Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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DC Power Supplies
XG 850
AMETEK Programmable Power, Inc.
The Sorensen XG Series is an 850 Watt, 1U half-rack DC power supply. The XG Series is the new standard for powerful, programmable DC power systems. Designed for test, production, laboratory, OEM and quality assurance applications, the XG Series provides a wealth of features to ensure accuracy and greater efficiency. It puts clean, reliable power at your disposal and delivers stable, variable output voltage and current for a broad range of development, test and system requirements.
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PCI Precision Resistor Card 6-Channel, 2.5Ω To 1.51MΩ
50-297-044
The 50-297 PCI Precision Resistor card provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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In-line High-Density ICT System Series 7i
E9988GL
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 122Ω
50-298-112
The 50-298-112 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 122Ω with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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RFID Test Instrument
RAIN Xplorer
The CISC RAIN Xplorer is a unique RFID test product developed for convenient tag frequency sensitivity, communication range, and backscatter measurements. The RFID tester is designed for open area tests and measurements in an RF-controlled environment using portable or fixed RF test chambers. The system is supplied with software and a reference tag for self-calibration.
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PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 1.51MΩ
50-298-150
The 50-298-150 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 1.51MΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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PXI 5W Programmable Resistor Module, 1-Channel, 2.5Ω to 102kΩ
40-252-040
The 40-252-040 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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High Temperature, Low Strain Capacitive Extensometers (1200 C or 1600 C)
Model 3648
Jinan Testing Equipment IE Corporation
These extensometers use a high temperature capacitive sensor in combination with an innovative design to achieve high accuracy strain measurements in low measuring ranges not possible with other high temperature extensometers. They mount on a slide bracket (included) that can attach to the load frame of your test system; optional load frame mounting brackets are available. The overall design reduces any influence from common lab environment vibrations.The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. These units are made to order in many different gauge lengths and measuring ranges.The extensometer comes with a signal conditioner. The output is an analog DC voltage, factory calibrated with the extensometer to 0 to ±10 VDC typically. They are readily interfaced with most existing test controllers, and may be directly connected to data acquisition systems and chart recorders. Bringing the signal into a spare DC input channel (or external input) on the test controller allows the extensometer to be used for strain controlled tests like low cycle fatigue.
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PXI Interface Cards
PXI is a modular instrument system designed to take advantage of fast data interfaces based on PCI and PCIe bus systems. Due to the large number of different PXI interface cards, the individual test system can be designed for almost all applications.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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LED Optical Aging Test Instrument
LEDLM-80PL
LEDLM-80PL LED Lumen Maintenance and Aging Life Test System is designed according to standards of IES-LM-80, IES-LM-82, TM-21 and GB2312-80, and the software is developed base on Arrhenius model. LED has the features of long life, but with the different working condition and drive current, its life will be different, but generally the life will be around 50K hours. Differ from the traditional lightsource, LED light will decay gradually rather than extinguish instantly, so in the standard of LM-80, it introduces L70, L50 and etc.
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FMET Systems
The Failure Mode and Effect Testing system allows the shorting of any I/O pin to any other I/O pin, including one of 4 common "Rails". Users can establish rules to prevent unwanted shorting conditions.
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Battery (EV) Automatic Test System
Landrex Technologies Co., Ltd.
Battery (EV) Automatic Test System
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PXI-2556, 2.5 GHz, 75 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-56
2.5 GHz, 75 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2556 is an RF signal multiplexer switch module. The multi-bank architecture of the NI PXI‑2556 makes it ideal for test systems that require parallel operations such as the stimulus/response testing of video RF devices such as tuners. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Real Car Transient Test System
RealCar Simulation Bench
This system is suitable for transient test of actual vehicle in combination with the real-time model calculation by the measurement/control panel and low inertial motor. By replacing the wheel of the actual vehicle with the tire type bearing, the axle shaft is taken out to the outside of the vehicle and connected to the low inertia motor. It can be reproduced the sliding motion which the chassis dynamometer cannot be realized. Also, since the longitudinal force is not occurred in the vehicle, the vehicle restraint can be simplified and the behavior such as shift shock can be reproduced on the bench.
