Reflection
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Product
Multi-Functional Optical Profiling system
7505-01
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Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Product
Xenon Illuminator
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Luzchem's Xenon Illuminator was recently developed for use with photovoltaic cells. It is also being used with Luzchem’s transient absorption laser flash photolysis and time-resolved diffuse reflectance systems. Customers can expect the Xenon Illuminator to be useful for a wide range of spectroscopy applications including photovoltaic testing, laser photolysis monitoring, UV exposure, and as a microscopy light source.
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Product
Precision Laser Distance Meter with Clinometer
TRUPULSE 200X
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Scope magnification 7-times*Field of view 100m/915m distance*LED Display*Range to non-reflecting targets 1.900m*Range to reflecting targets 2.500m*Accuracy in range ± 4cm (± 30cm to weak targets; shown in display)*Accuracy in slope ± 0,1°*RS 232/Serial interface and bluetooth (iOS compatible)*IP protection IP56
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Product
Adjustable Range Reflective Photoelectric Sensor
RX-LS200
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Panasonic Industrial Devices Sales Company of America
Panasonic's Die-cast Adjustable Range Reflective Photoelectric Sensor. The Sensor does not detect the background beyond the set point and the color or size of the object does not affect its sensing performance.
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Product
Photoelectric Detector
LG-930
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The LG-900 series detectors are reflection type optical (LG-916) and photoelectric detectors developed for medium distance detection applications. The LG-916 adopts glass fiber at the tip end and can be protective enough against the external turbulent light because of pulse modulation system as the light projection source. The LG-930 also uses a pulse-lighting method, it is practically unaffected by disturbance light, furthermore, featuring a hybrid structure with the all light-projecting, light-receiving, amplifying, and waveform-shaping sections built into the unit to offer a compact design with easy-to-operate functions. By simply attaching the reflection mark to a rotating object, the detectors can detect the rotation of the object without actually touching the object.
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Product
Electronic Line Stretchers
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Simplify VCO measurements with controlled phase shifts from 180 to 1300 MHzOver 360° phase shift of the reflected signalNormalized and stable magnitude of the reflected signalVoltage controlled for automated applications
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Product
X-Ray Components
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Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
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Product
photon3D
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Innovative 3D cameras from Photonfocus offer completely new possibilities for future-oriented laser triangulation applications. The photon3D platform is optimized for high frame rates and high sensitivity and offers robust algorithms for determining the laser line in the FPGA of the camera. Photonfocus has optimized these algorithms in order to suppress artifacts such as reflections.
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Product
Auto Spectroscopic Ellipsometer
PH-ASE
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The PH-ASE spectroscopic ellipsometer measures thickness, refractive index and extinction coefficient of single films and multilayer stacks. Reflection measurements at different incident angles and transmission measurements can be carried out and combined with ellipsometric data.
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Product
Automatic Upset Testing Machine
YQA Series
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Jinan Testing Equipment IE Corporation
This kind of machine is designed according to the International standards EN 10263-1:2001 “Metallic materials upset test methods”, especially for the quality inspection of high-speed rods and wires. Through simulating the quick press conditions of the metallic materials during the upset and pressing, the machine truthfully reflects the instances of the quickly compressed rods and wires. This kind of machine is widely used in the steel industry, standard samples manufacturing industry, and tools manufacturing industry, for the inspection of the metallic materials upset tests. Under the room temperature or the hot conditions, exert test force on the direction of specimen axial line, quickly compress the specimen, and then inspect the metal ability of bearing upset deformation in the specified upset ratio. It also can show the metal surface disfigurements.
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Product
Instrumentation Tutor
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Unitech Scales And Measurements Pvt. Ltd
This comprises of temperature and speed using different methods. RTD, thermistor and thermocouple are used as sensors with digital temperature indicator to measure temperature. A small water kettle is supplied as a temperature source upto 100°C. Glass bead thermometer is used as standard temperature measurement source to conduct the experiment. Magnetic and photo reflective sensors are used to measure speed. A FHP motor with speed regulator is used as speed source. To the shaft 60 teeth tone wheels are fixed to generate pulses.
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Product
Power Supplies
CUL-750B
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The CUL-series is a semi-modular power supply that lets you select the cables you need while powering your gaming system with a 140mm Blue LED cooling fan and 6 pin PCI-E ready. **850W & 950W is offering 140mm Blue LED cooling fan & Dual 6+2 PCI-E ready. Everyone likes a clean and easy installation. This power supply allows you to keep what you want and remove what you don't. While necessary connectors, like the 20+4 pin power & 4+4 pin CPU connector are attached to the unit, you decide which of the others should stay. Customize your power supply to reflect your system.
