradations occur. It replicates accurately combined effects such as packet delay, errors, loss, bandwidth variations, traffic shaping and traffic policing.VoIP.Master is an advanced turn-up solution for VoIP allowing technicians to deploy VoIP thanks to its emulation capabilities that permit users to connect VoIP.Master to SIP trunks and networks emulating an IPBX, making multiple VoIP calls ensuring the trunk is operational and performing to pre-agreed SLAs.
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Product
In-Circuit Test Systems
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Keysight offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today's complex printed circuit assemblies.
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Product
Emulators
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High fidelity DC power system and motor drive inverter testing is made achievable with the use of advanced power emulation.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
In-Circuit Programmer/Loader
SKU-018-01
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The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
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Product
In-Circuit Test Fixtures
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Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
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Product
Advanced JTAG Emulators
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Blackhawk offers JTAG Emulators ranging from entry level to full-capability debug probe models supporting System Trace (STM), starting at $99. This includes XDS100v2, XDS200 and XDS560v2-class models that are compatible with Code Composer Studio.
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Product
High-Performance JTAG Emulators
XDS560 Series
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Blackhawk XDS560-class models are offered with PCI, USB, and Ethernet host interfaces. These XDS560 models support the first generation of TI XDS560-class high-speed JTAG connection between Code Composer Studio and the target device.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
Emulates Winbond W78ERD2
FE-WRD2
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* Emulates Winbond W78ERD2 * 62K Code Memory * Real-Time Emulation * Frequency up to fmax at 5V * Windows Debugger For C/C++ And Assembler * 44-PLCC Emulation Header * Target Board and Programmer Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
