Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Cleanliness Test Systems
CM Series
The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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Diving Technology Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
The imaging ultrasonic testing systems of the USPC 30XX series are optimized for testing a wide variety of materials and provide high-resolution findings in the form of A, B, C, D and F images. The hardware consists of an industrial PC, in which a motor controller and an ADC card are installed, as well as a HILL-SCAN pulser/receiver unit. An overview of the available systems is given in Table 1.
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Tracer Gas Leak Test Systems
Tracer gas leak testing is a simple and highly-efficient method of leak detection that provides high sensitivity as well as increased accuracy and repeatability. This method is used for testing parts with very low leak rates that are outside the range for conventional air-flow pressure decay and mass flow, or to replace bubble test methods. Tracer gas testing uses escaping tracer gas to identify micro-leaks in the range of 1x10-4 to 10-9 scc/s.
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Low Frequency Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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PIM Test Systems
AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
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Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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Dynamometer Test Systems
Genuen provides a full range of off-the-shelf and custom dyno test cell solutions. We offer turnkey test cell integration services and test cell upgrades and modernization for all types of dynamometers used in automotive, aerospace, industrial, commercial, off-highway, and agricultural markets. Our broad-based expertise includes dynamometer test systems ranging from AC motor, hydrokinetic, hydrostatic, electric AC/DC, eddy current, and hysteresis brake.
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Other Test Systems
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Line Noise and Vibration Test Systems
The sound and vibration characteristics of your product can be used to identify many common mechanical and assembly defectives.
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Flash Programming for Functional Test Systems
Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Ionic Contamination Test Systems
CM+ Series
The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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Optics Test Systems
Scientific Instrument Engineering
Optik Elektronik Gerätetechnik GmbH
Development, design, manufacture and assembly of opto-mechanical assemblies and complete devices, including software.
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Memory Test Systems
ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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EMC Test Systems
IEC61000
N4L are the only IEC61000 EMC test system manufacturer in the world* with an on site UKAS ISO17025 calibration laboratory offering accreditation to IEC61000-3-2, IEC61000-3-3, IEC61000-4-7 and IEC61000-4-15. Calibration and trace-ability are a vital aspect of any EMC test solution and the coverage provided through N4L’s UKAS Laboratory is comprehensive. N4L’s IEC61000-4-15 calibration procedure is particularly noteworthy as it covers the entire test protocol detailed in Annex C of IEC61000-4-15. It is commonplace for specific parameters within IEC61000-4-15 (d parameters are frequently omitted from calibration procedures) to remain untested during typical flicker calibration due to the difficulty in providing trace-ability for such measurements. All tests within the test protocol of Annex C are included within the scope of accreditation and calibration procedures at N4L.
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High-Temperature Test Systems
HT-PEM (high-temperature polymer electrolyte membrane) technology represents a further development of PEM fuel cell technology. Unlike conventional PEM fuel cells, which operate at lower temperatures, HT-PEM fuel cells can reach temperatures of up to 200 °C.
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Shock Test Systems
Sanwood Environmental Chambers Co ., Ltd.
Is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and collision test, can perform conventional half-sine wave, post-peak sawtooth wave, square wave and other waveform shock tests.
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Optics Test Systems
MTF Measuring Device For Endoscopes
Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Hardware-in-the-Loop Test Systems
HIL
Our early development efforts and NI VeriStand expertise uniquely qualify us to maximize the benefits of and provide top-notch integration services for this software platform. Wineman Technology offers powerful and flexible MIL and HIL testing solutions, such as: Full range of MIL and HIL test systems. Software for testing. Software for simulating electronic control modules. Fault insertion unit (FIU)..
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Specialty Test Systems
The innovative products of D&V Electronics lead to cutting edge advancements – applied technology that will drive future transportation. Our specialty testing products are the cumulative result of our technological advancements that drive innovation, further our industry and enhance the quality of our customers’ products. From compact electric motor testing units to full electrical testing systems, we have the solution to always be TESTING THE FUTURE®.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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E-mobility Test Systems
Correct contactingcharging cable detectionsecurity questionExtensive range of accessories for on-site measurements in a separate caseCharging cable with additional measuring lines (Sense)Convenient control through guided test procedure via WinSAM and tabletElectromechanical locking
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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In-Circuit Test
TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Circuit Breaker Test Systems
Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
