Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Ultrasonic Hardness Tester
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Sinowon Innovation Metrology Manufacture Ltd.
◆ Perfect Accuracy——±3% HV, ±1.5HR, ±3%HB.◆ Microscopic Indentation—— Only high-power microscope can observe the indentation.◆ Quick Measurement——Result in 2 seconds.◆ Large LCD Display——Directly display measurement result, times count, maximum, minimal, average and deviation.◆ Friendly Operation——Operate well after short training.◆ Promised Warranty——2-Year warranty for main unit (Excludes Probe).◆ Mass Storage——Save 1000 groups measurement data.◆ Simple Calibration——Save 20 groups calibration data for invoking, improve calibration efficiency.
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Nanomechanical Instruments For SEM/TEM
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As the world leader in nanomechanical testing systems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your microscope with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale. Video capture from the microscope enables real-time monitoring and direct correlation of mechanical data to microscope imaging. With solutions designed to fit many of the microscope brands in use, you are sure to find one that is ideally suited to your research.
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Precision Fiber Microtome
F214
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To produce fiber cross sections of microscopic examination, measurement and identification.
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Atomic Force Microscope
NX10
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Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
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SINE M-19 Sinusoidal Array
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The Sinusoidal Array SINE M-19 is a remarkable new test array that achieves 256 cycles per mm while maintaining a significant modulation. It is designed for testing high resolution optical systems such as microscopes. Because its maximum width is 7.5mm, the SINE M-19 is small enough to fit easily onto a standard microscope slide (the TM-G variation is mounted in glass).
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Piezo-Z Top Plate
PZMU-2000
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Applied Scientific Instrumentation
The PZMU-2000 is a precise piezo Z-axis stage that can be attached to the top of a microscope's existing XY stage or be used in stand-alone applications. On select models of microscopes, ASI can mount a PZMU-2000 to an OEM stage. We can procure a manual OEM stage for you if necessary.
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ACCUplace Macro Calibration Standard
AP-M Series
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With both X & Y axis metric scales, these dual axis targets are ideal for calibrating optical magnification in microscopes, linear distance, stage motion and squareness. In addition, with the larger area calibration scale, the calibration of low power optical systems over the longer distances can be easily carried out. The AP-M is offered on two standard materials; Glass (CG) and Opal (OP).
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Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Atomic Force Microscope
DriveAFM
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The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
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Metallurgical/Metallographic Testing
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A partial view of our Metallurgical examination areas, showing metallurgical microscopes with digital filar micrometers. These instruments, along with our cross-sectioning and polishing equipment, make the Optical Metallography facilities at Pacific Testing among the most extensive in the industry. In addition, these facilites are under the supervision of our Chief Metallurgist, with a Ph.D. in Metallurgy.
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Industrial Microscope for Materials Science & Industrial Applications
BX53M
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Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
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Cubes/Holders
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IDEX Health & Science stocks filter cubes used in fluorescence microscope platforms from the major microscope manufacturers, including Leica Microsystems, Nikon Instruments, Olympus Corp., and Zeiss Microscopy. Our super-resolution filter cubes set the new standard for laser-based microscopes and are optimized for mounting half-wave flatness, 1 mm thick super-resolution dichroic beam-splitters. Whether you order a custom or catalog filter set, complimentary filter mounting into the filter cube of your choice is performed by the certified staff.
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MPO Visual Cable Verifier Kit
KI-TK832
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Kingfisher's unique and innovate MPO Visual Cable Verifier Kit is a quick, versatile and inexpensive way to visually check MPO cable installations and patch leads for polarity and continuity, and overall end face condition. Just connect the source, and view the far end with the microscope to observe the repeating color pattern at the far end.
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Galvo-Resonant Scan Head and Controller
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Our LSK-GR08(/M) Galvo-Resonant Scanner contains one resonant scan mirror and one galvo scan mirror that deflect an incident laser beam in X and Y, respectively. Identical to the galvo-resonant scanner used in our Bergamo® II multiphoton microscopes and complete Cerna®-based confocal systems, the 8 kHz resonant frequency of the resonant scan mirror enables much higher-speed scans than a galvo-galvo system. In our Bergamo system, the scanner can achieve 30 fps at 512 x 512 pixels image resolution.
