Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Thermal Microscope Stage
TS-4MP
With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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acA4096-11gc, Color GigE Vision, 9 MP, 11 FPS Area Scan Camera
787061-01
The acA4096-11gc is a Color Basler Ace GigE Vision Camera with a 9 MP resolution and a maximum image acquisition speed of 11 frames per second. The acA4096-11gc uses a IMX267 sensor and is quality tested and calibrated for high performance and reliability. This camera can be used with NI hardware and software to build machine vision systems.
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Scanning Probe Workstations
BioLogic has over 25 years of experience producing scanning probe electrochemistry instruments. Initially this included a number of single technique instruments, with the first modular scanning electrochemical workstation, the M370, introduced in 2006, under the Uniscan name.Scanning probe electrochemistry has found use in academic and commercial research settings. It is applicable in any field in which bulk electrochemical measurements have been used. Scanning probe electrochemistry has found widespread use in: Corrosion and coatings, Biology, including biosensors and biotechnology, Batteries, fuel cells and photovoltaics, Materials, Catalysis
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AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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Fluorescence Microscopes
PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Precision Electronic Test Leads
34133A
The Keysight 34133A precision electronic test leads are designed specifically for working with small components and dense circuit boards. Each kit includes two test leads (one red and one black).
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Programmable Single Channel DC Electronic Load, 150V/30A/300W
T3EL150303P
Programmable Single Channel DC Electronic Load, 150V/30A/300W.
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DC Electronic Load
EE15140A
The EE15140A DC Electronic Load / Works @ 0.0 Volts Input & real time I/O control attach the electronic load block to a heat- sink and your up and running. used them with D to A's, A to D's, Pots, PLC's to control the current. These Electronic Loads can be used for both Discharge & Charging Batteries & Devices
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Electronic Warfare Development Platform
SDR430
Abaco Systems and AMERGINT Technologies have partnered to develop an Electronic Warfare Development Platform: SDR430. This development platform comprises the latest open architecture digital signal processing hardware from Abaco combined with the SOFTLINK™ modular communications architecture from AMERGINT Technologies.
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Electronic Resistance Store
MEMS2-4L
The mezzanine serves as an electronic store of resistance to direct current, the value of which is set by software, through two isolated channels.
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Optical Scanning Systems
that feature high scanning speed and accuracy. Our non-contact 3D scanners are ideal for 3D digitization of physical models, quality control and reverse engineering.
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EQE/Photon-Electron Conversion Testing
Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Wafer Cathodoluminescence Microscope
Säntis 300
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 26.5 GHz, 4-ports
N4433D
The Keysight N4433D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4433D is a precision 4-ports ECal module that supports selection of 3.5 mm connector and can be mixed up to 26.5 GHz. Select either female-female, male-male, or female-male connectors.
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Portable Microscope With XY Stage, X150 2mm Field Of View
*Veterinary Worm Egg Counting*Counting of algae and other samples*Easy positioning of the sample*Methodically scanning of slides and counting chambers*Works with standard microscope slides and counting chambers (25x75mm or 1”x2”) and with 32mm wide counting chambers*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Electronic Loads
AMETEK Programmable Power, Inc.
Electronic loads have found a variety of applications ranging from power converter testing to current modulation. A large range of power sources can be tested using an electronic load from converters, inverters and UPSs to electrochemical sources such as batteries and fuel cells.
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Electronic DC Load
DL Series
Industry’s Easiest-To-Use DC Load – Vitrek’s DL Series Electronic Loads are available in a multiple configurations to meet your unique application requirements. No other electronic DC load on the market today is easier to use. Equipped with a full color LCD touchscreen display, the unit can quickly be set up for your next test. In addition, the DL is equipped with a comprehensive self-test that ensures that all loading and measurement circuitry is functioning properly.
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Electronic Compact Pressure Switch (Pallect Pressure Switch)
PPE
mm.A compact trimmer setting type, three types of piping connections (R1/8, Φ6 plug, Φ6 one-touch fitting) and a dustproof/waterproof structure allow for flexible use.
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Quick Scanning Moisture Meter
L601-3
The rugged L601-3 is specifically designed for the demanding environment of the sawmill or wood products manufacturing plant where quick-scanning of lumber is a must. The L601-3''s "Wood-Friendly" electromagnetic waves penetrate beyond the surface into the wood to a depth of 1" and provides an instant averaged reading of the board''s moisture content in a 2.5" x 2.5" x1" scanning area.
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DC Electronic Load
DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more.
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Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
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Electronic Loads
T3EL Series
The T3EL series is a family of single channel, 200 & 300 Watt Electronic Loads that are ideal for R&D, product validation and Q&A in a bench or automated environment for low to medium power applications starting from 60mA, such as electronic components, batteries, portable chargers and power products. Electronic Loads are typically used to provide a load to the outputs of a power supply, usually capable of dynamic loading, and are fully programmable. Electronic Loads help designers to test electronic power products and ensure quality, reliability, and performance.
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Electronic Components Test
Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.
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Talon 6 GHz RF/IF Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTS 2620
- Search and capture system using Sentinel™ Intelligent Signal Scanner- Captures RF signals up to 6 GHz- Capture and scan bandwidths up to 40 MHz- 30 GHz/sec scan rate- Selectable threshold triggered or manual record modes- 16-bit A/D with 75 dB SNR & 87 dB SFDR- Built-in DDC with selectable decimation range from 2 to 65,536- Built-in DUC with selectable interpolation range from 2 to 65,536- 3U to 6U 19-inch rackmount server chassis with hot-swappable HDDs- Storage capabilities to 192 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- Optional RF upconversion- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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ELM Electronic Load Module
Circuit breakers are often overlooked during maintenance of electrical systems in aircraft, or often only verified for open and closed states. To test the true functional purpose of a circuit breaker it requires the application of current in excess of the rated trip value and then measure the time for the breaker to actually trip. This is the only way to verify that a circuit breaker will react as designed if an electrical failure occurs.
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Programmable DC Electronic Load
IT8500+ Series
IT8500+series (150W~3000W) single-channel programmable DC electronic loads are designed for middle & high-end applications. They can be offered as multiple solutions according to customer's design and testing requirements.
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400x Bench-Top Optical Fiber Microscope - FTM-400X
Shanghai Fibretool Technology Co.,Ltd.
With coaxial illumination optic magnify system, FTM-400X can easily find the slight defects and scratches on fiber endface. High resolution image sensor and 8"pure black and white digital TFT LCD can show the most real details of fiber endface.This is an integrated fiber endface inspector, it combines optical microscope and monitor in a body other than separate designs. It has clear images and long life time. it has series of adaptors for various kinds of connectors such as multi fiber connectors, optical components. It is an essential instrument for optical manufacturing.
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Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
