Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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AUTOMATIC WINDING TEST SYSTEM
VE9036SU
6 CHANNEL Microprocessor based Automatic Test System for Automobile Coils, Magnetos, Alternator, Motor Winding. Can Test : Impulse Winding Tester (IW), AC/DC HiPot, Insulation Resistance (IR), Inductance (L), DC Resistance (DCR)
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Battery and Capacitor Testers
Battery test system developed on the basis of the experience and know-how that we have amassed through implementing numerous custom-built battery evaluation systems.
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PXI 5W Programmable Resistor Module, 2-Channel, 1.5Ω to 925Ω
40-252-021
The 40-252-021 is a programmable resistor module with 2 channesl which can be set between 1.5Ω and 925Ω with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Mobile Test Systems
The systems include A+A+A+ LED solar simulators, high-resolution electroluminescence testers and various other tests that you can easily integrate into your transport of choice or directly into a container on site.
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Test System
RF-1 ATS
The RF-1 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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PCI Precision Resistor Card 18-Channel, 1Ω to 31.5Ω
50-297-010
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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PXI Digital Multimeters - DMM
All three PXI-DMMs deliver market-leading speed at their price points, measuring up to 15,000 readings/s with a maximum single-reading rate of 66 µs. These fast reading speeds translate into higher test system throughput and lower cost of test. Advanced triggering, enhanced functionality, and a full suite of free software simplify system integration and operation.
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Miniature Vibration Test System
G-2 Series
The G-2 Series Miniature Vibration Test System, though compact & handy, consists of a sweep oscillator, sine controller, power amplifier and vibration generator, thus suited to a variety of applications; calibration of sensors, standardized vibration tests for small parts, school teaching materials and modal analysis. The G-2002 is handy, with all the composed units being incorporated in a portable case.
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PXI High Density Precision Resistor Module, 6-Channel, 3.5Ω to 102kΩ
40-298-040
The 40-298-040 is a high density programmable resistor module with 6 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 239Ω
50-298-113
The 50-298-113 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 239Ω with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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C-Mic Auto Test System
BK9010B
Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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Continuous Time Interval Analyzers
GT668PXIe-40
GuideTech’s GT668PXIe-40 PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 50MHz time base with NIST traceable calibration. Some of the GT668PXIe-40 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.
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Optical Signal Conditioning Products
The single-mode fiber N7761A, N7762A and N7764A provide 1, 2 or 4 attenuation channels in a compact remote-controlled instrument. These attenuators provide very fast adjustment and have built-in output power monitoring for accurate power setting and control, as needed for receiver sensitivity testing or in system simulations.
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microLED Testing System
OmniPix-ML1000
The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Software Platform Bundle
The Software Platform Bundle provides the entire NI software portfolio for building any application. Develop applications in multiple environments, including LabVIEW Professional, LabWindows/CVI, and Measurement Studio. Extend the functionality of the LabVIEW development environment with all add-ons to perform code deployment, hardware integration, data analysis, and code validation. Build automated test systems with TestStand and real-time test systems with VeriStand.
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Optical Modulation Analyzer
Signaling has migrated from simple on-off keying to complex modulation formats such as DP-QPSK and PM-16QAM. Advanced test tools are required to test the latest communication systems for 100G, 400G, 1Tb/s and beyond. Tektronix is the only test and measurement vendor that can offer a complete coherent optical test system from signal generation, to modulation, acquisition, and analysis.
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Modular Test System
IMU-MGE
Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union. Each system can be individually configured and easily extended.
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PCIe Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Microwave/RF Cable Test Assemblies, 110 GHz
Gore offers a rugged, lightweight 110 GHz test assembly that optimizes the performance of test systems while reducing the total cost of test and ownership over time. Our assemblies provide reliable electrical performance with flexure and temperature in demanding environments.
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High Voltage Test System
CKT-1180
The CKT 1180 is a High-Voltage Test System with up to 3500 VDC and 2800 VAC RMS leakage test capabilities.Originally designed for High-Speed Rail, the CKT 1180’s focus is to test assemblies that require extremely high reliability and work at elevated voltages.
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Lighting Reliability
LED/OLED package lifetime is highly dependent on thermal management, and LED lamp performance can be dependent on the luminaire in which it is installed. Lighting reliability test system for LED/OLED Products are widely used for normal /accelerated aging, lumen maintenance measuring, lifetime evaluation and temperature characteristic testing for LED/OLED products including LED package, array, module, OLED module and luminaires.
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Automated Calibration
ORION
ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
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Portable Test System
MT786
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Relay Test System
Relay test products that combine a flexible hardware architecture with advanced test software. Relay tests can be constructed within minutes and displayed using a very simple interface, making the system ideal for low-cost production applications.
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Plug-in Test Systems
FAME is the innovative, modular plug-in test system for measuring and testing tasks in protection technology for medium-voltage and high-voltage switchgear. The plug-in test system combines complex switching operations for testing the function of current transformers and voltage transducers, as well as tripping and signal contacts.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 2Ω to 102kΩ
40-251-034
The 40-251-034 is a programmable resistor module with 4 channels which can be set between 2Ω and 102kΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
