Defect
other than specified, imperfection .
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Product
E-beam Metrology And Inspection
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Our HMI e-beam solutions help to locate and analyze individual chip defects amid millions of printed patterns.
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Product
Non-Destructive Testing (NDT)
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Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Product
PCI Fault Insertion Switch Cards
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Pickering's PCI Fault/Signal Insertion Switch Cards feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect all of which can simulate connectivity problems in the system.
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Product
Torque Tester
TorqueLab® LTT-Series
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The torque analyzer is designed for calibrating tools, joint testing, auditing and measuring torque. Torque tools go out of calibration with use. To maintain consistent accuracy, torque tools must be checked periodically for wear or defective parts. A power or hand torque tool is a measuring tool that must be properly calibrated and maintained.
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Product
Chip Inspection System
GEN3000T
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GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Product
Solder Paste Inspection
3D SPI
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Checking all the relevant points in the production process is essential, especially in terms of analyzing the causes of defects, fixing them, and – most importantly – preventing them in the future. That’s why solder paste printing is of fundamental importance for manufacturing complex assemblies: If paste printing isn’t performed correctly, the defect can impact the subsequent assembly and the soldering process, resulting in a tilted component or a poor or missing solder joint.
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Product
Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Product
Code Analysis
Kiuwan
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Identify code defects & vulnerabilitesto manage your remediation effortsBlazingly fast analysis in a collaborative and unlocalized environment.
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Product
DC Magnetic Flux Leakage Testing
ROTOMAT / TRANSOMAT Product Family
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Foerster Instruments, Incorporated
With the new generation ROTOMAT DA and TRANSOMAT DA flux leakage test systems FOERSTER is setting new standards in continuous quality assurance of ferromagnetic steel tubes. The test systems enable the reliable detection of natural and oblique defects, regardless of their angle or length, in addition to standardized longitudinal and transversal defects. The miniaturization of sensors together with highly integrated electronic components dramatically increases the number of channels. This makes a more precise and finer scan of the surface possible, giving a more complete set of information regarding detected defects. The newly introduced C-Scan visualizes these defects in high-definition and real-time, resulting in a completely new evaluation of the tubes to meet rising quality requirements.
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Product
3D Solder Paste Inspection Machine (3D-SPI)
3Si Series
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Saki's 3D SPI identifies critical defects and assists with process improvement.
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Product
Electrical Testing & Repair Kit
520
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Thexton Manufacturing Company, Inc.
This Electrical Testing & Circuit Repair Kit is designed to test and replace defective terminals.
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Product
Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Product
Reliability Testing
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ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Product
Manual Testing
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TestingXperts brings in a unique blend of testing processes, tools & technology expertise, and domain knowledge to ensure that the product is delivered without defects in accelerated time frame. TestingXperts provides end to end manual testing services for your functional testing needs with a foundation of matured test processes, in-house accelerators and experience of all industry-leading functional testing tools.
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Product
High Performance Programmable AC Power Supply
IT-M7700 Series
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ITECH newly-launched IT-M7700 High Performance Programmable AC Power Supply combines intelligence and flexibility, breaks through the huge defects of the traditional AC power source, reduces the size to only 1⁄2 1U, maximizes space utilization. Built-in power meter and arbitrary waveform generator make it convenient to simulate various arbitrary waveform outputs. IT-M7700 is designed with advanced technologies of programmable AC and DC power supplies, and can be widely used in multiple fields such as power energy products, home appliances, industrial electronics, avionics, military and IEC standards testing.
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Product
3D Sensor (Shiny Surfaces)
reflectCONTROL
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reflectCONTROL is designed specifically to meet the high quality requirements that ensure high quality for shiny surfaces. The system based on deflectometry projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.
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Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Product
Flying Probe Tester
FA1817
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Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Product
Plastic Analyzer
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The Plastic Analyzer method package includes an FTIR spectral library for plastics degraded by UV rays and heat. Utilizing searches of this library demonstrates its effectiveness in the analysis of unknown samples that are difficult to identify with standard libraries. Examples include plastics degraded by exposure to UV rays as well as contaminants and defective items altered by heating.
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Product
Fully Automatic No Load ( Routine) Testing Panel For Self Priming Motors
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Aarohi Embedded Systems Pvt. Ltd
Aarohi introduced fully automatic routine testing panel. The primary purpose of the routine test is to insure freedom from electrical and mechanical defects, and to demonstrate by means of key tests the similarity of the motor to a “standard” motor of the same design. this panel also help to enhance productivity, Work efficiency & reduces need for skill operator.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Halt Hass Chambers
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HALT and HASS chambers from WEIBER provide extreme temperature & vibration capabilities used during the product design and manufacturing cycles to compress the time normally required to identify design and process weaknesses. HALT techniques are important in uncovering many of the weak links inherent to the design and fabrication process of a new product. HASS techniques are incorporated during the production phase to find manufacturing process defects that could cause product failures in the field.
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Product
Semiconductor
DieMark
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DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.
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Product
Mini Visual Laser Source
TM536 Series
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TM536 Series Mini Visual Laser Source totally complies with the human engineering. It's small in size, easy to operate, portable and integrated with a launching indicator. A Visual Laser Source is usually used to inspect the damaged or broken point of a optical fiber, cable, patchcord and etc.If the inspected fiber does have a defect, user could find the visual laser at the broken or damaged point. TM536 Series Mini Visual Laser Source is suitable for both single mode and multimode fibers. The performance of the visual laser source will act a little different on different fiber coat and color.
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Product
Software
Interface Analysis
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Surface-mount components warp during the reflow process, and the area where they attach also changes shape during assembly. This interface between components is where solder, paste, and gaps created due to thermal expansion combine to create 100% good products, or defects such as Head-in-Pillow, Shorts, and Opens. Fully understanding that critical interface between surfaces is more important than ever.
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Product
Pruning Saw Control
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Creation of a system that allows measuring the geometry of the board in the stream, determining the width of the wane, clean surface, the presence of large defects. Calculate the "net" width of the board and give signals for the movement of the saws to obtain the maximum output of the edged board of the given (standard) dimensions.
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Product
Flux Leakage Tester For Detecting Surface Defects In Hot Rolled Black Steel Bar
130MM ROTOFLUX® AC
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Highly sensitive AC flux leakage is especially well suited to test hot rolled black steel bars and rods that have surface conditions which used to make finding shallow defects very difficult, if not impossible.
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Product
Leak Testing
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Leak testing is a non-destructive method to verify the presence of a leak in a component or device.It is implemented as a control methodology for monitoring production process and product quality control. Leak tests are used to find out possible leaks due to non-suitable material (porosity, blowholes, cracks), or in the machining process to find out machining errors or defective parts, and ultimately in assembly, to find out missing or defective gaskets, wrong positioning or assembly. The presence of a leakage could jeopardize the correct functioning of the component, device or its life span, and can also be potentially dangerous for the environment and the safety of its user.
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Product
Post-Mould Inspection Machine
IV-P1000
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The IV-P1000 is a post-mould inspection machine best known for being a fully automatic vision inspection station and for having a user-friendly GUI for operator and recipe setup. This machine is best used to inspect packages for surface defects on top and bottom.
