Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 1.5Ω to 925Ω
40-251-121
The 40-251-121 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 925Ω with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Electromagnetic Force Fatigue And Endurance Testing System
EMT Series
High-speed repeated load tests can be carried out with a maximum velocity of 2 m/s, and maximum stroke of ±50 mm, using clean and quiet electromagnetic force as the driving power, without the use of oil. The test space is large so environmental tests can also be carried out using the constant temperature tank (option).
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SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-33
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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USB Data Communications Multiplexers
These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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PCI Precision Resistor Card 9-Channel, 2Ω To 13.6kΩ
50-297-031
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Multifunction Installation Tester
COMBI519
COMBI519 carries out tests on electric systems in compliance with IEC/EN 61557-1 and therefore measurements of continuity of the protection cable, insulation resistance (with calculation of PI and DAR), overall earth resistance, RCDs type B, A and AC tripping time and current, line / fault impedance with calculation of prospective short circuit / fault current, phase sequence and conformity.
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PXI Precision Resistor Module 9-Channel, 2 to 13.6k
40-297-031
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Automated Test System
Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Transformer Test System
Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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Sequence Application Manager
AMFAX SAM
We have been building test systems for many years, as a result we find that many of the requirements our customers are looking for are very similar. This may be how a user logs in to the test system or the generation of test reports for example.
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Load Frames
Multiaxial
MTS multiaxial load frames deliver all of these advantages. Engineered for superior performance in a range of testing applications, these systems represent decades of industry expertise. They include a variety of servohydraulic load frame configurations that apply force along multiple axes simultaneously, replicating real-world materials and component service conditions with absolute precision and accuracy.
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PXI/PXIe MEMS RF Multiplexer, Dual 4-Channel, 4GHz, 50Ω, SMB
42-878-221
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Electric Motor Testing
EPT Series
The EPT Series of testing systems are developed as open, modular solutions that provide complete product testing platforms.
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Ferroelectric Test System
RT66B
Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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Interface
RP-708
The RP-708 is a two-channel ARINC 708 weather radar display data bus PMC module interface, supporting variable frame sizes for embedded applications, simulation and test. Abaco Systems provides integrated support for this module on PCI, PCIe, CompactPCI, VME, VXI and native PMC platforms. Each RP-708 channel can be configured as two transmit channels, two receive channels, or one transmit channel and one receive channel simultaneously.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
42-878-212
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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Photoelectrochemical Test System
SolarLab XM
SolarLab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on solar cell / photovoltaic research, developed in conjunction with Professor Laurie Peter of the University of Bath, UK.
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Nanomechanical Test System
Hysitron TI Premier
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
781397-01
±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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Fiber Optic Qualification & Dispersion Test Links
8800 Family
Delaire USA qualification test systems are designed to act as worst-case links for bandwidth/dispersion and attenuation, or to meet the customer's loss, dispersion, and distance requirements for custom applications. Because the test links are constructed from hand-selected, industry-standard fiber and not simulated with dispersion elements, all of the effects including loss, dispersion, and fiber nonlinearities are present and authentic. Typical applications include optical transciever testing and qualification for 40G AND 100G systems
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PXI Solid State Versatile Multiplexer
40-682-002
This versatile solid state multiplexer is especially useful where a high density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future. The PXI multiplexer uses high performance solid state switching to ensure a service life of greater than 10 years and fast operation.
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Optics Test Systems
WAS 160: Wedge Angle Sensor
Optik Elektronik Gerätetechnik GmbH
Portable measuring head for wedge errors and radius of curvature, eg of car windshields, airplanes and helicopters. It can be used for any other glass panes.
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Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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GPIB-ENET/1000 , Ethernet GPIB Instrument Control Device - United States 120VAC
781630-01
The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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AUTOMATED TEST STAND DESIGN
Automated test systems may be as simple as a laptop with a DAQ module or a stand-alone controller, but they typically require a mix of off-the-shelf and custom hardware. All that hardware is integrated and wired into a test stand. Portable or mobile test stands are ideal for in-the-field research and development and servicing of multiple laboratories or manufacturing lines. Test stand access to the front panels of hardware and subcomponents allows manual configuration of non-automated settings. Quick disconnects, cable harnesses, and easy access to probes provides efficient setup and tear-down. Expandable or modular rack mount and card base systems facilitate future needs. Ergonomic considerations include keyboard and display placement, along with number of monintors. Safety is always crucial with proper E-stop placement and keeping dangerous elements away from users.
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Non-Hydraulic Steering Module Test Simulator
SMTS
The Steering Module Test Simulator (SMTS) from MB Dynamics is a non-hydraulic turnkey lab test system, offering accurate, reliable and repeatable in-laboratory simulations of driver, road & vehicle inputs acting on a steering system, and their associated effects on steering system performance and annoying noises. Supports troubleshooting, identification, diagnosis, and resolution of root causes of unwanted noise and other performance issues common to EPS, EPHS, EPAS, MDPS, and HPS steering systems.
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SIP-90-3 Test System Interface Probe
SIP-90-3
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
