Reflection
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Product
Transmission / Reflection Measurement
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Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Product
Micro-spot DUV Reflection and Transmission Spectrophotometry
FilmTek 3000 PAR
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Scientific Computing International
Metrology system with a 50µm spot that delivers high-performance transmission and reflection measurement of patterned films deposited on transparent substrates. Ideally suited for measuring the thickness and optical constants of very thin absorbing films.
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Product
Integrating Spheres For Reflection, Transmission And Absorption
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Integrating spheres and accessories optimized for the measurement of reflection, transmission, absorption and photoluminescence.
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Product
Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
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Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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Product
Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Product
Directional Couplers & Bridges
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A complete line of coaxial single and dual port directional couplers, and bridges for isolating, separating, and combining RF and microwave signals in such applications as power monitoring, source leveling, swept transmission and reflection measurements.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
Hybrid Diffuse Reflectance Spectrometer
Mono602™
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Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
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Product
Variable Attenuator
VAXE
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The VAXE Variable Attenuators are waveguide components for tunable signal leveling or reflection compensation in waveguide networks. The Attenuators consist of waveguide section with a resistive film evaporated on the mica surface. The Attenuators has 0 ÷30 dB minimum attenuation range. The VAXE Attenuators are available in four waveguide bands between 33 GHz and 170 GHz.
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Product
Reflective Memory Analyzer
PEAZ-5565
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Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Product
Water Quality Test Kits
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The range of model shapes, sizes and capabilities of water quality test kits reflects the diversity of potential end users, who could just as easily work for a small laboratory as for a giant water treatment plant. The simplest water test kits are pocket-sized and measure only one water-quality parameter, such as pH or conductivity. A step above these water test kits are test kits able to measure multiple parameters, including total dissolved solids and dissolved oxygen. A bit higher up the price-performance curve are industrial-quality handheld water test kits that measure one or multiple parameters, and may even log the readings to enable trend analysis.
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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
Sparse Nodal Solution
MicrOBS
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MicrOBSNT is an ocean bottom node solution for seismic refraction and reflection surveys.
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Product
Gloss Meters
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Gloss meters are used devices designed for measuring the specular reflection gloss of a surface. The gloss is determined by the measuring of the amount of reflected light at an equal, but opposite angle from the light beam. The quantity of light is determined by shining light from a defined angle at a surface and then measuring the light opposite the source of light at the same angle. The measurement is then compared to a standard. The most common angle for measurement is 60°.
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Product
Mobile Watt Meter
PM2000AM
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The PM2000AM Mobile measures and displays forward power, reflected power, and SWR simultaneously on it's dual movement meter system in the frequency range. Accuracy of the readings is assured because the PM2000AM features a true shielded directional coupler, that on the mobile version is offered as an external unit. The backlit meter can display either peak or average power readings, and has 300 and 3000 watt range settings.
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Product
BNC To BNC Cable, 50 Ohm, 0.9 M
781887-01
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Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
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Product
Power Supplies
CUL-850B
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The CUL-series is a semi-modular power supply that lets you select the cables you need while powering your gaming system with a 140mm Blue LED cooling fan and 6 pin PCI-E ready. **850W & 950W is offering 140mm Blue LED cooling fan & Dual 6+2 PCI-E ready. Everyone likes a clean and easy installation. This power supply allows you to keep what you want and remove what you don't. While necessary connectors, like the 20+4 pin power & 4+4 pin CPU connector are attached to the unit, you decide which of the others should stay. Customize your power supply to reflect your system.
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Product
Diffuse Reflectance Sphere
DRS100
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Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Product
Integrating Spheres
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Integrating spheres are used especially for measuring divergent light sources such as LEDs. The light is introduced through the input port, then reflected many times by the highly reflective interior of the sphere until it illuminates the inner surface uniformly. A detector samples a small fraction of this light to measure the total power input. Ophir integrating spheres have a highly reflective diffuse white coating for measurements independent of beam size, position and divergence. There are several sphere sizes, apertures and wavelength regions available. The large IS6 series has 2 configurations for measuring divergent or parallel beams.
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 6 dB
346A
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The Keysight 346A noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The very small change in reflection coefficient (<0.01) from ON to OFF is designed especially for accurate characterization of input-impedance-sensitive devices (like GaAsFETs and many UHF amplifiers).
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Product
1310/1550 nm Dual Laser Source Back Reflectiom/Power Meter
GM8019 + GM83001E
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The UC INSTRUMENTS GM8019 + GM83001E 1310/1550 nm dual laser source back reflection meter and power meter is a compact, direct display instrument for the convinent measurement of backreflection, insertion loss and power connector, fiber optic components, and system. With a single output port, the meter is very easy to use and ideal for fiber cable jumper manufacturers.
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Product
PXIe-2542, 6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module
780587-42
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PXIe, 6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module - The PXIe‑2542 is a terminated switch module suited for routing RF signals for production test applications. It features high-performance solid-state relays that offer unique benefits such as unlimited mechanical lifetime and fast switching time. Front-mounted SMA connectors provide easy connection to your RF devices, and the module features termination on every COM line and channel. The channel termination and COM lines help minimize reflections of the RF signal and protect your instruments.
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Product
High Voltage 50 Ω Pulse Generator
TLP-8010C
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High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components
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Product
Network OTDR
NFO series
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The NFO OTDR unit injects the laser pulse into the fiber under test and picks up scattered and reflected optical signals by an avalanche photodiode (APD). The unit accepts remote commands from Internet to control all related timing and data acquisition processes. Maximal three wavelengths are available at the NFO with options on 1310, 1490, 1550, and 1625 nm. NFO also has options on dynamic ranges so users can select the most cost effective units for their demands. Radiantech provides an easy use API (Application Program Interface) for NFO so users can design and build their own AP for NFO. Standard NFO API package is for Windows XP or higher. Please contact Radiantech’s sales person to inquire API for another OS.
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Product
Fusion Splicer
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Shaanxi Aitelong Technology Co., Ltd
Fusion splicing is the act of joining two optical fibers end-to-end. The goal is to fuse the two fibers together in such a way that light passing through the fibers is not scattered or reflected back by the splice, and so that the splice and the region surrounding it are almost as strong as the intact fiber.
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Product
Vantage PRO2 Davis
6152 & 6152C
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*Refresh Rate – A packet of data is sent from the outdoor transmitter to the receiver every 2 1/2 seconds! This means when you look out the window and see the wind blowing, the weather station will reflect it almost immediately.*Transmission Distance (wireless models) – The first in its consumer price range to use frequency hopping spread spectrum radio technology, the Vantage Pro2 can transmit and receive data up to 1000′ (300 m) line of sight. This is a much greater distance than most other weather stations. This technology also provides improved reception through multiple walls and greater immunity from RF interference.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Sensors
Chromatic Focus Probe
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Measurement of highly reflective, absorbent and transparent materialsMeasuring results are independent of the surface propertiesEspecially suitable for fast and precise measurements on reflective surfaces, lenses, prisms and other optical devicesFlexible probe configurations for highly customized applications
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Product
Glossmeter
480
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Quickly and accurately measure and record Gloss, % Reflectance & Haze measurements on a wide range of materials, including paint, plastic, ceramic or metal with the Elcometer 480 Glossmeter.
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Product
Solar Cell Characterisation
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The PVE300 permits the determination of device spectral responsivity (from which may be determined EQE), and, having performed measurements of sample reflectance (and transmittance where required) the determination of IQE.
