Defect
other than specified, imperfection .
-
Product
MT Inspection Scope
Um
-
● Test 12 or 24 fiber MT Connectors● Find Endface defects fast● 800x Magnification●Numbered Dial Indicator to quickly identify which fiber you're onThe Um MT Inspection Scope accurately shows defects in your MT 12 or 24 fiber connectors. Quickly view each fiber to save time and money. Our unique Fiber Dial shows which fiber you are inspecting. No more getting lost!The Um MT is compatible with our Eagle Inspect Software. Create reports with images for your MT connectors.
-
Product
High Speed Cable Production Tester
GRL-V-DI20
-
GRL-V-DI20 provides a fast and easy way for anyone to test cables for manufacturing defects and signal integrity specification requirements. GRL-V-DI20 provides comprehensive test coverage in seconds at a fraction of the cost of similarly-capable bench test equipment.
-
Product
Thermal Shock Chambers
-
Weiss Technik Thermal Shock chambers are designed to give quick transitions between a HOT and COLD temperature zones. Available in vertical, horizontal and liquid models. Thermal stock chambers are used in all industries including Automotive, Electronics, Aerospace, and others to help find product defects in electronic components and product assemblies. Thermal shock is important with MIL -STD 883 test standard.
-
Product
Manufacturing Defects Analyzer
406A
-
The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
-
Product
Automated System for Visual Quality Control of Markings
Angara 2.0
-
The automated labeling quality control system is designed to identify and reject pharmaceutical labels that have defects in permanent printing (applied in a printing house) and variable printing (applied by an industrial printer as part of a labeling machine).
-
Product
Power Line Purpose Tester
LX-221A+
-
Shenzhen Lian Xin Technology Co., Ltd.
·Meet UL, VDE, CSA, SAA, T-MARK, KS. IRAM, CCC and other countries’ standards .·Used to test single – ends ,double –ends ,three-ends power supply cords.·Auto and continuous test in COND,Insulation Resistance ,Leakage Current, Line-to-line Hi-pot(inside HV), Leaking copper(outside HV), relative length,·Auto test the fine and detective goods, tested qualified ones can be be ejected by ejector pin and marked , automatic cutting defective products， and alarmed with voice prompt and light,·Provide with RS 232 interfaces, can communicate with PC, easy to upgrade,·Provide personalized customization according to different requirements.
-
Product
Cyber Security Assessment
-
In the Internet of Things, everyone and everything is at risk of becoming a victim of cyber attacks.Protection against cyberspace threats is particularly relevant and important for connected devices.Messages about defective devices and successful attacks, which can also be carried out with very simple means, are increasing.Third party verification can be helpful in building trust by confirming and demonstrating an adequate level of protection.
-
Product
Ceramics and Glass Inspection Systems
-
Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
-
Product
Pruning Saw Control
-
Creation of a system that allows measuring the geometry of the board in the stream, determining the width of the wane, clean surface, the presence of large defects. Calculate the "net" width of the board and give signals for the movement of the saws to obtain the maximum output of the edged board of the given (standard) dimensions.
-
Product
Defect Inspection System
NovusEdge
-
The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
-
Product
Eddy Current Test System
CIRCOGRAPH® Product Family
-
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
-
Product
Power Steering Tester in Storage Case
34650
-
Gives fast, accurate power steering analysis. Test for defects in power steering pumps, gears and lines. Large heavy duty gage reads from 0-2,000 PSI and 0-140 BAR. Use to rule out power steering problems before expensive suspension or steering linkage problem is attacked. Includes 13 adapters. Supplied with instructions in a durable, plastic molded storage case.
-
Product
Monitroing and Control
-
THANKS TO OUR ADVANCED DATA ANALYSIS FUNCTION AND EASY-TO-VIEW USER INTERFACE, YOU CAN IMPLEMENT SPC WITH VERY LITTLE EXTRA WORK. OUR MONITORING SOLUTION IS DESIGNED TO IMPROVE THE TRACKING THE DEFECT AND CAN BE EASILY CORRELATED WITH YOUR MANUFACTURING PARAMETERS FOR ROOT-CAUSE ANALYSIS.
-
Product
Optical Inspection Machine
3D AOI
-
3D AOI latest optical inspection machine 1. No part dead angle, 4-way projection, complete measurement 2. Part height measurement, accurate measurement of defects 3. Multi-piece inspection without additional program 4. DLP digital projection, program editable height measurement
-
Product
Precision Continuous Flow Metering + Dispense System
Graco Dispense Analyzer
-
A whole new level of precision for drivetrain gasketing. Detect air bubbles and defects you couldn't see before. Track critical measurements, including entrapped air. Quickly and easily find a defect's root cause. Avoid expensive problems by responding sooner. Save millions: Contain warranty claims and recalls. The Graco PCF and Analyzer combination: Your ultimate system for accurate, reliable dispensing. The new Graco Dispense Analyzer is a monitoring system capable of detecting the tiniest air bubble or error during adhesive dispensing. Paired with the Graco Precision Continuous Flow (PCF) system, the Analyzer monitors your dispense in real time, detecting immediately if conditions are off and may potentially compromise your final product. With the ability to respond immediately, you can avoid defects that lead to costly recalls. The Analyzer stores the signature of each dispense, giving you the ability to replay the data, even months or years after the actual dispense. Seeing the data replayed as if in real time, you can more easily pinpoint the root cause of the defect and contain a recall or warranty claim to only those products that were affected.
