Product

Thermocouple Thermometer – 2 Inputs – Data Logger

HD2128.2

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Senseca

HD2128.2 - Senseca

Thermocouple thermometer for probes type K, J, T, R, N, S, B, E, two inputs.

Product

Flexible Implantable Microprobe

IT-1E

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Physitemp Instruments

IT-1E - Physitemp Instruments

IT-1E Flexible Implantable Microprobe - For ultra fast measurements and for use on micro-size specimens. Similar to our most popular IT-18 microprobe but the sensor bead is exposed, resulting in the same ultra-fast response time of the IT-23 but with the Teflon™ sheath strength of the IT-18. Time constant 0.005 seconds. Tissue Implantable with a 18 gauge needle (supplied). Rather fragile at tip. Coated in Teflon™. Maximum Temperature 150°C. Isolated. Probe tip diameter .011", sheath diameter .025'' . 3 foot lead.

Product

Production Wafer Level Burn-in

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Celadon

Celadon

TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.

Product

Profilometer

MicroCam™

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NOVACAM Technologies, Inc.

MicroCam™ - NOVACAM Technologies, Inc.

MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices

Product

Non-Contact Mapping Life Time System

MWR-2S-3

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HenergySolar

MWR-2S-3 - HenergySolar

The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.

Product

AMIDA 5000 Tester

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Amida Technology, Inc.

Amida Technology, Inc.

AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.

Product

Digital Gauss Meter

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STAR TRACE SOLUTIONS PVT. LTD.

STAR TRACE SOLUTIONS PVT. LTD.

Digital Gauss meters are hand held devices which are used to measure D.C magnetic field using Hall Probes. The Gauss meter is available in two different ranges and helps in quick calibration. As the Digital Gauss meter is easy and simple to handle it is extensively used in industries which require measurement of magnetic field.

Product

Stand-Alone Test Fixture

MA 2012/D/H/GR2270/71

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INGUN Prüfmittelbau GmbH

MA 2012/D/H/GR2270/71 - INGUN Prüfmittelbau GmbH

Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg

Product

Probe Card PCB's

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Dynamic Test Solutions

Dynamic Test Solutions

DTS offers both generic and custom PCBs blanks for probe cards. Probe card PCBs are available for all tester platforms and can be configured for any vertical technology, epoxy cantilever and legacy blade cards. DTS probe card blanks are made to precise specifications required for all probing technologies and are available in high speed and high temperature materials. All probe card PCBs employ a balanced layering construction to maintain tight flatness specifications and minimize warping, allowing good probe planarity. Gold plating on all surface metals facilitates easy soldering and minimizes probe resistance. DTS is continually adding new probe card blanks to its library!

Product

Meat Cooking and Cool Down Temperature Data Logger

OT1000

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MadgeTech, Inc

OT1000 - MadgeTech, Inc

The OT1000 is made of Tecaform®, with a convenient mounting hook. The device is rated IP67, making it splash proof and easy to clean. The OT1000 is simple to use, just activate the logger, insert the probe into a meat product, and then with a couple clicks of the mouse data can be downloaded to a PC for analysis.

Product

Motherboards

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Integrated Technology Corp.

Integrated Technology Corp.

ITC currently manufactures over 100 different motherboard types, including interfaces to all major brands and types of testers. Additionally, ITC has the ability to quickly design and manufacture motherboards for any new tester interface including custom probe cards.

Product

Logger with Temperature/Relative Humidity Probe - Grey Case

TV-4506

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Gemini Data Loggers Ltd.

TV-4506 - Gemini Data Loggers Ltd.

With an unobtrusive grey case, the TV-4506 has temperature and RH sensors mounted on a 1m lead and is ideal for measuring temperature and RH in difficult to access areas, such as packing cases containing works of art.

Product

Probes, Magnetic Field

EM-6882 | 20 MHz To 230 MHz

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Electro-Metrics Corp.

EM-6882 | 20 MHz To 230 MHz - Electro-Metrics Corp.

The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.

Product

Complete Power Analysis System

PK3564-PRO

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Summit Technology, Inc.

PK3564-PRO - Summit Technology, Inc.

PK3564-PRO complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, and 1-year deluxe warranty.

Product

Wide Range Flexible Current Probe

EFX6000

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Summit Technology, Inc.

EFX6000 - Summit Technology, Inc.

The EFX6000 is a flexible AC current clamp utilizing the Rogowski principle. It can be used to measure currents from 1 amp to 6000 Amps in 2 auto-ranges, over a wide frequency range to 10kHz. The flexible and lightweight measuring head allows quick and easy installation in hard to reach areas, around large conductors and where access to confined or tight spaces is a problem. It requires no batteries or external power supply.

Product

CMP Mechanical Kits

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Columbia Elektronik AB

Columbia Elektronik AB

The CMP Mechanical kits are an excellent option for manual tests of both low and high volumes. Now in a more rigid design with removable probe plate for easier maintenance. Integrated fixture down switch as an option. The kit is available in 4 standard sizes but can be adjusted to your demands.

Product

Web Sensor with PoE

T7611

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COMET SYSTEM, s.r.o.

T7611 - COMET SYSTEM, s.r.o.

PoE Web Sensor with relative humidity and temperature probe on the cable. Built-in atmospheric pressure sensor.

Product

Test Probes

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E-Z-Hook

E-Z-Hook

A physical device used to connect electronic test equipment to a device under test (DUT).

Product

Electron Probe Microanalyzer

EPMA

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JEOL Ltd.

EPMA - JEOL Ltd.

JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.

Product

Rotating Bolthole Scanners

Nortec

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Evident Scientific

Nortec - Evident Scientific

Olympus extensive line of high performance eddy current scanners is available for use with Nortec Eddy Current Flaw Detectors. With a wide range of features consisting of speed ranges from 600 to 3000 rpm, frequency ranges from 100 Hz to 6 MHz, multiple connector types, and multiple probe types, our scanners offer a full range of application solutions.