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In-System Programmer for ARM
MPQ-ARM
Supports Nuvoton M05x and NUC1xx device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Real Time Monitor Interface
ANALYSIS 4N
It supports a management on the on-site equipment, such as to add subnets, to add subnet equipment, or to config equipment parameters, etc. Subnet fulfills the following applications: parallel communication, interaction with equipment, batch logging, downloading, configuration, ending, timing synchronization and system status viewing.
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Confocal FLIM for Macroscopic Objects
DCS-120 Macro
*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Power Supplier QP303E 2x30V/3A
*on / off switch output section*two independent adjustable DC output*independent outputs serial and parallel*constant voltage and current*Low ripple and noise*four digit LED displays three*for 16 hours at full load*automatically search out
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4-Port In-System Programmer For Silicon Labs
MPQ-C2
Supports Silcon Labs C8051F series devices with C2 Programming Interface Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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NI-9477, 60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module
779517-01
60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module - The NI‑9477 works with industrial logic levels and signals to connect directly to a wide array of industrial relays, solenoids, and motors. Each channel is compatible with signals from 5 V to 60 V and … features isolation from channel‑to‑earth ground. You can wire the NI‑9477 channels in parallel to sink up to 20 A of current per module (1 A per channel maximum).
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Step Height, Parallelism and Flushness Finish
stepCHECK
8tree's stepCHECK delivers accurate 3D measurement and instant analysis of step height, parallelism, and flushness finish between adjacent surfaces. Using the augmented reality reprojection of results, operators can visualize surface alignment non-conformity and identify corrective actions, right on the shop floor. With stepCHECK, inspection of surface alignment GD&T requirements becomes easier (Geometrical Dimensioning & Tolerancing).
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Stand-Alone Test Fixture
MA 2011/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Manual Test Adapters
Manual test adapters (MA) from INGUN are available in several series and series, which differ in terms of use, maximum permitted contact force, parallel stroke, size and service life.
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Dual Parallel Strain Gauges
Dual Parallel Strain Gauges strain gauges have two measuring grids arranged parallel to each other. Typical applications include measurements on bending beams
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Platform for Multi camera systems and Embedded vision
xiX
*Smallest camera featuring Sony Pregius™ - Compact with only 26.4 x 26.4 x 31 mm and 30 grams (1)*Fast CMOS - High speed, high frame rate: from 2.3 Mpix at 166 Fps to 50 Mpix at 33 Fps*Cool economy - Low power consumption with under 3 Watt and minimal heat dissipation*All-around support - support for Windows 7 and 10, macOS, Linux, ARM and embedded platforms*Industry standard - Data and control interface complies with PCI Express External Cabling Specifications*Adaptable potential - Available with two flat ribbon flex cable connectors: parallel and perpendicular *Software interfaces - GenICam / GenTL and highly optimized API / SDK for Image Processing*Connectivity and Synchronization - Programmable opto-isolated input and output, 4 status LEDs*Lens control - EF-mount Interface allows remote control of aperture, focus and image stabilization*Highly Customizable - Variety of sensor options including Sony IMX287, IMX273, IMX249, IMX265, IMX264, IMX267, IMX304 available in board level stack for OEM use and with switches and adapters*Interoperability increase - Continuous embrace of new software and hardware partners*Cost efficient - Excellent value through utilization of the newest technologies including Sony Pregius™
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Earth Ground Clamp
1630-2
The 1630-2 FC clamp measures earth ground loop resistances for multi-grounded systems using the dual-clamp jaw. This test technique eliminates the dangerous and time-consuming activity of disconnecting parallel grounds, as well as the process of finding suitable locations for auxiliary test stakes.
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Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Liquid Test Fixture
16452A
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Multiplying Current Output D/A Converters
Analog Devices offers a wide range of high precision, multiplying current output (IOUT) D/A converters (DACs) that feature ±1 LSB INL and DNL specifications, from 12-bit up to an industry-leading 18-bit resolution. Our portfolio includes single and multiple D/A converters in small packages with parallel or serial SPI interfaces. Multiplying current output R-2R D/A converters allow for an external amplifier that’s optimized for specific applications and that does not require reference buffering, which enables high linearity. The SoftSpan™ feature allows software selectable output spans, therefore eliminating the need to add precision gain stages and the associated external jumpers, precision resistors, and amplifier circuitry. Integrated precision resistors allow for reference inversion, bipolar offset, and offset and gain adjustment.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Benchtop Unit for Universal Coating Thickness Measurement
FISCHERSCOPE MMS PC2
Multifaceted for coating thickness measurement and material testing. Universal multi-measuring system for parallel coating thickness measurement and material testing with up to eight measuring modules.