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Product
10 MHz to 55 GHz Noise Sources
CNS346 Series
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The Spanawave CNS346 Series is designed for precision noise figure measurement applications. The superior VSWR characteristics reduce multiple reflections of the test signals and significantly increase the measurement accuracy of most noise figure set-ups. The CNS346 Series noise sources have broadband coverage and extremely good temperature and voltage stability, for the finest noise figure meter-compatible laboratory standards. Outputs of 6, 15.5 and 22 dB ENR are available, allowing the units to accurately measure noise figures up to 20 ,30 and 36 dB respectively.
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Product
Single Fiber Aligner
1100
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The 1100 Single Fiber Aligner uses patented fiber alignment concepts to produce virtually instantaneous temporary couplings for OTDR, dispersion, or any other optical fiber or component test that requires a fiber-to-fiber connection. It delivers low loss, low reflectance couplings on the first try virtually every time, without the need for test instrument feedback. As a result, temporary coupling times are minimized and manufacturing costs are reduced without compromising product quality.
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Product
Reflective Memory PCIE card
PCIE-5565PIORC
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The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
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Product
Network Analyzers
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A network analyzer is an instrument used to analyze the properties of electrical networks, especially those properties associated with the reflection and transmission of electrical signals known as scattering parameters (S-parameters). Network analyzers are used mostly at high frequencies; operating frequencies can range from 9 kHz to 110 GHz
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Product
2-MGEM Optical Anisotropy Factor Measurement System
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The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Product
Light-resistant Integrating Sphere
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The integrating sphere is used for total luminous flux measurement. It uniforms the light by spatially integrating the collected light of light source. The integrating sphere has highly reflective diffusing plates formed on the spheres internal surfaces. These plates repeatedly scatter light rays from the light source with in the sphere to all other points to deliver uniform brightness distribution so measuring a portion of that light gives the total luminous flux. These years, the usage of integrating sphere for total luminous flux evaluation of light source is increasing. The large size integrating sphere over 1.5M is required for measuring a high brightness light source and a long light source such as fluorescent light.
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Radiative Transfer Numerical Model
HydroLight
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The HydroLight radiative transfer numerical model computes radiance distributions and related quantities (irradiances, reflectances, diffuse attenuation functions, etc.) in any water body.
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Product
Haze Meter
DRKWGT-2S
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Shandong Drick Instruments Co., Ltd.
DRKWGT2S transmittance / haze analyzer is a computerized automatic measuring instrument which is designed based on the People's Republic of China national standard GB241080 "transparent plastic light transmittance and haze test methods" and the American Society for testing and materials standard ASTM D100361 (1997) Standard Test Method for Haze and Luminous Transmittance of Transparent Plastice." It could apply to all transparent, translucent parallel plane sampler (plastic plates, sheets, plastic film,sheet glass) of light transmittance, transmission haze and reflectivity test also applies to liquid samples (water, beverage, pharmaceutical, colored liquid, grease) turbidity measurements in defense research and production workers and peasants to have a wide range of applications.
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Product
Laser Distance Meters
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Sends a pulse of laser light to the target and measures the time it takes for the reflection to return
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Product
Metallographic Microscope
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Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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Product
PXI-2797, 40 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module
782357-01
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40 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module—The PXI‑2797 offers a high-density, terminated multiplexer with dual 6x1 multiplexer banks in the same module. The internal termination of the PXI‑2797 helps prevent high-power reflections that arise from open channels on the module. It is ideal for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules.
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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
Laser Ellipsometers
CER – SE 500adv
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* The SE 500adv combines ellipsometry and reflectometry, * Eliminates the ambiguity in layer thickness determination for transparent films, * Extends thickness measurement to 25000 nm. # Laser wavelength 632.8 nm# Spectral range of reflectivity from 450 nm to 920 nm wavelength# Spot size 80 ?m
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Product
SINE M-13-60 Sinusoidal Array
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The Sinusoidal Array SINE M-13-60 is designed to be used for evaluating systems that work in the reflective mode such as scanners, machine vision systems and cameras. It is imaged on Photo Paper in four different sizes getting larger from 1X – 8X. The ½X and 1X slides incorporate the same spatial frequencies. Spatial frequencies for the 2X, 4X and 8X versions are 1/2, 1/4 and 1/8 respectively.
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Product
Diffuse Reflectance Sphere
DRS100
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Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Product
Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Product
Top View Analyzer
TVA100
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Our Top View Analyzer – TVA100 is the only instrument in the world to use the top-view reflection method for measuring the contact angle of a liquid on a solid from above. The innovative measuring method is particularly suitable for measurements in depressions and on concave surfaces where drops cannot be analyzed using the conventional side view.
