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Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Portable Surface Roughness Tester Profilometer
SRG-2000
The PHASE II SRG-2000 surface roughness tester profilometer is a pocket-sized economically priced instrument for measuring surface roughness texture conforming to traceable standards. It can be used on the shop floor in any position, horizontal, vertical or anywhere in between.
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Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Substrate Thickness, Warp, and TTV Measurement
413 Series
Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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PCB Material Characterization
N19308B
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
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Areal Confocal 3D Measurement
µsurf
The measuring system of the µsurf-product line enable automated 3D surface measurements of roughness, topography, layer thickness and volume. µsurf-measuring systems are available in different designs: from compact mobile systems and laboratory solutions up to multisensor setups on granite portal for use near production lines.
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Portable Surface Roughness Tester Profilometer
SRG-4000
The latest in state-of-the-art surface roughness testers profilometer, the SRG-4000 is designed with the shop environment in mind. These surface roughness testers profilometer are distinguished by a high level of accuracy, multiple parameters and simplicity of operation. Extremely sensitive and highly accurate readings from this Phase II surface roughness tester are offered via multiple surface roughness profilometer parameters, Ra, Rq(Rms), Rt and Rz.
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Sound Quality Evaluation Pack
OS-2740
The OS-2740 is package software consists of the OS-2700 and plug-in options including sound quality evaluation software. This software quantify sound by using six parameters of psychoacoustic evaluation; loudness, sharpness, roughness, fluctuation strength, AI (Articulation Index), tonality as well as conventional physical quantities such as frequency analysis or octave analysis.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Surface Roughness Measuring Machines
Portable Surface Roughness Measurement instruments whose analysis function and operability are dramatically evolved
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Psyacoustic Test System
Psychoacoustics is the science of the relationship between physical quantities of sound and subjective hearing impressions. To examine these relationships, physical parameters, such as loudness, sharpness, roughness, fluctuation strength, are mapped to hearing-related parameters. Unlike the physical quantities, these hearing-related quantities – also referred to as psychoacoustic parameters – provide a linear representation of human hearing perception. The psychoacoustic test system, with interactive interface and user-friendly operations, analyzes psychoacoustic parameters effectively and conforms to the international standard ISO 532 Part B.
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Roughness Tester
Compatible with four standards of site to measure surface roughness ofvarious machinery-processed parts, calculate corresponding and clearly display allmeasurement parameters. When measuring the roughness of a surface, the sensor is placed on the surface and then uniformly slides along the surface by driving the mechanism by the sharp built-in probe. This roughness causes displacement of the probe which results in change of inductive amount of induction coils so as to generate analogue signal, which is in proportion to the surface roughness at output end of phase-sensitive rectifier.
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Surface Roughness Gage
1000
The Adcole Model 1000 represents the state of the art in surface roughness measurement for crankshafts, camshafts and other cylindrical components. The machine is pre-programmed for optimized workflows. Operators simply need to load and unload the parts. In addition to its unprecedented accuracy, this product is also the fastest system for taking critical surface measurements.The base gage is a rugged, self-standing horizontal granite surface plate with affixed headstock, tailstock and carriage. Scanned data is immediately available for review on the touchscreen monitor or printing.
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Solar Radiation (Sunshine) Test
This test determines the effects of direct solar radiation on components and material. The heating effects of solar radiation differ from those of high air temperature in that the amount of heat absorbed depends on the roughness and color of the surface on which the radiation is incident and the angle of incidence to the sun. Variations in the intensity of solar radiation over the surface of the component, may cause components to expand or contract at different rates, which can lead to severe stresses and loss of structural integrity. In addition, degradation due to photo-chemical changes can occur such as fading of color, deterioration of natural and synthetic elastomers and polymers. The test items that are subjected to solar radiation testing are those that are exposed to solar radiation during its life cycle, in the open, in warm climates.
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Fluctuation Sound Analyzer
OS-2760
Fluctuation Sound Analyzer the OS-2760 is package software consists of the OS-2700 and plug-in options including fluctuation sound analyzer which is developed with new concept of sound quality evaluation parameter. This software makes clear sound features based on the two axes of frequency and fluctuating frequency by using new concept of [time fluctuation] as well as six parameters of physical quantities such as loudness, sharpness, roughness, fluctuation strength, AI (Articulation Index), tonality.
