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DC Electronic Loads
LSG Series
*Operating Mode : C.V/C.C/C.R/C.P/C.C +C.V/C.R + C.V/C.P. + C.C.*High Precision, High Resolution (10 A),High Speed Variable Slew Rate (16A/ s).*Sequence Function for High Efficient Load Simulations.*Parallel Connection of Inputs for Higher Capacity. (With 4 Booster Units : Max 9.45kW or 4 Master Units)*External Channel Control/Monitoring via Analog Control Connector.*Program Mode to Create Work Routines for Repetitive Tests.*Multiple-Interface : USB 2.0 Device/Host and GPIB/RS-232C.*Adjustable OPP/OCP/OVP Setting.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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4000W to 50,000W - Single Output
ALE-Rack Mount Series
*Compact, lightweight design*Simple parallel operation for higher power*Worldwide input voltages/frequencies*Fully adjustable output voltage*Full remote control interface*Safety agency approvals
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Stand-Alone Test Fixture
MA 2013/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Validation Testers
M Series
The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
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Frequency and Phase Agile 120 MHz Signal Generator.
DDS8p
The DDS8p generates cosine, sine and ACMOS/TTL output signals. The frequency is programmable in 1µHz steps from 100Hz to 120MHz. The phase is 14-bit programmable. The DDS8p is controlled by a binary parallel interface that allows frequency and phase changes as fast as 600 nanoseconds. It is accurate to 1ppm and requires 5 VDC power.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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GPIB Parallel Interface
Model 4803
* 4803 Board provides 40 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Dual GPIB headers support connections to a GPIB Connector/Address Switch Assembly or to a GPIB Flat Ribbon Cable Assembly.* Optional Relay Driver board drives 24-40 relays.
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Programmable Switching DC Power Supply
The SPS5000X-Series is a programmable Switching DC Power supply series that provides a wide range of output power using single-channel and multi-channel output configurations coupled with constant power capability. The series of power supplies includes sixteen models with voltages to 160 VDC and power to 1080 W. The SPS5000X supplies can be connected in series (2 units) or in parallel (3 units) to meet the requirements of 0~320V and 0~270A, with a maximum combined power of 3240W.
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DC Electronic Load
DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more.
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5.0 MP Custom Lens Camera Module (Monochrome)
e-CAM50_CU9P031_MOD
e-CAM50_CU9P031_MOD is a 5 MP custom lens monochrome camera module based on Aptina's MT9P031 CMOS image sensor with S-mount lens holder attached to it. The MT9P031 is a 1/2.5" Optical Form factor, Electronic Rolling Shutter CMOS sensor. The e-CAM50_CU9P031_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM50_CU9P031_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Discrete Device Test System
capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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PXI 16 Bank 5 Channel 1 Pole Multiplexer
40-616-021-16/5/1
The 40-616 16-Bank, 5-Channel, 1-Pole Multiplexer Module forms part of the System 40 PXI Programmable Switching system. The Module consists of 16 electrically isolated banks of multiplexers controlled by a PXI/ PCI interface. Each bank is a 1 to 5 multiplexer and operates with break-before-make action when a new channel is selected. Any Individual multiplexer bank can have a channel set by itself, alternatively, multiple banks can have channels selected simultaneously. The module is suitable for cascading in applications that require large multiplexer systems, it is also suitable for test systems that require the switching of a large number of signals in parallel.
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Ultra-High Performance FLASH and DRAM Memories Test Solution
Magnum V
Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.
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4-Port In-System Programmer For Zilog
MPQ-Z8
Supports Zilog Z8 Encore, Encore XP, Zneo and Crimzon device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Mission Critical, Fault Tolerant Power Supplies
Series HSF
- Hot-swappable plug-in power supplies.- Designed to be combined in an N+1 fault-tolerant power system.- Front panel voltage adjustment trimmer for adjustment of output voltage.- Built-in forced current sharing and or-ing diodes.- May also be used independently as a multi-output power supply.- Designed to be sustainable - new models are backward compatible with existing racks.- Available in 1U and 3U sizes. Mounts in 19-, 23-, and 24-inch equipment racks.- All models include power factor correction (PFC).- Full service customized DC power distribution systems can match power supply output(s) with your load(s).- I/O connections via 24 pin connector that plugs into rack adapter. External connections are made via rack adapter.- Surface mount technology permits minimum mounting space.- Entire RA 19 racks populated with HSF power supplies can be connected in parallel, parallel-redundant or series.- HSF are CE Marked per per the LVD, EMC and RoHS 2 Directives. See applicable Declaration of Conformity.- Compliant with UL 8750, Standard for LED Equipment,- Watch video of NEBS GR-63-CORE earthquake and office vibration testing.
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Fixed Mount Strobes
Our fixed mount stroboscopes are designed for installation in applications requiring continuous stroboscopic visual inspection. The MVS is available with xenon or LED light output with adjustable pulse width and focal distance for optimized target illumination. Connect your existing trigger signal or the optional Frequency Controller with LCD. Connect multiple units together in parallel for applications with wide illumination area requirements. Use the optional Audio Interface Box and microphone to create stunning audio driven visual effects.
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PCI 24-Bit Digital I/O Cards
PCI-DIO-24D/H
These cards are 24-bit parallel, digital input/output cards designed for use in PCI-Bus computers. The difference between the models is that I/O connections to PCI-DIO24D are via a standard 37-pin D-sub connector while I/O connections to PCI-DIO24H are via a 50-pin connector. The cards are 4.80 inches long (122 mm) and may be installed in any 5V PCI-bus slot in IBM and compatible personal computers.
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FLIM Upgrades for Olympus
FV1000
*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Detection Wavelength Range from 360 nm to 900 nm*Excitation by Ti:Sa Laser, OPO, or by bh ps Diode Lasers*Systems for Multiphoton FLIM and Confocal FLIM*Systems are Modular: More FLIM Channels can be Added
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Parallel Electrode SMD Test Fixture
16192A
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Time History Recording to Throughput Disc
For the most critical tests time history data can be recorded in parallel with vibration control with no reduction in control performance. The real-time throughput data capture function of the m+p VibControl system allows you to record all selected channels continuously in the time domain on the embedded data server (“throughput to disc”) irrespective of the channel count and the frequency range utilized. This means that you can always access all the original data for analysis purposes.
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PXI Resistor Module Dual 16 Bit With 16XSPDT Relays
40-290-121
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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PCI Three-Axis Laser Board
N1231A
The Keysight N1231A PCI Three-Axis Laser Board is a register based PCI bus board that implements three axes of laser measurement for position monitoring and closed-loop servo control. The hardware outputs, optimized for connection to a DeltaTau PMAC servo control system, provide parallel digital position data at rates up to 4MHz. The same position data along with velocity data is available over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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Memory Test Systems
ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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TestStation Multi-Site Inline
TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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The Ultrafast Grid
The next generation of cross browser testing gives you parallel test automation at a scale never seen before – across all browsers, devices, and viewports.
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MEMS And Sensor Test Automation Platform
Sense+
Sense+™ ultra-precise MEMS & sensor test automation platform allows for significant improvement in test accuracy, parallelism for a lower cost of test, and the ability to handle and inspect, small delicate sensors. Fully configured, Sense+ delivers a one-pass automated test, inspection, and metrology for the most complex MEMS devices including <1 mm WLCSP.
