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Wafer Chucks
ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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Stand-Alone Test Fixture
MA 2012/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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Modular DC Power Supply
62000B series
Chroma's new 62000B series of Modular DC Power Supplies offer many unique features for Burn-in and plating/electrolysis applications. The features include a N+1 redundancy, high power densities, hot-swappable maintenance, remote ON/OFF and programmable control via the CAN bus. The 62000B family offers 5 types of power module with ranging from 1V to 150V, current from 10A to 90A, and offers two mainframe type of six and three position. The six position mainframe can envelop in up to six power modules paralleled operation for 9KW power output. The 62000B can easily parallel up to fourteen mainframe to 120KW with current sharing and CAN bus control for bulk power applications. The Modular DC Power Supplies of 62000B are very cost effective with high power density and low current ripple. These instruments have be designed for burn-in applications such as the LCD panels, DC-DC converters, power inverters, notebook computers, battery chargers and many other types of electronic devices.
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Testing Multi-Radio Mobile Devices
IQxstream
With LitePoint's IQxstreamTM mobile test system you will have all the capability you need to fully test many 3G and even 4G cellular radios and standards. Moreover, the system is designed to reduce per-device test time and cost because of its unique parallelism architecture. A 100 MHz capture capability means that it can test adjacent channel leakage ratios (ACLR) in one, five-channel capture.
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High-performance multifunctional AC Power Supplies (CV/CF)
PCR-LE Series
The PCR-LE Series is a new line of advanced multifunctional AC power supply that has been developed from our PCR-L/LA Series (linear amplifier type). The PCR-LE Series provides high reliability and can be applied to various applications, by taking advantage of the features that can control broadband waveform freely. Moreover, the PCR-LE Series can be configured as a core device of a test system combined with E-loads and Power Analyzers for “Grid Connection Testing” in regard to dispersed power generation, such as Solar Power, Wind Power, Fuel Cell, and Gas Engine referred to as “New Energy Field”. With various options, the low frequency immunity test and various power enviroment tests are supported. The options for parallel operation and three-phase operation enable you to expand a single-phase system up-to 27kVA, single-phase three wires up-to 54kVA, and a three-phase system up to 81kVA. The system can be applied to a large-scale EMC site for testing of industrial high-capacity air conditioners.
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Modular UPS
PM SERIES 10 - 2080 kVA
PM Series is a scalable, redundant Modular UPS system designed to cost effectively provide high level availability for high density data centers and critical applications. True Online Double Conversion and advanced DSP control technology. Modular Architecture can scale power and runtime as demand grows or as higher levels of availability required. Combines the modular design with the N+X parallel redundancy technology.The maximum capacity of a single cabinet is 520kVA. Cabinets can operate in parallel configuration to build a system of up to 2080kVA.
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Power Supply Series
NGP800
The R&S®NGP800 DC power supply series, comprising five models with 400 W or 800 W, provides maximum power at a variety of operating points. The two or four 200 W outputs can each supply up to 64 V or up to 20 A. Electrically equivalent and galvanically isolated outputs can be wired in series or parallel for up to 250 V or 80 A.
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cPCI Serial Backplanes
CompactPCI Serial is an industrial standard for modular computer systems. It is based on the established PICMG 2.0 CompactPCI standard, which uses the parallel PCI bus for communication among a system's card components. In contrast to this, CompactPCI Serial uses only serial point-to-point connections.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Beverage Analysis
Analyze multiple quality control parameters of your beverages in parallel, within 3 to 5 minutes only. See all parameters on a bright, easily customized 10.4’’ touchscreen display. Anton Paar’s modular beverage analysis solutions are quickly adapted to your needs in a Plug and Play fashion. In any case, the sample filling and measurement process is completely transparent and traceable.
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Portable Circuit Breaker Tester
PI-1600
The PI-1600 Circuit Breaker Tester incorporates modular design and flexibility to provide unequaled capability in a portable package. The PI-1600 test set is two testers in one, incorporating the PI-800 and PI-AUX. The PI-800 section can be used alone, on 120 or 240 VAC supplies, generating continuous current of 400, 800, amps at 4.2 kVA, with peak output to over 10x. When configured for the PI-1600, the PI-AUX output unit is connected in series or parallel to the PI-800. The PI-AUX boosts total power to 9.8KVA, and allows testing of draw-out breakers and MCB’s to 1600 Amps. The units are housed in rugged interlocking suitcase-size enclosures. Each piece weighs no more than 125 pounds, allowing one-person hand truck mobility. Basic operation is very simple, and the proven MAC-21 control instrumentation provides optimal output control and measurement. The MAC-21 instrumentation is supplied in a separate rugged portable case, interlocks on top of the PI-800, and connects to a cable in the rear of the test set.
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RF-Antenna Communication Links Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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FPGAs
Think FPGA – think flexibility. Whether it’s high speed parallel signal processing you’re tackling or you’re implementing legacy bus support on the latest CPU platform, Elma has the FPGA solution you need.