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Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Stylus Profilometers
Tencor™
KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Rope Testers
The LMA Signal measures loss of metallic cross-sectional area (LMA) caused by corrosion, abrasion, etc. The LMA Signal is quantitative and can be calibrated. (Typically, a rope must be retired when the LMA exceeds 10%).The WRR Signal measures wire rope roughness (WRR). WRR is defined as the aggregate surface roughness of all wires in a rope. WRR is typically caused by and indicates internal and external corrosion pitting, broken wires and clusters of broken wires. The WRR signal is quantitative, and it is calibrated together with the LMA Signal.The LF Signal can indicate localized flaws (LF), for example, broken wires, corrosion pitting, etc. Because it is only qualitative - and cannot be calibrated - it is of limited value for assessing rope deterioration and for making rope retirement decisions.
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Optical Tactile Surface Finish
1000Z
The Adcole Model 1000-Z features both optical and tactile measuring heads to deliver high precision surface measurements of camshafts, crankshafts and turned parts. The non-contact interferometric probe greatly expands on the measurement capabilities from the diamond tipped contact probe of the standard Adcole 1000 gage, as the optical accessory can precisely measure surface finish of cam track groove sidewalls, cam track bottom grooves and more. Profilometers such as the 1000-Z quantify surface roughness and are relied on to maintain quality and identify potential problems in the manufacturing and coating process.
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Dimensional Calibration
123 BLOCKS ANGLE BLOCKS BALL BAR BORE GAGE CALIPERS CHAMFER GAGES CMM'S COATING THICKNESS GAGES CYLINDER PLUGS DEPTH GAGES GAGE BLOCKS GO-NO-GO GAGES HARDNESS TESTERS HEIGHT GAGES INDICATORS LENGTH STANDARDS LEVELS MICROMETERS OPTICAL COMPARATORS PARALLELS PIN GAGES PROFILOMETERS RADIUS GAGES ROUGHNESS SPLINES THREAD RINGS THREAD PLUGS
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CMP Tester
CP-6
The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Surface Roughness Tester
A precision instrument used to evaluate the texture of a surface, determining whether it is rough or smooth.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Elcometer MarSurf PS10 Surface Roughness Tester
7062
In protective coating applications there is a requirement to measure surface roughness. With 31 surface parameter settings available the Elcometer 7062 surface roughness tester can display all parameters that comply to National & International Standards.These values include peak-to-valley profile measurement in combination with an assessment of the frequency of peaks within the sample area.The Elcometer 7062 surface roughess tester is a light weight and portable measuring solution for the range of surface roughness measurements required for compliance to International Standards.The unit is also suitable for assessing surface roughness conditions in a wide range of general industrial applications; particularly where the sample is too large to bring to the laboratory.
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Solid Optical 3D Measurement Instrument
IF-SensorR25
The IF-Sensor25 is a solid optical 3D measurement instrument for automated form and roughness measurement in production. The sensor is integrated into a production line and delivers you high resolution, repeatable and traceable results when measuring surface characteristics in the m or sub-m range. This resolution can hardly be achieved by conventional 2D solutions or tactile techniques.
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Optical Tensiometers
Theta Flex
Attension® Theta Flex is a contact angle meter that enables all measurements in one instrument for both research and quality control. It measures static and dynamic contact angle, 3D surface roughness, surface free energy, surface and interfacial tension, and interfacial rheology.
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Surface Roughness Tester Profilometer
TIME®3231
Beijing TIME High Technology Ltd.
TIME® 323X series is advanced high-end surface roughness measuring instruments with wide testing range (±400µm) and high accuracy (tolerance±5%, repeatability 3%). Meanwhile, TIME® 323X surface roughness tester features with skidless/skid measurement, which means it can reach smaller and harder to reach parts than other conventional tools. Up to 55 paramenters for roughness, waviness and primary profile are supported. Apart from those features mentioned above, TIME®3231 is loaded with 90° measurement function.
