-
Product
Microscopy
-
Aurora is an award-winning Airy Beam Light Sheet imaging system designed for researchers working in fields such as neuroscience, developmental biology, cancer biology, regenerative medicine and other bioscience disciplines, including Plant Sciences and Marine Biology. Compact, affordable and customisable, Aurora is available as a single and multiphoton light sheet fluorescence microscope for rapid, large 3D volumetric imaging, high resolution, multicolour, time-lapse imaging and live cell imaging. Aurora uses ground-breaking Airy Beam Light Sheet imaging techniques to achieve outstanding results in the field. It is currently in use by many leading organisations delivering results previously not possible.
-
Product
Microscopy
-
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
-
Product
Microscopy
-
Our microscopy systems business is focused on providing best-in-class performance within a modular architecture. We design and manufacture Andor products to integrate with our own and third-party software, and all leading microscopes, we also support high quality products from other manufacturers.
-
Product
Microscopy Software/Hardware
ZEISS Atlas 5
-
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
-
-
Product
Cryo-Correlative Microscopy Stage
CMS196
-
Linkham Scientific Instruments
Electron microscopy (EM) provides structural information at very high resolution. However, it can give only restricted insight into biological and chemical processes due to limitations in staining and sample preparation processes. Fluorescence microscopy on the other hand is a very sensitive method to detect biological, chemical and genetic processes and events inside living cells. Cryo-CLEM brings it all together: it is a new and emerging technique to combine the individual advantages from both Fluorescence and EM by imaging the same sample location with both techniques and superimposing the complementing information.
-
Product
Analytical Software for Microscopy
SPIP
-
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
-
Product
Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
-
HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
-
Product
Microscopy and Automation Solutions
-
Opto already offers automated multifluorescence microscopes for cell analysis, inverted autofocus microscopes for motion analysis of growth processes, and high- throughput fluorescence microscopes for DNA and RNA sequencing.
-
Product
Analytical Software for Microscopy
SPIP
-
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
-
Product
Neurosurgery Microscopy Solutions
-
Leica Microsystems offers a range of surgical microscope solutions to support neurosurgeons in the most complex microsurgery applications. Our cutting-edge neurosurgery microscopes provide optimal and reliable visualization, including built-in fluorescence filters and innovative GLOW 800 augmented reality fluorescence.
-
Product
Nanoscale Microscopy Standards
-
The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
-
Product
Scanning Electron Microscopy
SEM
-
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
-
Product
3D Optical Microscopy
-
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
-
Product
Single Molecule Microscopy
-
Nano-scale precision motion and stability are cornerstones of research grade microscopes for single molecule imaging. Mad City Labs has developed modular microscopes that ease integration of optical components and assist users with developing and adapting instrumentation for their own application requirements. Contact our single molecule microscopy application development team to discuss the right products for your application.
-
Product
Laser Raman Microscopy System
RAMANforce/RAMANtouch
-
Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
-
Product
Fluorescence Lifetime Imaging Microscopy (FLIM) Camera
Toggel
-
Lambert Instruments today announced the introduction of its next-generation fluorescence lifetime imaging camera: Toggel. This new camera makes fluorescence lifetime imaging microscopy (FLIM) and fluorescence resonance energy transfer (FRET) faster and easier with its excellent light sensitivity, sharp images and fast image acquisition. With Toggel, Lambert Instruments aims to minimize measurement duration, automate image acquisition and simplify data analysis. These factors are of great importance to many of its customers in cell biology, cancer research and high-throughput screening.
-
Product
X-ray Microscopy
Xradia Family
-
✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
-
Product
Fluorescence Microscopy Solutions
-
Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology.
-
Product
X-ray Microscopy
ZEISS Xradia Ultra
-
Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
-
Product
High-resolution, SWIR megapixel camera
Wildcat+ 1280 Series
-
The Wildcat+ 1280 series is based upon a state-of-the-art InGaAs photodiode array with 1280×1024 pixels and 5 μm pixel pitch. The camera offers superior, high-resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 1280 camera outputs full frame images at 120 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 1280 is suitable for semiconductor inspection, display inspection (mobile phone and TV), microscopy and laser beam analysis.Benefits & Features• Compact and industry-proven camera design• High-resolution SWIR imaging• Advanced on-board image processing performance• GenlCam compliant• Flexible optical mount and lens options
-
Product
X-Ray Photoelectron Spectrometer
AXIS Supra
-
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
-
Product
AFM (Atomic Force Microscope) Optical Platform
-
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
-
Product
Light Obscuration
FlowCam LO
-
Yokogawa Fluid Imaging Technologies, Inc.
Our new FlowCam LO instrument combines our patented flow imaging microscopy technology with an embedded light obscuration particle counter to provide you with the necessary data for USP regulations and validation with images.
-
Product
Industrial Microscope Systems
-
Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
-
Product
Desktop Fluorescence Microscope
Nanoimager
-
The complete package for super-resolution microscopy
-
Product
Software Options
-
Sonix offers powerful microscopy analysis software to enhance packaged semiconductor imaging, accelerate production and adapt systems based on the ECHO platform to customer-specific requirements.
-
Product
Infrared, Near Infrared and Raman Spectroscopy
-
rom the very compact FTIR spectrometer to the world’s highest resolution: Bruker offers the industry's largest selection for demanding routine and High End FTIR research application including the new and unique verTera cw THz functionality.Process monitoring with FTIR / FT-NIR process spectrometers.A complete line of Near Infrared Spectrometers to fit all your needs, including Process Monitoring.FTIR Microscopy and Raman Microscopy and Spectral Imaging for high sensitivity at high spatial resolution.High spectral resolution, high performance Raman and FT-Raman spectrometers for advanced routine solutions.FTIR Gas Analyzers for the fully automated and high precision real-time monitoring of gas compoundsImaging Remote Sensing systems for analysis of gases, liquids and solids.CryoSAS semiconductor material quality control for photovoltaic and electronics industry.OPUS, the "all-in-one" IR and Raman spectroscopy software consists of a suite of software packages that cover both standard and specialized applications.ONET, software for the setup, administration and control of large FT-NIR spectrometer networks.
-
Product
Scientific Cameras
-
Thorlabs' Scientific-Grade Cameras are specifically designed for microscopy and other demanding applications. The Zelux™ CMOS cameras have small footprints and provide cost-effective solutions for general-purpose imaging applications. Kiralux® cameras have CMOS sensors with high quantum efficiency in a compact housing and are offered in monochrome, color, NIR-enhanced, and polarization-sensitive versions. Our polarization-sensitive CMOS camera is ideal for materials inspection, flaw detection, and other advanced techniques using polarization. The Quantalux® monochrome sCMOS cameras are fast frame rate imagers that combine high dynamic range with extremely low read noise for low-light applications. They are available in either a passively cooled compact housing or a hermetically sealed TE-cooled housing. We also offer scientific CCD cameras with a variety of features, including versions optimized for operation at UV, visible, or NIR wavelengths; fast-frame-rate cameras; TE-cooled or non-cooled housings; and versions with the sensor face plate removed. An intuitive software package, API and SDK for developers, and third-party software support provide options for custom system control and image acquisition.
-
Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
-
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
