Memory Test Systems
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Swept Test System For Optical Components
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measurement platform for optical components with a fastscan speed, high resolution and accuracy. The systemcombinesour tunable lasers, polarization controller, power meter and software.
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Product
Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068E+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
High Voltage Cable/Harness Test System
CKT1175-50
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The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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IDS System
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Free yourself from analog signals, unreliable readings or cables altogether with the modern and expandable IDS system from Xylem - whether you are measuring pH, conductivity, dissolved oxygen or turbidity.
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Interface Systems
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To build a complete and accurate force measurement system, it’s essential to integrate a compatible sensor, instrumentation, and proper cables and connectors. Start with a high-quality load cell or torque transducer that suits your application needs. Pair it with compatible instrumentation, such as a signal conditioner, digital display, or data acquisition system, that can properly excite the sensor and interpret its output. To ensure signal integrity and reliable performance, use shielded, appropriately rated cables and connectors designed for your environment and sensor type. When all components are correctly matched and system calibrated, the result is a precise and dependable measurement system.
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Inertial Systems
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ACEINNA’s inertial systems provide end-users and systems integrators with fully-qualified MEMS-based solutions for measurement of static and dynamic motion in a wide variety of challenging environments, including; avionics, remotely operated vehicles, agricultural and construction vehicles, and automotive test.
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Vibration Test System
3-axis
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This small 3-axis vibration test system has been developed in response to many customers' request for ?gcompact and easy to handle & use h multi-axis VTSs without sacrificing performances, featured by its small installation area of W900mm by D850mm, relatively quiet due to employment of small fans insterad of bolower(s), a displacement of 25mmp-p for each axis and max. transient acceleration of over 98m/s2<10G>*,
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Product
Gas-insulated AC Test System
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Yangzhou Power Electric Co., Ltd
The test system is used to do AC voltage withstand test and PD measurement for high voltage insulation products, combined electrical equipment, instrument transformers, etc.
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Product
Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
Bloomy Simulation Reference System
System
The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Bolometer Systems
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The detector comes with an IR light collecting cone assembly, vacuum-sealed wedged window, field of view baffling, and low noise electronics. The bolometer system is then outfitted with a single cut-on IR filter or a cold, manually operated, 2 or 3 position filter wheel. We offer a selection of far IR cut-on long pass filters that range from 10 to 285µm.
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Product
In-line vacuum test systems
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Ensuring that products meet the highest quality standards is absolutely essential in the manufacture of food, pharmaceutical and cosmetic products in particular.Leak-tight product containers have a major role to play here. Leak-tight product containers have a major role to play here. Leakages allow the contents of a container to get out, but more importantly they also allow germs to get in, rendering the contents unusable.INDEC vacuum test systems monitor containers for leak tightness fully automatically within the production process. A wide range of containers, including bottles, jars and cans as well as tubs and trays, are tested for leak tightness by means of a non-contact inspection.The means to this end is a pre-existing vacuum or a vacuum created in the container expressly for the purpose of leakage testing. Containers which are not leak-tight are reliably identified and automatically rejected.These processor-controlled test systems are highly reliable and extremely easy to use, qualities which have played no small part in making them the first choice already for many companies throughout the world.
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Primary Injection Test Systems
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Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Product
Sensing System
FBG
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A cost-effective FBG (Fiber Bragg Grating) interrogation system that includes a tunable laser diode, 6 photodiodes, and several fiber-optic couplers has been developed with very simple coniguration. Especially, it is not necessary to compensate the accurate wavelength because the wavelength sweeping is precisely performed in terms of the response time of which external cavity material is 5 msec. Moreover, time-varying temperature trends as well as spectra of FBGs can be observed through the front display.
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Product
Electro-Dynamic Vibration Test System (Air Cooled)
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HIACC Engineering & Services Pvt. Ltd.
The air-cooled electro-dynamic vibration test system has a wide frequency range, high reliability, easy to operate and small foot-print area. The force ranges from 1kN to 70kN, and maximum load is from 70 kg to 1000 kg. This product can be integrated with HIACC’s environmental chambers.
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Product
Gel Strength Test System
LD-LGST-A10
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Gel Strength Test SystemLD-LGST-A10is mainly used to measure the gel strength of gelatine under the stipulated environment. It has traveling accuracy ± 0.3 % and Test range up to 5 to 1000 g Bloom. It consists of Jelly Strength Tester, Constant Temperature Bath and Refrigerator. Sampling depth can be present arbitrarily in 1 to 60 mm. It consists four kinds of sampling measurement modes: single-step, maintaining, circulating and automatic.
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Product
Shared Memory Network PCI & PCIx Interface
PCI-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Compatible with PCI & PCIx Host System Slots - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
PCB Interconnect Stress Test System
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PWB Interconnect Solutions Inc.
Integrated package including PC, Software with real time graphing and all related systems and hardware for 8 head, dual sense testing model IST-HC
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Universal Testing Systems
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Instron universal testing systems are versatile, high-accuracy platforms (available in electromechanical and hydraulic variants) designed to perform a wide range of static mechanical tests, such as tension, compression, bend, peel, shear, puncture, and more, on virtually any material. They support force capacities from fractions of a newton up to thousands of kilonewtons, with precision load measurement, high data acquisition rates, and compatibility with thousands of accessories, including a wide range of extensometers, grips, fixturing, and automation solutions to meet demanding quality and throughput standards.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Projectile Speed Measurement Test System
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This test equipment will help manufacturers, trading standards, consumer bodies, CPSC, CPSIA laboratories and regulatory authorities to check that they meet the requirements of ASTM F963 - 08 Standard Consumer Safety Specification for Toy Safety and ISO 8124-1:2009 projectile Safety of Toys –Part 1:Safety aspects related to mechanical and physical properties. It may also be valuable for certain sports equipment and related tests.
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Product
VX4 System
PrecisionWoRx
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The PrecisionWoRx VX4 System gives test facilities and probe card manufacturers the ability to confidently test tighter pitches and smaller probe tips. The system can be easily configured to specific requirements for a variety of probe card technologies. For processes using cards with very small probe tips, the system’s high-resolution optics deliver a detailed field-of-view for high accuracy and repeatability.
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Product
Lithography System
JetStep X500
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The JetStep X500 panel lithography system is optimized for volume manufacturing of high-end AICS and advanced packaging panels. The system incorporates a large field exposure system with advanced features to meet the challenging requirements encountered in production of AICS or panel level packaging, such as; fine resolution to 3µm with large depth of focus (DOF), high overlay accuracy of ±1µm, automatic magnification compensation with independent x and y magnification adjustment of ±100 ppm, and automatic handling of panel substrates of various dimensions, thicknesses, and levels of warp.