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Level AFM
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Is a flexible Atomic Force Microscope for scientists. It offers a wide range of modes, sophisticated spectroscopy options and the programming of user defined experiments. Besides standard options found in Anfatec's other AFMs, the level AFM allows to add Anfatec's full range of AFM options, such as KPFM, closed loop operation, automated sample motion, acoustic enclosure, humidity and temperature control ... Each instrument is adapted to the user's specific needs.
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Imaging Systems & Components
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Thorlabs offers a wide selection of laser scanning, widefield imaging, and OCT imaging systems, including multiphoton microscopes, confocal microscopes, electrophysiology rigs, swept-source OCT systems, and spectral-radar OCT systems.
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Widely Tunable Ultrafast Laser System For Multiphoton Imaging
InSight X3
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Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.
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Micro Vickers Hardness Tester
900-392
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The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
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Digitize, Quantify, Collaborate With Your Unique Automated Petrographic Microscope
ZEISS Axioscan 7 for Geology
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Digitize your thin sections with Axioscan 7 – the reliable, reproducible way to create high quality, digitized petrography data in transmitted and reflected light. Uniquely designed for petrographic analysis, the Axioscan 7 Geo combines unique motorized polarization acquisition modes with unprecedented speed and a rich software ecosystem for visualization, analysis, and collaboration.
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Compact Hyperspectral Cathodoluminescence
F-CLUE
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The F-CLUE is the optical fiber coupled solution offering a flexible interface for Cathodoluminescence Imaging and Spectroscopy analysis.Thanks to its rugged ultra-compact footprint and deported spectroscopy modules, it can be installed even on very busy microscopes and/or in harsh industrial environments or extreme conditions (clean room, mobile laboratories…).
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Material Identification Spectroscopy
ChipCHECK
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Gastops specializes in advanced fluid sensing and analysis systems specifically designed and developed for critical equipment condition monitoring applications. ChipCHECK offers the fastest way of making on-site equipment maintenance decisions. It is a field deployable analyzer designed for rapid on-site identification of equipment lube oil. This automated maintenance decision-support tool employs innovative laser spectroscopic technology, which enables on-site analysis of microscopic chip debris. ChipCHECK provides the maintainers with quick, reliable, and conclusive information, including the total number of particles, and the size, shape, and specific alloy classification for each individual particle on the sample.
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Accesories
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We optimize and supplement microscopes in coordination with the respective manufacturer to enable new setups and demanding inspection tasks.
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AFM & NSOM
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A new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation.
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Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Objective Lenses
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The objective lens is the most complex and the most important component in a microscope. The multi-element design of these lenses works to produce the real image, which is then seen through the ocular lens. With Olympus’ range of microscope objective lenses, we provide outstanding optical performance from visible light to near infrared.
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Optical Test And Measurement
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Any type of fiber optic interconnection requires its interfaces to be free of dust and scratches in order to reach the lowest transmission loss. Small, handheld and battery powered inspection tools are available from AMS Technologies for inspection of fiber optic connectors in the field as well as high resolution type microscopes suitable for use in a production environment for qualifying the endface preparation. Additional S/W tools can support the user in making a quick decision if a certain defect is acceptable or if the surface fault disqualifies it for further use. Small and lightweight test equipment for measurement of the transmitted power in an optical fiber is needed wherever technicians handle optical fibers. Our product portfolio comprises light sources for various wavelengths, power meters for the visible and infrared and integrated solutions for sources and meters as well as optical time domain reflectometers (OTDR) coupled with visible wavelength light sources for easy fault detection within a fiber optic link.
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Probe System for Life
PS4L
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The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Stereo Microscopes
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Sometimes called dissecting microscopes, stereo microscopes provide comfortable 3-dimensional viewing of a sample in which each optical path (eye) sees the sample from a slightly different angle. Stereo microscopes are used to observe and manipulate samples in disciplines such as research, assembly and manufacturing, gemology and jewelry making, sample preparation and, of course, dissection. ACCU-SCOPE stereo microscopes can be found across a wide range of industries and institutions including biology labs, universities, research institutions, government facilities, biopharmaceuticals, manufacturing facilities, and more. Stereo microscopes are also available on a variety of stands and with a variety of illumination sources, offering features that may be particularly suited for your application.
