Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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CombiVolt™ 1 Voltage/Continuity Tester
DL6780
Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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120 GHz Frequency Extender, Pulsed DC Bias
N5295AX52
The N5295AX52 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 120 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
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SIP-90-2 Test System Interface Probe
SIP-90-2
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Automatic Transformer Test System
TH2829AX
Changzhou Tonghui Electronic Co., Ltd.
*Number of Test PIN: 20*Frequency: 20Hz-200Hz, Resolution: 0.5mHz*Signal Level: 50mV-2Vms (Option 2nv-10Vms)*Test Speed: max 13ms
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PCI High Density Pecision Resistor Card, 4-Channel, 3Ω To 52.4kΩ
50-298-133
The 50-298-133 is a high density programmable resistor card with 4 channels which can be set between 3Ω and 52.4kΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Photoelectrochemical Test System
ModuLab XM
The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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Tire Rolling Resistance Test System
This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Multi-Spool Network Simulation & Latency Solutions
Fiber Lab 750
from M2 Optics provides the perfect combination of flexibility and efficiency when requiring spools of fiber for testing, latency, and system demonstration applications.
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Thermal Controlled Chucks & Plates
TOP Cool
Mechanical Devices newest innovation in thermal testing. Each TP system contains a thermal chuck or thermal plate and a self-contained thermal control unit.The TP chuck and platforms is a breakthrough product that introduced the use of refrigerant for active cooling & heating of wafers and other components with no need of chiller, CDA, or consumable and expensive refrigerants such as liquid nitrogen and liquid carbon dioxide. It can be a perfect replacement system in the industry for uncompromising thermal and mechanical performance with a temperature ranging from -60 to +220°C.
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PXIe-6545, 200 MHz, 32-Channel PXI Digital Waveform Instrument
780993-02
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Fault Injection and White-Box Testing
VectorCAST/Probe
VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
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PCI Precision Resistor Card 3-Channel, 3Ω To 22.3MΩ
50-297-154
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Bare Fiber Aligner
1120
The Photon Kinetics 1120 Bare Fiber Aligner makes it possible to reduce test setup time to seconds, thereby reducing overall testing cost. Just strip the fiber, scribe and break it (or use a more precise fiber cleaver, if desired) and then insert the prepared end into the 1120. In an instant, the fiber is coupled to your OTDR or chromatic dispersion test system with low optical loss and low reflectance. The 1120's compact, ergonomic industrial design is well-suited for low to moderate volume fiber and cable testing applications where automated fiber alignment systems are less economical. It is particularly useful as part of an in-process or finished cable test station employing either the 8000i or 8000 OTDR, and the OASYS.net OTDR Automation Software.
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Vibration Test System
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Vibration Test System is a simulation of the various environments encountered in the manufacturing, assembly, transportation and use phases of execution. It is primarily used to identify the ability of a product to withstand environmental vibrations.
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Multiple-Bus Architecture Cable/Harness Test System
CKT1175-MBA
The CKT1175-MBA (for multiple-bus architecture) will provide seamless testing of electronic racks, panels and chassis containing passive and active components such as relays, solenoids, switches, circuit breakers, lamps and LED's, diodes, resistors, capacitors, etc. This functionality is made possible by a switching matrix that is up to 10 levels deep, plus a multiplexer that controls the various stimuli sources, instrumentation connections, and external energization outputs.
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Rack - Rotatable Arm for Peripheral Devices
OTP2-Modul-Nr041
The module is for mounting on a rack, such as the midi or maxi rack. The extension of the module can create new possibilities for your test system.
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Analyzers
BA500 Series
The BA500 analyzers are high performance battery analyzers with charge and discharge capabilities. The analyzers connect to your computer via USB and the BA500WIN software program is used to control the analyzer and battery under test. This system has a fast data collection system allowing you to collect and view as much data as required. Once you collect this data you can graph, analyze & save it.
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PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 1.51MΩ
50-298-144
The 50-298-144 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 1.51MΩ with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Semiconductor Test
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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6.5 Digit PXI Digital Multimeters
M918xA Series
ompact digital multimeters (DMM) provide popular measurement functions such as DCV, ACV, DCI, ACI, 2- and 4-wire resistance, and more, with the accuracy and stability you would expect from a 6.5-digit PXI DMM. High performance in a small, rugged package gives you an ideal deployment platform for many automated test systems.
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PXI Hybrid Single SP6T Switch, DC To 26.5 GHz, Terminated
M9157C
M9157C operates from DC to 26.5 GHz, providing a low-cost operation switching solution for measurement and automation of Automatic Test Equipment (ATE) systems without compromise in the RF performance. It is being used in applications such as ATE, RF communication and RF parametric measurements where a rugged switching module is needed for signal routing. Typical switching applications for multiport coaxial switches include signal routing to a single input to multiple instruments and routing of multiple input signals.
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Standard IR Target Projectors
Santa Barbara Infrared’s 14000Zi Series reflective infrared target projectors are turnkey test systems for electro-optical (E-O) testing of FLIRs and other infrared (IR) imaging systems. The standard target projectors are assembled from SBIR’s STC Series Collimators, Infinity Blackbodies and 300 Series Target Wheels. SBIR also offers a standard athermal target projector with a 5.7° field of view (FOV).
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PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-03
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Vibration Test Systems
G-0 Series
The G-0 Series Vibration Test Systems consist of all-round, rugged, high quality vibration generators energy-efficient solid-state PWM power amplifiers, ideally suited to any vibration tests requiring high reliability such as MIL, IEC and JIS standardized tests for aircraft, automobiles, electronic components, electric apparatus and aerospace equipment.
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Microhardness Tester
MT91 Series
Newage Testing Instruments, Inc.
The Newage MT91 System is an automatic microhardness testing system that uses the Rockwell method for the hardness result. Hardness is measured based on the depth of penetration rather than using an optical system to determine hardness based on the impression diameter.
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PXI Programmable Power Supply
PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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AXIe Products
The AXIe is an open standard, that leverages from existing standards from ATCA, PXI, LXI and IVI, with high performance per rack inch and added features including timing, triggering, and module-to-module data movement features that are important to the implementation of high-performance test and measurement systems.
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PXI Precision Resistor Module 6-Channel, 3 to 5.82M
40-297-052
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Data Acquisition
For devices with analog outputs, we are now shipping our new multi-channel data acquisition system. This high-speed, low-noise solution is highly modular, so you can test scientific CCDs and high-speed machine-vision CMOS sensors with the same basic system. Swappable pre-amps and A/D converter modules enable you to reconfigure your test system to fit your needs.
