Defect
other than specified, imperfection .
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Product
PocketDetect HR
PocketDetect HR
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Hachmann Innovative Elektronik
With a PocketDetect HR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
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Product
Assembly Testers
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Systems that build products from components and then rigorously test them to ensure they function correctly, meet quality standards, and match specifications, preventing defects early in manufacturing through processes like electrical checks, functional tests, and physical inspections.
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Product
Lab Inspection & Testing Services
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Our lab services use advanced techniques to thoroughly inspect components for manufacturing flaws before assembly. We work with clients in the aerospace, automotive, oil & gas, manufacturing, wind energy, and various other industries to ensure their materials and components are free from defects that were introduced in forging or manufacturing processes.
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Product
Non-contact Ultrasonic Testing System
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Yamaha Fine Technologies Co., Ltd.
Contact-free inspection through ultrasonic transmission detecting air bubbles, separation, and foreign materials inside workpieces. With a Yamaha ultrasonic amplifier installed, contact-less inspection in the air is realized. Without damaging or wetting the workpiece, it is possible to inspect the workpiece for packing defects, air bubbles, and even flaw depth.
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Product
Voltage Detector / Phase Comparators
VisualPhase
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Hachmann Innovative Elektronik
With the VisualPhase line you get a type series of handy, exact and easily operated multi-functional devices with integrated voltage detectors, phase comparator and maintenance testers. Equipped with a thorough self test to ensure reliable function, a permanently enabled interface-tester to warn against defect interfaces and the connectability to HR, MR, LR, LRM or LRP string parts every VisualPhase delivers uncompromising safety.
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Product
Data Warehouse and ETL Testing Services
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Our principal goal is to catch defects (e.g., database design, source data, ETL process, data quality) early, to help reduce your costs and lower your risks.
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Product
Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Product
3D CT AXI
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PCB manufacturers can enjoy comprehensive, high-speed inspection with Omron’s revolutionary technology that reliably captures defects in hidden areas.
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Product
Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Product
Automatic Battery Testers
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T100BT is an innovative, modular battery testing equipment able to combine, on a single test platform, all the tests required to detect any possible defect on battery cells and modules: from defective cell wiring, to geometrical or surface irregularities, to out-of-specs performances.The battery tester is designed for the high-volume production test of battery modules composed by prismatic, cylindrical, or pouch cells, as well in a Lab/NPI version for engineering, prototypes and low-volume battery testing. The complete configurability allows you to equip the tester with the modules and tools you need to test your products, reaching the desired throughput.
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Product
Axis Play Tester
LMS 20.0 | VP 425017
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Maschinenbau Haldenwang GmbH & Co. KG.
The LMS 20.0 axis play tester is used to reliably determine defects and wear on steering parts, wheel bearings, suspension and suspension by means of counter-rotating transverse and longitudinal movement of the test plates. The built-in hydraulic drive ensures a powerful and even movement of the test plates. An automatic mode and other different operating modes make the LMS 20.0 easy to use.
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Product
Superior Handheld Partial Discharge Detector
PDStar
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Power Monitoring and Diagnostic Technology Ltd.
PMDT is proud to present one of our latest innovations, the PDStar. It integrates On-Line Partial Discharge (OLPD) testing and Infrared testing for MV and HV equipment, which combines UHF, AE, Ultrasonic, HFCT, TEV, and Infrared testing technologies. It is applicable for online PD testing, as well as abnormal heating and defect detection on all types of substation equipment. PD amplitude, PRPD, PRPS, and infrared spectrums provide critical data for determining the operational condition of electric power equipment. It connects to the PMDTCloud via Wi-Fi/3G/4G to upload test data, download test tasks, and receive diagnostic results in real time. Another uniquely advanced feature of the PDStar is that it integrates with a 100 MSPS (Mega-Samples per Second) HFCT signal processor, which greatly improves the performance for power cable OLPD testing.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
Dual Filament Source
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Get the optimal thermal profile for different materials and situations with the Veeco Dual Filament Source. This source is designed for growing high-quality Ga- and In-containing materials, while preventing charge material recondensation and significantly reducing defects. Dual Filament Sources are available for use with both SUMO and conventional crucibles (including Group III production crucibles).
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Product
Backplane Profiling & Inspection System
603d
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A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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Product
Software to Order
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Our company develops turnkey technical vision systems, including writing software for specific tasks of the Customer, such as:- image capture- algorithms for localization and detection of objects- recognitionalgorithms - inspection algorithms, defect detection- logging and archiving- interface operator- programming FPGAs and controllersand much more
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Product
WireChop
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A cost-effective, proven defect chopper system that works with both bench presses and automatic machines
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Product
1μΩ-4kΩ AC Milliohmmeter Low Resistance Tester
TH2521
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Shenzhen Chuangxin Instruments Co., Ltd.
