Defect
other than specified, imperfection .
-
Product
Vibration Testers
-
Analyzes vibration patterns within mechanical systems or individual components and structures to identify defects and evaluate the test object's overall condition.
-
Product
WireChop
-
A cost-effective, proven defect chopper system that works with both bench presses and automatic machines
-
Product
EasySegment
-
Unsupervised mode: train only with “good” images to detect and segment anomalies and defects in new imagesSupervised mode: learn a model of the defects for better segmentation and detection precisionWorks with any image resolutionSupports data augmentation and masksCompatible with CPU and GPU processingIncludes the free Deep Learning Studio application for dataset creation, training and evaluationOnly available as part of the Deep Learning Bundle
-
Product
High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
-
Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
-
Product
Ultrasonic Concrete Testing
-
This category comprises the range of instruments that use sound or stress waves in order to determine the properties of concrete and other materials non-destructively. The first and most widely used System is our V-Meter, which utilizes the ultrasonic pulse velocity method for evaluating construction materials in the field. Transducers are available for a variety of frequencies from 24 KHz to 500 KHz. This unit has also been modified to suit the special needs of ceramics users and can be found as the Ultrapulse. The PIES, our revolutionary Portable Impact-Echo System, is an advanced instrument for non-destructive detection of flaws and defects in a variety of civil infrastructures ranging from bridges, parking structures and buildings to dams, piles, tunnels, tanks and marine structures.
-
Product
Portable Eddy Current Flaw Detectors
-
Portable eddy current (EC) flaw detectors inspect metallic parts and perform highly reliable and advanced flaw detection of surface and near-surface defects. Olympus offers portable eddy current equipment to meet a broad range of applications, including the detection of surface or near-surface defects, and the inspection of bolt holes.
-
Product
Transistor-Level Defect Simulator
Tessent DefectSim
-
Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.
-
Product
Code Verification Systems for Quality Inspection
-
Matrix codes enable the comprehensive and seamless traceability of goods, which turns out as significant advantage considering everyday product recalls across all industries. Whether salmonella in food, contaminated cosmetics or poor components: defective products can harm consumers, cause losses of image as well as massive economic losses. Using the 2D code, each individual article can be localized globally. Based on the specific serial number, producers and consumers can clearly identify articles if required. That represents a perfect tool for determining whether the article is subject to be withdrawn from circulation. The proper application and specification of 2D code contents allows for serious and sustainable companies to limit recalls, save costs, and to take responsibility for consumer protection.
-
Product
Exploratory Testing
-
Defects in apps and on websites directly impact customer conversions and retention. They exhaust user goodwill and ultimately damage your brand and revenues. Scripted or automated testing might indicate whether a particular customer journey works as intended, but will not necessarily reveal bugs beyond specific boundaries. They come to light only when the app or website is in front of real users.
-
Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
-
Product
AI ANALYZER
-
Nanotronics uses artificial intelligence to give our customers’ unprecedented freedom and control for defect detection. We offer an AI based Anomaly Detection Algorithm (ADA) toolkit that automates the work of writing computer vision algorithms to detect and classify defects on bare substrate and epi wafers as well as on thin films, glass and any other material with a uniform background.
-
Product
X Ray Flaw Detector
-
A non-destructive testing (NDT) device used to inspect materials for internal flaws or defects such as cracks, voids, inclusions, and weld discontinuities.
-
Product
Wiring Analyzers for Cables, Wire Harnesses, Backplanes
CableEye M2Z, M3Z, M4
-
With our cable testers and harness testers, find defective or miswired cables instantly before they damage equipment or waste valuable technician time. CableEye® all-in-one test and cable management systems have a unique, patented graphic wiring display to visually pinpoint problems when wiring errors are detected, and offer under a second pass/fail testing for production environments. Quickly locate intermittent connections and identify their position in the cable.
-
Product
Compound Semi | MEMS | HDD Manufacturing
-
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
-
Product
IR Thermometers
-
This device truly stands out because of its fast response, high/low alarms and dual laser pointer. It is used by maintenance professionals to quickly locate worn machinery, hot spots in electrical panels and defective HVAC equipment.