-
Product
In-Sight Vision System
D900
-
The In-Sight D900 is a smart camera powered by In-Sight ViDi software designed specifically to run deep learning applications. This embedded solution helps factory automation customers easily solve challenging industrial OCR, assembly verification, and random defect detection applications anywhere on the line that have gone uninspected because they are often too difficult to program with traditional, rule-based machine vision tools.
-
Product
Wafer & Die Inspection
-
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
-
Product
ClicManage
-
ClicManage is an easy to use and seamless test management solution that improves test productivity by managing requirements, releases, test plans, milestones and defects with reduced maintenance effort. It helps in building a strong foundation for your QA practice by providing visibility to better maneuver testing via one easy-to-use planning, delegating, tracking and reporting hub. Moreover, ClicManage can be interfaced with any third party defect tracking tools along with our proprietary ClicBug.
-
Product
Winding Resistance Tester
JYR20S/10S
-
DC winding resistance testing is regarded as another essential routine screening tool. It indicates problems such as loose, defective or incorrect connections, which cause enough transformer failures each year to be regarded as a failure category of its own.
-
Product
Electrical Testing & Repair Kit
520
-
Thexton Manufacturing Company, Inc.
This Electrical Testing & Circuit Repair Kit is designed to test and replace defective terminals.
-
Product
Cross Sections and Metallography
-
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
-
Product
VisualDetect LCD Voltage Detector / Interface Tester
VDL-01AB
-
Hachmann Innovative Elektronik
VisualDetect LCD is an easily operated voltage detector and interface-tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-tester warns against defect interfaces. Additionally the LC-display indicates the measured current [I/A] and frequency [f/Hz]. Thanks to the integrated configuration menu it can be adjusted to switchgears operated below nominal voltage on-site.
-
Product
High Voltage System
HV-2
-
International Electro-Magnetics, Inc.
*Tests Power Transformers for Continuity, Ratio and Phase. Applied and Induced Potential and No-load Losses.*14 Conductor Switching Matrix will test 7 individual windings, 13 taps of one common winding or some combination thereof. (10 Amp current limit)*The System Control is Windows/Visual Basic based. Menu screens allow full selection of test parameters and sequence. Low voltage tests can be performed first, allowing defective parts to be rejected without proceeding to time consuming induced Potential dwell routines. Test data labeling and data acquisition software can be easily added to the system.
-
Product
PocketDetect HR
PocketDetect HR
-
Hachmann Innovative Elektronik
With a PocketDetect HR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
-
Product
DC Magnetic Flux Leakage Testing
ROTOMAT / TRANSOMAT Product Family
-
Foerster Instruments, Incorporated
With the new generation ROTOMAT DA and TRANSOMAT DA flux leakage test systems FOERSTER is setting new standards in continuous quality assurance of ferromagnetic steel tubes. The test systems enable the reliable detection of natural and oblique defects, regardless of their angle or length, in addition to standardized longitudinal and transversal defects. The miniaturization of sensors together with highly integrated electronic components dramatically increases the number of channels. This makes a more precise and finer scan of the surface possible, giving a more complete set of information regarding detected defects. The newly introduced C-Scan visualizes these defects in high-definition and real-time, resulting in a completely new evaluation of the tubes to meet rising quality requirements.
-
Product
Static Analysis Tool
CodeSonar
-
Automated static analysis designed for zero-tolerance defect environments. CodeSonar, GrammaTech''s flagship static analysis software, identifies programming bugs that can result in system crashes, memory corruption, leaks, data races, and security vulnerabilities. By analyzing both source code and binaries, CodeSonar empowers developers to eliminate the most costly and hard-to-find defects early in the application development lifecycle.
-
Product
Automated Visual Quality Control System for Lid Assembly
Angara-form
-
The automated visual inspection system is designed to identify and reject covers that have defects that have arisen during industrial production, as well as visible defects in the form of black dots or dirt on the surface of the cover.
-
Product
SlipFinder
YIS and SF Series
-
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
-
Product
NUV-PL SiC Defect Inspection System
VS6845E
-
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
-
Product
Pre-reflow AOI
Zenith LiTE
-
Minimizes Shadow Problems with 4way projectionEasy Programming with parametric approachReal time defect diagnosis and root cause removalrortified 2D features using 9 channel RGB lights100% 3D measurement inspection.
