Discrete Semiconductor
semiconductor typically having one circuit.
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Semiconductor Probe
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Module, Receiver, RTCASS, Signal, 210 Position, Discrete Wiring
510113146
Module, Receiver, RTCASS, Signal, 210 Position, Discrete Wiring.
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Switch Modules - 16 Single Pole, Form A, Discrete Relays Which are Wired & Controlled Individually
JX16/KA
This module has 16 single pole, Form A, discrete relays which are wired and controlled individually. The relays can be externally wired to make any configuration needed. Use as individual ON/OFF relays or use them to drive external relays, solinoids, or any external device. It is available with Type S or M reed relays.
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Semiconductor
The semiconductor industry faces continuous pressure to reduce device size and costs while improving performance and reliability. Semiconductor, test and assembly automation manufacturers demand the same improvements from the motion technology which drives it. Haydon Kerk Pittman continues to develop new technologies in motors, lead-screws, gears, encoders, actuators, slides, drives and complete sub-systems that increase operational speeds and accuracy while lowering the cost of ownership.
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Protective Cover, 9050, VXI and Discrete Wiring, ITA
410112582
When storing the ITA, the cover snaps on to protect the modules and contacts. The body of the cover is clear chromated aluminum and the mounting blocks are made of Delrin.
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Complete Solution for Developing & Testing Discrete Voltage-Level Interfaces
M8KDiscrete
The M8KDiscrete module provides a complete solution for developing and testing discrete voltage-level interfaces. The M8KDiscrete contains control I/O registers that are memory-mapped and may be accessed in real time. The module supports ten programmable I/O discretes that can record or control the external discretes that are connected to it. In addition, the module can record changes in the input discrete with an associated time tag via a built-in FIFO. Output discretes are open collector, capable of handling up to 32V with a maximum sink current of 100 mA each.
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Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Semiconductors
Teledyne Lincoln Microwave designs our own proprietary microwave diodes, which underpin many of our performance advantages.Our Semiconductor Technology Centre is located at the School of Physics and Astronomy within the University of Nottingham, UK. Facilities include a 90m2 ISO class 6 process cleanroom with ISO class 5 laminar flow.
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3U OpenVPX Multichannel Discrete I/O Board
68DT1
The 68DT1 is a 3U OpenVPX™ board featuring up to 96-Channels of Standard Functionality (SF) DT1 module-type or Enhanced Functionality (EF) DT4 module-type Discrete I/O functions [foptioned, factory configurable].48-Channels are dedicated as input (voltage or contact sensing with programmable, pull-up/pull-down current sources). An additional 24 or 48-Channels are programmable for either input or output (current source, sink, or push-pull) switching up to 500 mA per channel from an applied 3 – 60 V external VCC source (or sink to ISO-GND). The 68DT1 can sense broken input connections and whether an input is shorted to +VCC or to ground. Additional features of the DT4 EF are listed below. The 68DT1 offers unparalleled programming flexibility, a wide range of operating characteristics, and a unique design that eliminates the need for pull-up resistors or mechanical jumpers.
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32-CH Discrete Input Modules
HSL-DI32-M-N/HSL-DI32-M-P
- Slave ID consumption: 2 consecutive from odd- "N" type for NPN sinking type sensor or dry contact; "P" type for PNP sourcing type sensor or wet contact- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ± 10 mA (Max), ± 12.5 mA (Peak)- Input voltage: ± 40 V (Max)- LED indicator: Power, Link and Input status- Power supply: +10 V to +30 VDC
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Semiconductor Tester
5000E
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
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Discrete Switch Cards
Compatible for use on the VXI, LXI, and GPIB platforms, these switch products were formerly sold under the Racal Instruments brand name.
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Semi-automatic Semiconductor Probe Assembly Equipment
The components of the incoming parts are pre-assembled and preloaded to two packages. We use a high-speed four-axis robot equipped with high-precision multi-sensor grips to grab these pre-assembled subcomponents. Under CCD visual guidance, a set of rotary grab devices is equipped to capture top plunger. The device uses a multi-set CCD visual module to ensure accuracy, and the positioning accuracy of each motion link is controlled within 15um.
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Compound Semiconductor
Scientific Computing International
Semiconductors that are made from two or more elements.