TH2521 AC Milliohmmeter is a high-performance and intelligent tester widely used to test contact resistance, internal resistance and battery voltage. The application of constant current source with 1kHz frequency can greatly eliminate the potential error caused by thermoelectricity on DUT. This meter has the function to automatically detect contact failures on test cable. At the range of 30mΩ, basic R resolution can reach 1μΩ. It is applicable for transformer, inductance coil copper resistance, relay contact resistance, switch, connector contact resistance, wire resistance, PCB line and via reistance dan metal defect detection, etc. In the mean time, signals, such as HIGH, LOW, PASS, can be output through HANDLER interface, thus it is very convenient to be used in automatic production line.
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Product
Wiring Analyzers for Cables, Wire Harnesses, Backplanes
CableEye M2Z, M3Z, M4
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With our cable testers and harness testers, find defective or miswired cables instantly before they damage equipment or waste valuable technician time. CableEye® all-in-one test and cable management systems have a unique, patented graphic wiring display to visually pinpoint problems when wiring errors are detected, and offer under a second pass/fail testing for production environments. Quickly locate intermittent connections and identify their position in the cable.
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Product
Torque Tester
TorqueLab® LTT-Series
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The torque analyzer is designed for calibrating tools, joint testing, auditing and measuring torque. Torque tools go out of calibration with use. To maintain consistent accuracy, torque tools must be checked periodically for wear or defective parts. A power or hand torque tool is a measuring tool that must be properly calibrated and maintained.
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Product
Software
Interface Analysis
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Surface-mount components warp during the reflow process, and the area where they attach also changes shape during assembly. This interface between components is where solder, paste, and gaps created due to thermal expansion combine to create 100% good products, or defects such as Head-in-Pillow, Shorts, and Opens. Fully understanding that critical interface between surfaces is more important than ever.
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Product
Inspection System for Die Casting
X-eye 7000BS
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Appropriate for medium•large size component inspection and detecting surface structure and defects(inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's reduced significantly and enables long-term use with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
Radiographic Inspection Test
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The radiographic inspection is a non-destructive x-ray method for detecting internal physical defects in small component parts which are not otherwise visible. Radiographic techniques are intended to reveal such flaws as improper positioning of elements, voids in encapsulating or potting compounds, inhomogeneities in materials, presence of foreign materials, broken elements, etc.
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Product
3D Sensors (Main Screen)
surfaceCONTROL
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surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
Highly Accelerated Life Testing (HALT)
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Quickly validate reliability and identify manufacturing defects that could cause product failures in the field with MET’s Highly Accelerated Life Test (HALT)HALT technique uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages, which improves product reliability and customer confidence inherent to the design and fabrication process of a new product as well as during the production phase to find manufacturing defects that could cause product failures in the field.
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Product
Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
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Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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Product
SDT Checker Range
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With a focused solution for every problem, the Checker range makes ultrasound available to everyone. Choose the right tool for the right job and perform fast troubleshooting inspections. As a first defense against breakdown, Checkers identify defects quick and early, allowing for deeper analysis and trending with an SDT200, SDT270 or SDT340.
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Product
Automated Excise Stamp Control System
Kama
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The automated control (verification) system of excise stamps allows for blotting accounting of alcohol, dairy and other products (inspection of the readability of DataMatrix, PDF, QR, Barcode and other barcodes of excise or federal stamps) at a speed of up to 20 pcs / s. This visual inspection allows you to quickly identify defects in DM and PDF printing. The recognition system also analyzes gaps and doubles in a sequence of codes. The system has its own mechanism for rewinding a roll with a volume of up to 5000 marks. All types of stamps (old and new, large and small) are supported. Wide range of options for configuring scanning parameters and automatic generation of reports for the EGAIS department. Possibility of manual scanning (by hand scanner).
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Product
Automatic and Accurate Inspecting Systems
Circuit AOI
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The Circuit AOI system is designed to perform automatic and accurate inspecting systems. It integrates rigid mechanical system with advanced vision technology and manufactured and tested by strict is standards. It is suitable for circuit inspection for PCB/FPC, verification and repair. Innovation and unique inspection algorithms are applied to inspect open, short, protrusion, nick, scratch, pin hole, island, line width/space violation, object missing and others defects. AOI system can use offline setup project and check results. It will improve the throughput.Compare to halogen lighting, the full angle LED lighting of Circuit AOI can obtain the best image contrast and is good for different panel type inspection.