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24 and 48 Digital Input/Output Cards
PCI-DIO Series
The PCI-DIO-48/48S, PCI-DIO-48JP/JPS, PCI-DIO-48JPL/JPLS, PCI-DIO-48H/HS and PCI-DIO-24S are 24- and 48-bit parallel digital input/output cards designed for use in PCI-Bus computers.
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Digital Pattern Generators
DPG
Active Technologies Digital Pattern Generators also known as DPG, allow digital stimuli generation to stimulate digital designs, providing the capability to emulate standard serial or parallel bus transactions or custom digital interfaces, for system or device debugging and characterization.
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Ultra-compact Wide Range DC Power Supply
IT-M3100 Series
IT-M3100 series breaks through the traditional tech limits, in the ultra compact size of only 1U Half-Rack, the unit can not only output high power, but also has high performance and versatility. It supports the master-slave parallel mode. The full range of models support multiple stacking and parallel connection by handily designing "leg" plug-in. Fit with rack mount kit to achieve the perfect use.
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GPIB Parallel Interface
Model 4823B
* Provides 56 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Available with DIN connector on circuit side for piggyback mounting.
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Shore Durometer Test Stand
UI-FT31
Shore Durometer Test Stand is used to support the durometer presser foot surface parallel to the sample support table to better complete the test.
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Programmable Current Preamplifier
99539
The Model 99539 is a modular, multi-channel current preamplifier with parallel, logic level, gain control input. It consists of circuit boards which plug into a 3 1/2" high by 19" wide rack chassis.
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Flexible Data/Analog Switching System
S6025DE
Universal Switching Corporation
Designed for parallel switching of RS-232 data or other similar types of data, the S6025DE delivers compact solid-state switching in an expandable configuration. The unit can start as a smaller size and be expanded later to a full 60x60 array with 25 levels, perfect for switching RS-232 type data. It provides a choice or a combination of remote control including RS-232C, RS-422A, RS-485, GPIB (IEEE-488) and Ethernet (10base-T).
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DC Power Supply, 0-120 V, 0-1.5 A, 180 W, GPIB
N6700
Keysight high performance DC power supplies offer speed and accuracy for test optimization. The single output, 200 W, GPIB 6641A-6645A provide fast, low-noise outputs; analog control of output voltage and current; fan-speed control to minimize acoustic noise; as well as parallel and series connections of multiple units.
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Single-Channel Voltage Output D/A Converters
Analog Devices offers a broad portfolio of single-channel voltage D/A converters, which includes many leading products in performance and package size, with resolutions from 8-bit to 20-bit, low power, and a serial SPI, parallel, or I2C interface. Within the industry’s smallest packages, we offer more functionality within smaller board and module sizes. The integration of a precision reference minimizes board area and costs, eliminates the need of calibration, and reduces the number of external components to simplify the design stage.
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Test & Measurement Platform
Konrad System Manager
The Konrad System Manager is the central tool for the Konrad test and measurement platform. It combines execution, interactive supervision and documentation of the installed Konrad test modules.- Displays the live status of the module functions in parallel to running test executions- Easy debugging of the switch routes- Control the modules functions- Configure device Alias name for modules- Display alias naming for switching channels- Execute selftest functionality of the modules- Display device information and documentation of the installed modules- Simulate modules
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USB Modular Source Measure Unit
U2723A
The 3-channel 20V/120mA module can operate in a 4-quadrant operation. The channels could be connected in series or in parallel to achieve up to 60 V/360 mA. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
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96-CH High-Driving DIO Card
PCI-7396
The PCI-7396 is 96-bit parallel digital input/output (DIO) cards designed for industrial applications. The PCI-7396 emulates four 8255 Programmable Peripheral Interface (PPI) chips. Each PPI offers three 8-bit DIO ports which can be accessed simultaneously. The total 12/6 ports can be configured as input or output independently.
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Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Inline Test Handler W/Bypass
6TL36
The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space when compared to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line), and with three conveyors (Retour conveyor).
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Manual Test Fixture (MA)
MA 2013/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg
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50 MHz 32-CH High-Speed Digital I/O Card
PCIe-7350
ADLINK's PCIe-7350 is the advanced version of hot-selling PCI/PCIe-7300A featuring high-speed digital I/O with 32-channel bi-direction parallel I/O lines. The data rate can achieve up to 200 MB/s through the x1 PCI ExpressR interface. The clock rate can support up to 50 MHz internal clock or 100 MHz external clock, which is ideal for the applications of high-speed and large-scale digital data acquisition or exchange, such as digital image capture, video playback and IC testing.
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OD And Light Transmittance Meter
Shenzhen Linshang Technology Co., Ltd.
A series of light transmittance testing instruments provided by Linshang Technology include a light transmittance meter LS116 with a parallel light path design, a optical densitometer LS117 with a diffuse transmission principle, and a split type light transmittance meter LS110 that measures the car front windshield. The light sources used in these light transmittance meters comply with the CIE photopic luminosity function.
