Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Electronic Inspection Systems
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Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
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Electronic Cards
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Our product range includes a wide range of PDBC Relay Card, Local Remote Selector Card, Monitor Card and Fuse Failure Relay Card.
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Stereo & Pocket Microscope
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A small microscope which is designed to be easily portable. In some cases, the microscope may literally fit in a pocket, while in other cases it may be more comfortably carried in a field bag or small carrying case.
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Development Test for Electric Motors with Power Electronics
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Test bench for electric machines and inverters in hybrid applications*Control of mechanical parameters*Verification of electrical properties*Checking the LL characteristics*Short circuit measurement*Recording the performance process*Noise measurement*Temperature measurement
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Raman Spectrometer - Confocal Raman Microscope
XploRA™ PLUS
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Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.
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Electronic DC Load, 500V, 16A, 400W
LDH400 Series
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Versatile solution for direct testing of dc power sources and PFCsConstant current, resistance, conductance and power modesWide voltage and current range, 10 to 500V and 0 to 16A400 watts continuous dissipation at 28°C (360W at 40°C)High resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminalsLoad inputs rated to CAT II (300V)Full bus control via USB, RS232 and LXI compliant LAN interfacesGPIB Option
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
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The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Electronic Warfare Development Platform
SDR430
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Abaco Systems and AMERGINT Technologies have partnered to develop an Electronic Warfare Development Platform: SDR430. This development platform comprises the latest open architecture digital signal processing hardware from Abaco combined with the SOFTLINK™ modular communications architecture from AMERGINT Technologies.
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Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Programmable LED DC Electronic Load
M98 Series
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M98 series DC electronic load, as a new generation product of Maynuo Electronic Co., Ltd, is designed for the LED driver application. A special circuit is desiged for the LED driver on the base of the M97XX sereies. Incorporating high-performance chips, the M98XX series delivers high speed and high accuracy with a resolution of 0.1 mV and 0.01 mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs). M98XX series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar celland fuel cell etc.test and measurement applications.
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Ion & Electron Detection
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Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Dynamically Controlled, High Voltage Digital I/O PXI Card With Pin Electronics
GX5055
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The GX5055 represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the GX5050, the GX5055 offers high performance pin electronics and an enhanced timing generator in a compact, 6U PXI form factor.
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Electronics For Signal Processing
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PCB Piezotronics manufactures a wide variety of electronics to power ICP®, PE (Charge Mode), MEMS, strain gage and other types of sensors. All of these products provide conditioning of sensor signals for transmission to data acquisition systems.
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150~300W DC Electronic Loads
JT631 Series
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Nanjing Jartul Electronic Co., Ltd
JT631 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT631 series load very suitable for testing power supply when produced in large quantity. Besides, JT631 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT631 series load satisfing most of R&D requirements. Moreover, JT631 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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Electronic Tensile Strength Tester Pull Force Test Chamber Applicable Industri
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Shenzhen Chuangxin Instruments Co., Ltd.
This machine can test various materials (both finished and semi-finished products ) of tensile strength ,compressive strength and elongation ,can do stripping ,tear strength ,flexural ,compression test and etc. It can connect up to the computer and display or printout the test times , test value , max. value , etc . Also it can make various report forms according to the requirements .
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Scanning Slit Beam Profiling
NanoScan
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Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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3D Scanning Services
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The 3D scanning services provided by our 3D scanning facilities can capture 3D measurements from objects as small as a pin head or as large as a nuclear power generation facility. When we remove the constraints imposed by conventional measurement technologies, the scope of applications becomes virtually limitless with 3D digital data in hand.
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High Current Electronic Load (600W-1200W)
ELCH600 & ELCH1200
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- Low lead resistance <5m Ohm for Fuel-cell- Battery Testing- VFD display- High resolution 0.1mA/1mV- Voltage range 0V to 500V- Working mode CV/CC/CW/CR- OV/OC/OP/OT protection- Communication: USB/RS232/GPIB
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Electronically Tunable Filters
ETF
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Radar. Communications. EW/SIGINT. Frequency agile channelization. Frequency agile noise rejection filter. Local oscillator tracking filter. Controlled bandwidth and center frequency noise source.
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Air Cooled Linear DC Electronic Load
ALx Series
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The ALx Series utilizes conventional linear MOSFET-based dissipative elements, allowing the series to achieve a very wide voltage-current operating range within the model’s maximum power rating. Using the same heat management innovations developed for Magna-Power’s high density programmable DC power supplies, the ALx Series’ conservative cooling ensures long product life in environments up to 50 °C ambient operating temperature.
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Electronic Kits & Modules
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This kit contains everything you need to build, the microcontroller will be programmed with the latest firmware before shipping.
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Electronic Units
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Electronic units for field installation and mounting rack installation control the actuators. They are fed with 115 or 230 V AC. A local control panel allows for easy basic settings.
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Electronic Ballast Tester
WT4000
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• Measure parameter: 1) Input: Vrms, Lrms, W, PF, Hz, Phasic angle, total harmonic and 0-39 component of harmonic. 2) Output: Lamp voltage, Lamp current, Filament current, Guided cathodic current, Lamp power, crest factor and oscillatory frequency, single high frequency analysis. • Startup: Startup lamp voltage, lamp current, filament current, guided cathodic current curve and parameter, preheating time; • Simultaneously display on 8 windows for input and output parameters, convenient for comparison and analysis; • Test preheat energy, filament preheat time. And the parameters changes from 0 to 5s of filament voltage, filament current and filament power; • Up to 1MHz lrms test content to every EB; • Analysis symmetry of high Frequency curve of lout; • 12-bit high-speed A/D, sampling rate up to 10MHz, can easily analyse signal curve of output; • Finish an input and output testing at the same time within 1 minute; • Portable, can test, display, print without computer. Test report include data and curve, comply with international standard; • Communication port for PC, run under Windows98 or Windows2000, English Version available.
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Electronic Drum Latency
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EDLM iPhone app was developed specifically for measuring latency in electronic drums. It connects to the input and output points of an e-drum system and provides automated and accurate latency measurements.
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Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Desktop Fluorescence Microscope
Nanoimager
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The complete package for super-resolution microscopy
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Control Electronics
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Data acquisition and control electronics for optical radiation sources and measurement systems including precision current and voltage supplies for LEDs and tungsten halogen lamps.
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Electronic Production Measuring & Testing Instruments
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Wuhan Fanke Transformer Manufacture Co., LTD
Electronic Production Measuring & Testing Instruments
