Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Electronic Calibration Module, DC To 6.5 GHz, 2-Port
N7551A
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Reduce your calibration time by half with a smaller, lighter 2-port module that supports 3.5 mm or type-N 50 Ω connectors
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Product
Electron Spectrometers
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SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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3D Scanning Services
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The 3D scanning services provided by our 3D scanning facilities can capture 3D measurements from objects as small as a pin head or as large as a nuclear power generation facility. When we remove the constraints imposed by conventional measurement technologies, the scope of applications becomes virtually limitless with 3D digital data in hand.
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Product
Electronic Cards
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Our product range includes a wide range of PDBC Relay Card, Local Remote Selector Card, Monitor Card and Fuse Failure Relay Card.
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Product
Integrated AI-ADAS ECU And Cameras For Large Commercial Vehicle
ADM-TJ30
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The integrated AI-ADAS ECU is connected to 8 cameras and powered by the vision-AI algorithm. It can detect and classify different kinds of vehicles/ pedestrians/ two-wheeler riders/ lane marking and other objects to perform multiple ADAS functions.
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Scanning Systems
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Electro-Optical Products Corp.
We combine deep proprietary technology expertise and competencies in photonics, with a proven ability to solve complex technical challenges to manufacture various optical scanning systems and sub-systems tailored to our customers' demanding applications.
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STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
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Product
3D Multibeam Scanning Sonar
ProScan™
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Teledyne BlueView's 3D Multibeam Scanning Sonar user interface software. ProScan connects to the sonar and pan/tilt unit, configures each scan, generates full 3D point clouds, and optionally streams output to third party hydrographic software for fusion with other sensors. Data is recorded in multiple file formats: .son (raw acoustic data file for ProScan reprocessing), .txt (plain text record of all point locations and positional data) and .xyzi (industry standard xyzi data for 3D point cloud viewers, registration software, etc.). In playback mode, users can review and reprocess scans to modify sound speed, intensity threshold, multidetect and range settings as needed. ProScan coupled with Teledyne PDS MotionScan, pitch, roll heading and position sensors provides the capability to scan areas to collect 3D point clouds while correcting for motion.
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Microscope Imaging Software
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Microscope imaging software from Leica Microsystems combines microscope, digital camera and accessories into one fully integrated solution.
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Product
Electronic Loads
T3EL Series
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The T3EL series is a family of single channel, 200 & 300 Watt Electronic Loads that are ideal for R&D, product validation and Q&A in a bench or automated environment for low to medium power applications starting from 60mA, such as electronic components, batteries, portable chargers and power products. Electronic Loads are typically used to provide a load to the outputs of a power supply, usually capable of dynamic loading, and are fully programmable. Electronic Loads help designers to test electronic power products and ensure quality, reliability, and performance.
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Product
Electronic Loads
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high performance electronic load is the successor to the highly respected PLZ-4W series, whilst still retaining the same high specification and build quality. Advances include a high visibility color display, low voltage operation from a minimum of 1 V to a maximum of 150 V. Programmable profiles of voltage/current can be applied (using the new ARB function, as used in LED/solar testing) in addition to the inherited 6 modes of operation: Constant Current, Constant Resistance, Constant Voltage, Constant Power, Constant Current + Constant Voltage, Constant Resistance + Constant Voltage.
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Product
Radar Input and Scan Conversion
Cougar
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Curtiss-Wright Defense Solutions
Cougar is an open standards-based high performance solution for capturing, converting and mixing radar video. Cougar is available as a VME card set or as part of a turnkey solution ready for deployment.
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Radiation Scanning Equipment
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The spectrometer is designed for radiation scanning of territories and objects. The functions of the spectrometer are measurement of the energy distribution of gamma radiation, measurement of the ambient dose equivalent rate of gamma radiation, search and identification of gamma-emitting radionuclides, detection of neutron radiation sources.
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Product
Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Product
Modular Infinity Microscope (MIM)
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Electronic Engineering
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By combining our core skills in electronic and electrical engineering we can design and support all aspects of test and measurement equipment.
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Product
Metallographic Microscope
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Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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Product
Industrial Electronic Endoscope
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Xiamen IDEA Electronic Technology Co., Ltd.
1.Railway Electronic Industrial Endoscope testing.2.Large screen color screen to restore the true image. 3.Industrial endoscope.
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Product
ELECTRONIC MEGOHMMETER
MI-5500e
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The MI-5500e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 5 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 10.000.000 MΩ
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Product
3D Video Microscope
BVM-20104
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The microscope is configured with 1.3M HD industrial camera. VGA image output interface, can be connected to the computer and monitor directly. clear and vivid image, taking photos, SD card storage, auto exposure. Camera is equipped with remote control panel, which makes the operation much easier. Optical lens keep parfocal under zoom, there is no deviation for center; 3D rotary observation
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Product
Electronic Crockmeter
TF411
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TESTEX Testing Equipment Systems Ltd.
Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. Electronic Crockmeter complies with ISO 105×12/D02, AATCC 8/165, BS 1006-D02, etc. Crockmeter is useful in crockmeter test and Crockmeter price is competitive.
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ELECTRONIC MEGOHMMETER
MI-2550e
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The MI-2550e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 2,5 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 5.000.000 MΩ with four test voltages: 0,5 kV - 1 kV - 1,5 kV - 2,5 kV.
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Product
Long Range Scanning
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Our contract measurement services include a variety of short-range (< 20 feet) and long-range (20 to 900 feet) high definition technologies, which use both contact and non-contact processes. With over a decade of experience in long range scanner technologies, we have the experience to determine the most affordable approach to your project and the expertise to do the job right. Our tools for long range scanner services include portable CMMs (PCMM) – both touch probes and laser trackers – and 3D laser mapping scanners.
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Electronic Potential Divider
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• Provides many ratios over a wide range • Small ratio and phase errors • Models operating at different voltages are available
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Electronic Tachometers
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1 1/4″, 2 1/4″ & 3 1/8″ Aircore Propeller tach for Rotax912/914 engines, connects to tach coil, calibrated to Propeller RPM, not Engine RPM! Custom color marking available, internal light optional! Hourmeter can be set to count engine time or flight time and preset to any numbers —(must be done at UMA facility)!—Standard setting 800rpm & above. White or Antique yellow dial with black numbers available, per request!
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Product
Soldering Inspection Video Microscope
MS-1000
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The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