-
Product
Stamped Spring Pin Sockets
-
Ironwood Electronics SBT sockets are small footprint sockets that are compatible with other product lines such as GHz elastomer sockets, Giga-Spring sockets, etc. The socket needs about 2.5mm extra space around the chip than the actual chip size utilizing only very small PCB real estate. A heat sink screw on the top provides the compression force as well as thermal relief and can be customized to dissipate more power. SBT socket uses SBT contact technology for high endurance and wide temperature applications. SBT Contact is a stamped contact with outside spring as well as inside leaf spring that provides a robust solution for Burn-in & Test applications. Solutions are available for 0.3mm to 1.27mm LGA, BGA, QFN, QFP, SOIC and other packages. Contact technology has 3 part system which includes top plunger, bottom plunger and a spring. The Beryllium Copper plungers are stamped and assembled to a stainless steel spring in an automated system to enable fast turnaround time, low cost and zero defects.
-
Product
Holiday Detectors
-
Holiday Detectors are devices used to minimize the effects of corrosion by detecting the presence of “holidays” or “defects” in non-conductive coatings.
-
Product
Infrared Microscope
DDR200 & DDR300
-
The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
-
Product
Flat Panel Display Test Solutions
-
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
-
Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
-
Product
Automated Stand for Magnetic Luminescent Control of Railway Wheels
-
The amount of information processed and time constraints required the creation of a multi-level distributed image processing system based on National Instruments Compact Vision System controllers, industrial computers and workstations. During the control process, the wheel is watered with a magnetic-luminescent emulsion, magnetized and exposed to ultraviolet radiation. As a result, the emulsion deposited on the defects glows in the visible range (yellow-green light). Eleven FireWire (IEEE 1394) color cameras with a resolution of 1280 x 1024 are used to scan the wheel surface. In one iteration, they completely cover a 20-degree sector of the wheel.
-
Product
Visual Control System of Label Printing Quality
-
The created system allows detecting the following types of label printing defects:- absence or indistinct image or inconsistency of information applied by typographic method;- absence or indistinct image or inconsistency of information or going beyond the boundaries of the print field of variable information printed on the labeling machine (batch number, expiration date).The system is based on a Basler Scout A1300-32gc digital industrial camera and a panel computer.
-
Product
3D CT AXI
-
PCB manufacturers can enjoy comprehensive, high-speed inspection with Omron’s revolutionary technology that reliably captures defects in hidden areas.
-
Product
Vacuum Discharge Test Equipment
DAC-VD-1
-
DAC-VD-1 can locate defective points such as scars or pinholes on stator coils and wires easily.By applying voltage in a vacuum chamber, the electric arcing from a defective part can be discoveredvisually in a short time. DAC-VD-1 can be used widely in variety of applications from product developments to outgoing inspections.
-
Product
Scanning Electron Microscope
E5620
-
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
-
Product
Superior Handheld Partial Discharge Detector
PDStar
-
Power Monitoring and Diagnostic Technology Ltd.
PMDT is proud to present one of our latest innovations, the PDStar. It integrates On-Line Partial Discharge (OLPD) testing and Infrared testing for MV and HV equipment, which combines UHF, AE, Ultrasonic, HFCT, TEV, and Infrared testing technologies. It is applicable for online PD testing, as well as abnormal heating and defect detection on all types of substation equipment. PD amplitude, PRPD, PRPS, and infrared spectrums provide critical data for determining the operational condition of electric power equipment. It connects to the PMDTCloud via Wi-Fi/3G/4G to upload test data, download test tasks, and receive diagnostic results in real time. Another uniquely advanced feature of the PDStar is that it integrates with a 100 MSPS (Mega-Samples per Second) HFCT signal processor, which greatly improves the performance for power cable OLPD testing.
-
Product
Thermal Imager with App
testo 872
-
The testo 872 thermal imager is ideally suited for professional industrial and building thermography - at the same time it ensures your work is both quick and easy. It is versatile to use, for example in industrial and mechanical maintenance or for detecting structural defects. You can generate error-free and objectively comparable infrared images using its handy functions. The IFOV warner, testo -Assist and testo ScaleAssist mean you can avoid measurement errors and not only effortlessly achieve optimum setting of emissivity () and reflected temperature (RTC) for building thermography, but also of thermal image scale.
-
Product
Reticle Manufacturing
-
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
-
Product
In-Process Test OTDR
8000i
-
The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
-
Product
Package Leak Detectors
-
Packages should be absolutely leak tight. However, even with the utmost care in the process, faulty packaged products cannot be completely avoided. Defects in the sealing process or in the material can easily lead to leaks, sometimes microscopically small.