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MEMS Device-Oriented Testers
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Vector Tester
PVT360A
The R&S®PVT360A is a VSG/VSA single-box vector tester optimized for FR1 base station, small cell and RFcomponent testing in production and characterization environments. Two independent signal generatorsand analyzers enable fast parallelized measurements. A frequency range of up to 8 GHz, flexible bandwidth configuration and an optional second TRX channel provide the necessary performance and enable flexible adaptation in a small form factor.
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Power Supply 303d-II
PowerLab triple Series power supplies are reliable and accurate laboratory equipment with two outputs with adjustable and stabilized DC voltage and regulated ( limited ) power consumption and additional output has – voltage . Adjustable outputs can work independently , in series (max output voltage 120V DC for model 605- II) or parallel (max current of 10A for models 305- II and 605- II) . Power can be used in the design of electronic products , scientific works , laboratories, production lines and in teaching .
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DC Power Supply
PW-3063R
*Use Toroidal Transformer. Low EMI & High EMS.*Triple output, 0-32V/0-6A X2 and 5V/3A .Max. 400Watts*Tracking operation. Max. output 64V/6A on tracking series or 32V/12A on tracking parallel.*4 display, Green LED shows Voltage and Red LRD shows Current. Easy to read.*Compact design. G.W. 9Kgs only. Easy to handle.*The resolution of PW-3063R as high as 0.1v and 0.01A.*Very low Ripple & Noise, less than 0.4mVrms. Very suit for precise measurement.
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Semiconductor
Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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Scale / Weight Meter
Equipped with a DC or load cell signal conditioner, this Laureate offers special firmware for scale / weighing applications: two tare functions; count by 1, 2, 5, 10, 20, 50 or 100; auto-zero function; setpoint offset, and dummy right-hand zero for display to 999,990. Built-in excitation for up to four 350-ohm load cells in parallel.
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Confocal FLIM System
DCS-120
*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Hardware Platforms
Backed by decades of expertise in the development of innovative hardware solutions, OPAL-RT’s unique approach integrates parallel, distributed computing with commercial-off-the-shelf technologies, offering an unmatched combination of performance, openness and affordability.
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High Power Programmable AC Source with Transients
61510
Chroma Systems Solutions, Inc.
Power Rating:61511: 12KVA61512: 18KVAVoltage Range: 0-150V/0-300V / AutoConfigurations with input voltage of 220V or 480VFrequency: DC, 15Hz-1500HzSingle-phase or three-phase output selectableProgrammable slew rate setting for changing voltage and frequencyProgrammable voltage and current limitHigh output current crest factor, ideal for inrush current testingTurn on, turn off phase angle controlTTL signal which indicates output transientLIST, PULSE, STEP mode functions for testing Power Line Disturbance (PLD) simulationVoltage dips, short interruption and voltage variation simulationHarmonics, inter-harmonics waveform synthesizerComprehensive measurement capability, including current harmonicsAnalog programmable interfacesRemote interface: GPIB, RS-232, USB and EthernetCapable of delivering power output up to 90KVA by implementing Master-slave parallel operation
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Multi-Channel UT
Pilot
Pilot is a next generation multi-channel UT device. Its one-of-a-kind specifications make the Pilot capable to perform advanced ultrasound inspections. Pilot is unique in its capacity to meet the most demanding needs of various industries, from aeronautics (employing composite and honeycomb structures) to in-line, as well as TOFD and many other applications with stringent requirements. Compact and powerful, this 8-channel full parallel, or up to 64 multiplexed, unit pushes the boundaries of the UT benchmark as it is more efficient than any other conventional UT system in the NDT market.
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LCR & Component Tester
PeakTech Prüf- und Messtechnik GmbH
Digital LCR measuring device for resistance, capacitance and inductance with high-resolution dual multifunction display. Components can be measured in series or in parallel and the LCR meter also offers the choice between automatic and manual range selection.
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3D Measurement
PSD-Array
The PSD array consists of 16 parallel one-dimensional PSD elements on the same chip. By utilizing the triangulation technique the reflection of a laser line or multiple laser spots onto the PSD array will provide information about the contour of the illuminated object. The possibility for simultaneous readout of the 16 elements together with the fast response of each element makes the PSD array suitable for applications like high speed 3D contour measurements and measurements of parallel, moving objects such as cantilevers.