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Basic 3U Rackmount Appliance for PCI Express® Gen5
R300-G5
Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 11.4MΩ
40-251-153
The 40-251-153 is a programmable resistor module with 1 channel which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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FET Solid State Switch, 300 kHz to 18 GHz, SPDT
U9397C
The Keysight U9397C solid state switch maximizes your frequency range from 300 kHz up to 18 GHz, offering excellent performance with high isolation, low SWR and fast switching speed. Applications include instrumentation, communications, radar, and many other test systems that require high speed RF and microwave SPDT switching.
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PCI High Density Pecision Resistor Card, 6-Channel, 4Ω To 1.51MΩ
50-298-050
The 50-298-050 is a high density programmable resistor card with 6 channels which can be set between 4Ω and 1.51MΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Rockwell Hardness Tester
Versitron® Series
Newage Testing Instruments, Inc.
The Versitron Rockwell hardness testing system is the industry workhorse of hardness testing - designed to meet the toughest challenges: clamp large parts, operate in poor environments, and test high volumes - all with less service problems and less operator skill requirements. Available with 2 different test stands types (in a range of sizes) and 2 test heads and also a wide range of other options.
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Standard IR Target Projectors
Santa Barbara Infrared’s 14000Zi Series reflective infrared target projectors are turnkey test systems for electro-optical (E-O) testing of FLIRs and other infrared (IR) imaging systems. The standard target projectors are assembled from SBIR’s STC Series Collimators, Infinity Blackbodies and 300 Series Target Wheels. SBIR also offers a standard athermal target projector with a 5.7° field of view (FOV).
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Optical Switch
FTBx-9150
With crosstalk of –80 dB and life expectancy of 10 million cycles, the FTBx-9150 Optical Switch is ideal for bidirectional component testing, ribbon fiber testing, multichannel monitoring, remote and multiple-component testing, signal routing and bypass switching. Housed in the LTB-8-based test systems, the FTBx-9150 provides highly accurate and repeatable fiber-to-fiber switching. It offers a choice of 1x2, 1x4, 1x8, 1x12, 1x16, 1x24, 1x32, 2x2 and 2x4 configurations. Designed for minimal reflectance, the switches integrate precision optical components into a compact modular package. Both singlemode and multimode versions are available and offer a solution for all your optical switching needs.
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PXI Precision Resistor Module 3-Channel, 2.5 to 102k
40-297-140
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Automation System for Emission Testing
STARS VETS
STARS VETS is a Vehicle Emission Test System application available with the STARS Automation platform for chassis, engine and powertrain dynamometers. The application provides test cycle execution, emissions equipment control, results calculation and reporting in compliance with the different legislative standards throughout the global regions. Its flexible design offers a wide range a customization, and it addresses the various requirements for R&D, COP and certification testing.
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Battery Cell Test System
PEC is the worldwide leader in cell, module and pack test equipment for advanced batteries and energy storage systems. Our test equipment combines very high control and measurement accuracy with an excellent dynamic behavior. This results in very precise, near real time simulations of demanding applications in electro-mobility, renewable energy, aerospace and defense. PEC also supplies test systems for primary batteries and consumer applications.
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EV Battery Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
5V cell equipment adopts Sinexcel innovative circuit design + high-speed DSP complex algorithm, the detection process supports multi-gear switching; The equipment integrates voltage, temperature, pressure and other auxiliary channels, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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PXI-Based Modules
PXI-based modules form the core of many measurement and automation systems. These modules are designed to integrate into design verification and high-volume production test systems. Combined with our demonstrated microwave and high-speed digital expertise, SCT’s PXI design capabilities make us well positioned to deliver innovative products to the wireless test market.
