Burn-In Sockets
See Also: Test Sockets, Burn-In, BGA Test Sockets
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BGA Sockets
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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Universal SOIC ZIF (Zero-Insertion-Force) Test Socket
Series 547
Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].
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Near Zero Footprint SMT Spring Pin Sockets
Ironwood Electronics socket is a device size or near device size footprint test socket incorporating industry standard high performance spring pins. Ironwood can design a socket to work with any type IC packages- BGA, LGA, QFN, DFN and even leaded devices where you need to fit a socket in place of your device to allow fast, easy testing and development.
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Plug And Socket Torque Test Machine
Shenzhen Chuangxin Instruments Co., Ltd.
Plug Torque Tester/Device is for compliance is checked by engaging the device, as during intended use, with the socket-outlet of a test apparatus. Plug Torque Tester is a device provided with pins intended to be introduced into fixed socket-outlets shall not impose undue strain on these socket-outlets.
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Custom Socket
Different structure:open top,clamshell or handlerOne type: design socket according to customer's PCB.The other type : customer layout PCB according to socket datasheet.Please tell device voltage,current,frequency and temperature and other requirements.
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Socket Tester
ST120+
The Fluke ST120+ GFCI Socket Tester with Beeper checks that each wire in the outlet is properly connected to the building's electrical system. Via the bright LEDs and included chart, you can quickly and easily verify the wiring of an outlet. Able to identify several common wiring errors, including reversed phase and neutral wires and an open ground, the ST120+ will give you confidence on your next job.
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Elevator Strip-Line™ Socket with Bifurcated Contacts
Series 700
Elevator Strip-Line Sockets with Bifurcated Contacts. Features: For elevated mounting of LCDs and other odd-centered or high pin count components. Any height from .360 to 2.000 [9.14 to 50.80]. ?Optional spacer available for mounting on .300 [7.62], .600 [15.24], .900 [22.86], 1.100 [27.94], and 1.300 [33.02] centers. Consult factory for other sizes.
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High Power Burn-In Test
Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Low Distortion 1kW Power Source With UK/Schuko/USA Socket.
AC1000A
Provides an EN61000–3–2 compliant source1000W power capability at 230VUp to 4·4A rms load current and up to 10A peak currentsComprehensive overload protectionConnection via standard power connectors
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Test Sockets
QFN/QFP
For today’s chipscale packages, finding the right socket solution can be challenging. With SC™ sockets from Ardent, you can count on the right design, the best performance, and quick turns for even the most challenging custom designs
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300mm Single Touchdown Burn-in and Test System
FOX-15
Up to 15 wafers at a time Known Good Die solution Lowers production cost
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Test Sockets
socket design as per customer specificationsquick + easy socket changehigh-performance spring probesdesigned for high frequency up to 16 GHz-55C/-67F to 150C/302F temperature rangemanual/automatic application optionssmall socket footprintone socket base for each insert (3x3 to 9x9 QFN)one-click switch from engineering to production socket modedevice dependent standard socket frame with changeable insertmore than 500,000 compression cyclesKelvin test applicabilitytool-free insert + actuator exchanges0.3 mm minimum lead pitchQFP extender available
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IEC60884 Fig22 Plug Socket Covers Pendulum Impact Test Apparatus
CX-BC22
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 fig22 plug socket covers pendulum impact test apparatusMeet the standard: IEC884-1 Figure 22-26,, IEC60068-2-75Uses: Suitable for household and similar plugs and sockets, wall mounted mounting boxes, screw glands, covers, switches and other electrical accessories for mechanical strength test
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Volt Probe & Socket Testers
Non-Contact & Socket
Use Amprobe non-contact volt probes to safely check circuit breakers, wall sockets and fuses for voltage presence with portable, economical tools. For sockets, choose an Amprobe socket tester, which can confirm whether GFCI breakers are properly wired.
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Burn-in and Stress Screening Chambers
KDR
Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Socket Tester
Shenzhen UYIGAO Electronic Technology Co., Ltd
*It tests your protection system to ensure the household electrical safety.*Widely used in the school, laboratory, factory and other social fields.
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Elevator Socket with Bifurcated Contacts
Series 8XXX
Elevator Sockets with Bifurcated Contacts. Ideal for elevating devices (displays, switches, etc.) to desired level with .260 to 1.250 [6.60 to 31.75] height extension.
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Single Phase Socket Tester
K-280
TESCO Knopp’s K-280 Single Phase Socket Tester is designed to detect short circuits, backfeed and wiring errors in a 120/240 volt, 3-wire, single phase self-contained meter socket.
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Elastomer Socket
As a structure made of silicon and conductive powder, elastomer is a good solution for high speed, no ball damage, stable CRES, low force and high frequency testing.
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Test Sockets
Yamaichi Electronics Co., Ltd.
A test socket is the ideal point to test your home’s internal phone wiring for faults. You can also use it to identify any potential faults with the phone line outside. Your test socket is located in your master socket. It is the point between the internal phone wiring in your house and the phone line outside. That means by plugging into your test socket you can bypass all the internal wiring and test your device directly on the phone line.
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Open-Frame Collet Socket with Solder Tail Pins
Series 518
Open Frame Collet Sockets with Solder Tail Pins. Features: Open frame allows for more efficient utilization of board space and better cooling. Choose from several pin styles. Compatible with automatic insertion equipment. Side-to-side and end-to-end stackable.
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6 Position Plug Socket Switch Life Tester
CZKS-6
It is designed according to terms and conditions of IEC60884-1, IEC60669-1, GB2099.1-2008 and GB16915.1-2003, for life test of plug and socket and switch products of household and similar use appliances. The device can connect with matched load cabinet, in order to conduct a test of electrical life, normal operation and breaking capacity. The equipment provide some clamp, it can test plug and socket production, wall switch, rocker switch, dial plate switch and button switch.
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Strip-Line™ Socket with Bifurcated Contact Wire Wrap Pins
Series 0501
Strip-line Sockets with Bifurcated Contact Wire Wrap Pins. Features: For mounting liquid crystal displays and other high pin count or odd centered components. Available in several sizes with bifurcated contacts in wire wrap or solder tail pins. Consult Data Sheet No. 12008 for solder tail pins.
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Burn-In Test Fixtures
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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Socket with Collet Contacts
Correct-A-Chip
Correct-A-Chip with Collet Contacts. Correct-A-Chip technology solves problems associated with the use of alternate ICs (due to availability, obsolescence, need for better performance, etc.) by eliminating the need for new PCBs.
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