Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Automotive Electronic Stethoscope
77109
Helps to identify engine and chassis noise. Maintain all health and safety precautions whilst using on running engine. Helps to identify engine and chassis noise. Powered by a 9volt battery (not supplied). Complete with headphones and volume control. CE certificated.
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Electronic Multifunction Data Loggers
The DeltaTrak Electronic Data Logger is a portable, pocket sized electronic device powered by a 10-year lithium battery. It is designed for easy and reliable tracking of parameters such as temperature, relative humidity, electric current, pressure, process signals, and pulse signals. All data loggers have a built-in temperature sensor plus single or multiple external channels where different sensors can be attached for remote monitoring of a variety of parameters. The DeltaTrak Data Loggers interface with a PC and have an internal memory for up to 32,000 readings. Each data point is automatically time and date stamped as it is recorded. Sampling intervals are set by the operator via a user-friendly Windows program on the PC. Recorded data is downloaded and graphed or exported in ASCII format to a spreadsheet for numerical print outs.
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Universal Scanning Head
CF106
Calmet Smart Calibration Devices
Universal miniature scanning head for detecting (counting) impulses from inductive, LED and LCD energy meters. Additionally it enables counting of manually triggered impulses (Start/Stop push button function). Sometimes (when access is difficult) it is the only way to count pulses from inductive, LED and LCD meters.
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Microscope Platforms
Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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4-Sensor R-G-B (Prism) Color Line Scan Cameras
In addition to 3-sensor prism line scan cameras, JAI's Sweep+ Series includes a set of 4-sensor multispectral line scan cameras designed to simultaneously capture R-G-B image data in the visible light spectrum and image data in the near infrared (NIR) light spectrum.
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Electronic Brake Meter for Forklift Trucks
BrakeCheck FLT
The BrakeCheck FLT is our portable brake tester designed specifically for forklift trucks.The Bowmonk BrakeCheck FLT is a fully self-contained, user-friendly, portable brake tester, which has been developed with a leading forklift truck manufacturer to take account of the slow speed and tilt of forklift truck vehicles. The instrument records the braking efficiency and percentage of braking imbalance in a matter of minutes.
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Complex of Visualization and Image Recording for a Video Microscope
To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Laser Electronics
A device that emits light through a process of optical amplification based on the stimulated emission of electromagnetic radiation.
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Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
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Optical Coherence Tomography Imaging Line Scan Cameras
OctoPlus Range
Teledyne e2v spent 2 years developing a CMOS sensor specifically for OCT. This resulted in the launch of OctoPlus, which has a specially designed pixel architecture that improves sensitivity and reduces signal roll-off to improve image quality by several dB vs state-of-the-art CMOS cameras, especially in deep structures.
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High Power DC Electronic Load（1250V）
34300E Series（5KW~40KW）
34300E Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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Modular Pulse Processing Electronics
CAEN provides a complete and ever increasing set of instrumentation, from Preamplifiers to Data Acquisition to Triggering Electronics and Logic Functions. Most of the instrumentation is available in the most popular standard form factors and bus protocols, such as VME, NIM, CAMAC and Desktop.The Desktop is the stand alone form factor of the CAEN products. It provides the same performances of the other form factors and take the advantage of an easier and portable use, requiring no crates.
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Electron Diffraction System
Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Electronic Tachometers
1 1/4″, 2 1/4″ & 3 1/8″ Aircore Propeller tach for Rotax912/914 engines, connects to tach coil, calibrated to Propeller RPM, not Engine RPM! Custom color marking available, internal light optional! Hourmeter can be set to count engine time or flight time and preset to any numbers —(must be done at UMA facility)!—Standard setting 800rpm & above. White or Antique yellow dial with black numbers available, per request!
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Spectro UV-Vis Dual Beam PC Scanning Spectrophotometer
UVS-2800
Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
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Stroke-to-Raster Scan Conversion
SSC/924
The Model SSC/924 Stroke-to-Video Scan Converter converts stroke video from XYZ vector to a standard video format. Stroke video is generated by a variety of random deflection devices, including certain radar and sonar devices, spectrum analyzers, and Heads Up Display (HUD) generators. High Definition, Standard Definition, and VESA video output standards are provided. After conversion, the video can be recorded using standard video recording devices and viewed using low cost, off-the-shelf monitors.
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DC Electronic Loads
Keysight DC electronic loads provide you with the flexibility to test a wide range of applications from power-supply test to simulation of high-intensity discharge (HID) headlamps. The 16-bit voltage, current and power-measurement system provides both accuracy and convenience, and eliminates the need for a DMM, external shunts and wiring.
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Electronic System Design
ESD
Smart connected devices are everywhere, in homes, in transportation, and at work. This means electronic system design (ESD) is having a greater influence on almost every type of product requiring new simulation tools to help achieve electronic, electrical, mechanical, thermal, and connectivity goals. Altair’s simulation-driven design tools enable your team of specialized engineers to collaborate across all aspects of printed circuit board development from concept to manufacturing. Our products streamline your process, eliminate design iterations, and reduce time-to-market.
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Electron Probe Microanalyzer
EPMA-8050G
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Metallographic Microscope
Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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Electronic Kits & Modules
This kit contains everything you need to build, the microcontroller will be programmed with the latest firmware before shipping.
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VOC Emissions Testing for Electronic Equipment
Underwriters Laboratories Inc.
Product emissions testing on electronic equipment, including printers, consumer electronics, information and communications equipment, and appliances.
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Ultrasonic Thickness Gauge w/A & B Scan and Thru Coating Capability
UTG-4000
Utilizing color waveform A-scan and time based B-scan for absolute correctness, this new state of the art ultrasonic thickness gauge is packed with useful features allowing users to be confident of the displayed values on the most critical of applications. This multi-functional ultrasonic thickness gauge offers everything from basic measurement, Scan mode with Min/Max viewing, GO/NO GO display, Adjustable Sound Velocity and Thru-Coating Capabilities.
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Semiconductor / FPD Inspection Microscope
MX61L
Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Scanning Probe Microscopes
attoMICROSCOPY
The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Ultra-High Vacuum Ф4 Scanning Kelvin Probe
The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Advantage Xi Radar Scan Converter
Curtiss-Wright Defense Solutions
The Advantage Xi radar scan converter is a half-size PCI card. Radar video arrives into the card through the PCI bus, which allows the card to be used in a client-server configuration with radar distributed over a network, or in conjunction with a radar interface card such as the Virgo PCI and Osiris PCI.
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Electron Beam Lithography System
Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