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Semiconductor Test
Ismeca NY32
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
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100-Pin Micro-D Connector, Male, Discrete Wire, 2-56 UNC Screwlocks, Metal Shell
C100SMR-1CW-6A
This accessory is designed to allow users to directly terminate a cable to the connector. It is difficult to terminate cable to the 100-Pin SCSI Style Micro-D connector because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Receiver, 9050, 50 Module, Dual Discrete Wiring Tiers, EMI Gasket
310104429
The 9050, 50-module receiver is rugged and designed to accommodate high I/O and suited for larger test and measurement systems. Both tiers are designed for discrete wiring and can accommodate individual 9025 ITAs. This 9050 also offers a gasket for EMI applications.
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16-CH Discrete Input 16-CH Discrete Output Module with UJ Type Connector
HSL-DI16DO16-UJ
*16-CH digital input and 16-CH digital output*Higher output current up to 90mA/channel*Isolation Voltage: 2500Vrms*JAE 3-pin connector*Easy installation and wiring
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9050, 50 Module, Receiver, VXI and Discrete Wiring, Double Tier
310104248
This 50 module receiver is rugged and designed to accommodate high I/O. With high contact point availability, the 9050 receiver is suited for larger test and measurement systems. The top tier accommodates VXI instruments and accepts VPC's interconnect adapters with the bottom tier for discrete wiring.
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Manual Semiconductor Metrology System
Front USB port enables easy storage of measurements and other data to flash drivesMTI Instruments’ Proprietary Capacitance Circuitry for Outstanding Accuracy and DependabilityNon-contact measurements76-300 mm diameter wafer rangeOptional wafer measurement ringsWafer stops for exact centeringEthernet interfaceFull remote control software (Windows compatible)Optional calibration wafers
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Semiconductor Assembly
With the know-how that we have cultivated over many years in the semiconductor manufacturing process, we respond to the diverse needs of our customers regardless of prototype production and mass production.
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Receiver, 9050, 50 Module, Dual Discrete Wiring Tiers
310104368
The 50 Module Receiver is a rugged system devised to accommodate high I/O. With high contact point availability, the 50 Module Receiver is suited for larger test and measurement systems. Both tiers are designed for discrete wiring, and can accommodate individual 9025 ITAs.
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Semiconductor Technology, Micro Scriber + Meters For Contact Angle And Surface Tension
SURFTENS WH 300
Optik Elektronik Gerätetechnik GmbH
The leading equipment for professional use in 200 and 300 mm wafer processing in semiconductor technology. SURFTENS WH 300 is equipped with a 3 axis wafer robot, wafer scanner, loadport for 200 and/or 300 mm wafers, fan filter unit, notching system. Suitable for any cleanroom class it features the automatic mapping of contact angles on wafers for up to 25 wafers.New: with SECS/GEM Interface!
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Semiconductor
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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Thyristors - Phase Control Discrete
Phase control discrete thyristors from Vishay are available in more than a dozen package types and with voltage ratings from 4 V to 2600 V.
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Combination Module: 2 Ch. MIL-STD-1553 & 12 Ch. Discrete I/O
CM8
The CM8 module is a combination of NAI's MIL-STD-1553B module, FTB, and Enhanced Discrete I/O module, DT4. The CM8 offers twelve channels of discrete I/O and two channels of MIL-STD-1553B communications. The twelve discrete I/O channels are programmable as either input (voltage or contact sensing with programmable, on-module pull-up/pull down current sources), or output (current source, sink, or push-pull) up to 500 mA per channel from an applied, external 3-60 VCC source. The discrete I/O channels also provide additional functionality modes such as Pulse Width Modulation (PWM) output mode and Pattern Generator output mode. The two MIL-STD-1553B communications channels feature a dual, redundant, balanced-line, physical layer; a (differential) network interface; time division multiplexing; half-duplex command/response protocol; and up to 31 remote terminals (devices).
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Semiconductor
With state-of-the-art manufacturing facilities in the U.S., Europe and Asia, local sales offices throughout the world, and on-site applications support, FUJIFILM Electronic Materials is your global partner.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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OEM DC Power System For Semiconductor
AMETEK Programmable Power, Inc.
*Single Package 6-Pack of 600W power supplies*Complete self-contained controller operates independently once pre-set*Capable of ramps and sequences*Capable of inter-channel dependent operation*DeviceNet Interface*Solid State polarity switching
