Memory Test Systems
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Product
Automated Relay Test System
Relay Master
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Relay Master is an automatic relay test system capable of testing from one to 64 relays simultaneously without having to remove them from the rack. System automation improves efficiency and reduces track time requirements. The PC-based system stores test parameters and results in a database for ease of reliability and trending analysis.
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Product
Three-phase Fully Automatic Test System
TS41
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Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
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Product
Upstream-Measurement-System
AMA 310 UMS & VAROS 107
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This system combines the KWS devices AMA 310/UMS and VAROS 107 to a high-end monitoring system for the return path frequency range. An AMA 310 in a 19-inch version (3.5 RU) with UMS module is used in the headend, in the field the CATV handheld VAROS 107 is the counterpart.
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Product
Sensortech Systems
ST-3300
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Smart RF analyzer, custom-built to your specifications, for process moisture measurement and control of even the most complex products and environments.
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Product
Performance Profiler / Memory Leak Detector
GlowCode
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GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Product
Laser Test Systems
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Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers.
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Product
Halo Automatic Testing System
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Our revolutionary Halo system is an automatic metal detector testing device. It is designed to automatically test ferrous, non-ferrous and stainless steel samples on all Fortress metal detectors. Automatic testing saves time, money, labor, along with removing the risk of human error and work place injury at critical control points on a manufacturing line while complying with industry standards. The Halo system is ideal for applications where manual testing of a metal detector is made difficult due to access, position, access to the product flow, environmental conditions, etc.
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Product
Timing Systems
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ime Codes, generally in serial form, are used to convey time information from one point to another. Many different time code formats have been developed over the years, by both commercial and military agencies. Many of our products support one or more of these time codes as a standard feature.
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Product
Mobile Handset Voice Quality Test System
BK9024
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If you need to test cellphones, the BaKo Type BK9024 is fast and switches between up to 8 phone chambers at once, making it a great choice for quality control on your production line.
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Product
Optics Test Systems
MTF Measuring Device For Endoscopes
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Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Product
Development System
FE-RE2
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* Emulates Atmel AT89C51IE2/RE2 and others * 128K Code Memory * Real-Time Emulation * Frequency up to fmax 60 MHz * 3V and 5V Support * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * RS-232 and USB Interface * C Compiler and Assembler
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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
Physical Testing Test
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Physical Testing by Aero Nav: mechanical, weathering, environmental, immersion, electrical, luminance, thermal analysis, thermal conductivity, water exposure, saltwater exposure, etc.
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Product
METES - Meter Test Systems
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Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Product
M-Class System
ACQUITY UPLC
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The ACQUITY UPLC M-Class System delivers the performance you expect from nano- to microscale separations with the usability of an analytical-scale UPLC system. Each part of the system was designed and tested to deliver the right flow for the right column. The ACQUITY UPLC M-Class System provides excellent performance with overflow rates from 200 nL/min to 100 µL/min and a range of column inner diameter (I.D.) from 75 µm to 1.0 mm.
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Product
System
SYS-28
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This 28" box coater has a separately ventable top chamber, to allow for faster parts changes and increased productivity. It also is equipped with our FTC-620 flip controller. The flip and rotation motors can be seen on the top. This system uses a Varian tri-scroll pump and a bottom mounted 16" APD cryopump.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Test Automation System for Brake Testing
STARS Brake
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STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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Product
Metrology System
Aspect
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Memory density increases with both layer-pair scaling and tier stacking for memory stacks well over 200 pairs. The Aspect metrology system was designed with these future architectures and scaling strategies in mind. Aspect metrology is demonstrating performance superior to X-ray systems across multiple customer devices through a revolutionary infrared optical system providing full profiling capability to enable critical etch and deposition control, with the speed and process coverage that customers require.
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Product
Vibration Systems
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The Hanse 6 Degrees of Freedom (6DoF) vibration system consists of a patented-designed table with pneumatic actuators. The system can generate up to 100 GRMS over a frequency range of 5 to 10,000 Hz in 3 axes and rotational about each axis. 8 standard models are available. They range from 1 to 36 square feet.
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Product
Probe Systems
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These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Product
Long-Term Systems
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A long-term system from LI-COR lets you accomplish more with your multiplexed soil gas flux measurements. Connect up to 36 chambers to evaluate both spatial and temporal flux variation across a footprint of up to 2800 square meters.
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Product
(2500kN+) Fatigue Testing Systems
8806
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The precision mechanical systems, combined with the advanced features of the 8800 digital controller and Dynacell™ load cells, enable Instron to supply fully-integrated turnkey solutions to meet the most demanding applications. The system can be used to cover a broad range of static and dynamic test applications, covering metals, rebar, high-force fracture mechanics, aerospace panels, civil engineering components, wire ropes, or concrete.
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Product
Military Test Systems
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Santa Barbara Infrared is the leading supplier of sophisticated, integrated, multi-function E-O test systems used by the military in laboratory, factory, depot and field test environments. Each of these systems are built to specific requirements and utilize SBIR’s extensive design and test capabilities, core technologies and knowledge of the unique military applications. SBIR specializes in providing complete solutions with integrated hardware and software resulting in robust and easy-to-use systems.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Terahertz Systems
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Optoelectronic Terahertz-Generation. TOPTICA provides complete systems and components for both time-domain and frequency-domain terahertz generation. For time-domain applications, the TeraFlash sets new standards in terms of dynamic range, bandwidth and measurement speed. Combining TOPTICA's FemtoFiber smart laser technology with state-of-the-art InGaAs antennas, the system achieves a peak dynamic range of more than 90 dB and a bandwidth greater than 5 THz.
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Product
Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
