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Ballistic Test Equipment
n 1998, H-S Precision introduced ballistic range equipment and fixtures designed to compliment its line of ballistic test barrels. Equipment is available for pressure and velocity testing, NIJ body armor testing, ballistic armor testing and extreme accuracy testing. We are the leading supplier and producer in the World for the ballistic test barrels. The most well known ammunition companies use H-S barrels for testing the quality and consistency of their ammunition.
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Automated Interferometer with Floating Pastille Technology
DAISI MT FP
The Daisi MT FP combines the Daisi MT-V3 with the new Floating Pastille fixture technology from DATA-PIXEL (patent pending). This major technological breakthrough for multi-fiber connector fixtures is perfectly suited for highly accurate X/Y endface angle measurements.
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Test Fixture with API
TA-14VG
The TA-14VG test fixture is based on the requirements for the Integrated Test Procedure for the VG-14A assembly as shown in the OEM maintenance manual. The panel also contains a test point breakout for the units main connector as well as one for the VG-401 base. The VG-401 breakouts provide an in series connection that will allow easy access to the gyro's signals and also provides a way to monitor rotor current. The panel also contains a variac to allow for line voltage adjustment.
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Safety Test Panel for Luminaire Fixture
SCR ELEKTRONIKS introduces Safety Test Panel for Luminaire with PC Datalogging. The tests are Performed as Prescribed in IS the Panel Carries out different tests one by one and provides indication of the Test results as OK or NOT-OK. It is very useful and handy in line testing on Mass production line as well as type Testing.
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Solar Radiation Sensors
The solar radiation sensors that Campbell Scientific offers come in a variety of designs: pyranometers, net radiometers, quantum sensors, and pyrheliometers. These sensors measure various aspects of the energy imparted by the sun on the Earth’s surface. A leveling fixture fitted with a bubble level may be required to accurately install solar radiation sensors.
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Curved Needle Test Systems
Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Fixtures, Programming & Test Services
Comware Technical Services, Inc.
Fixtures and programming services are available for Agilent, GenRad, and Teradyne testers. Working from CAD data, a program can be created in only a few days allowing for fast and cost effective testing of your products. Engineering services are available for fixture revisions or repairs.
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Enhanced Time Domain Analysis With TDR
S96011B
Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).
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Universal Test Fixture
Series 48
The Series 48 Universal Test Fixture Systems are an effective way to test high mix, low to medium volume products. The Universal Base is designed around the CAMGATE Z axis Test Fixture. The base interfaces with removable, quick change Series 49 Universal Test Insert Kits. Three versions are offered, a blank base whereas the end user can configure the Base and insert kit to their own connector configuration, The 160 point model which uses four (40) pin IDC ribbon cable connectors to interface between the base and the insert kit, and the -I model that incorporates the same 4 block GR2270 style block interface as used on our Series 34 test fixtures. This allows for increased test point count and the use of Industry Standard 2270 style signal, power, and coax blocks. Rear panels can be custom configured to customer specifications, Virginia Panel ITA frames, or GR2270 Interfaces used on Semco’s Standard Product line
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Non-Linear Junction Detector
ORION™ HGO-4000
The ORION HGO-4000 is REI’s original high gain Non-Linear Junction Detector for special applications. The ORION HGO-4000 can locate listening devices and semiconductors in walls floors, ceilings, fixtures, furniture or containers and provides a user the capability to detect hidden electronic devices, regardless of whether the device is radiating, hard wired, or even turned off.
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Lamp & Fixture Wiring Tester
GT3110GAM LAMPCHEK
LampChek indicates the lamp and fixture continuity.
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Audio Panel/Amplifier Test Fixture
TA-200
The Model TA-200 test panel was designed to allow Avionics shops the capability to test and troubleshoot both today's new generation audio panels as well as the standard audio panels of the past. The testing of these panels over the years has always proven to be a very time consuming job for most shops because of the limited capabilities of any past test panels.
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TestStation LHS
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award-winning TestStation product family. Compatible with existing TestStation LH fixtures.
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Cost-Effective ATE System
PRO RACK ATE
Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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G18 - 18 Module Solution
For maximum versatility and easy access to instrument-side wiring and cable assemblies, VPC offers a selection of slide kits designed to fit most common rack depths. Ordering has been simplified by offering a package that includes the G18 receiver, receiver mounting plate, flanges and instrument bracket. Slides are rated to support 180 lbs (81 kg) to accommodate large fixtures. To determine the slide kit needed, measure rack depth between mounting rails. With this measurement, choose the slide mounting kit that fits the rack.
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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12-Ch SPST 4A-250VAC 24VDC High Current Power Switching
YAV90PIN
The YAV90PIN board is designed to cover the need to control the available power supplies in a test system to the device under test. A VPC 90 series connector is used as interface with the fixture, guaranteeing more than 20.000 mating cycles. Two connector contacts per relay contact are used.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Non Contact Detectors
*Adjustable to safely detect power and low voltage*Safely detects AC voltage without touching the bare conductor*Adjustable for use on power wiring plus lighting, thermostats and other low voltage circuits*Use to detect voltage in outlets, lighting fixtures, wires and cables*Finds breaks in wires*Identifies hot and neutral conductors*Low battery indication
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PXI-5651, 3.3 GHz RF Signal Generator
779670-01
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Phase Array Ultrasonic Testing
PAUT
Sensor Networks, Inc. (SNI) is a Pennsylvania-based technology company specializing in the design and fabrication of industrial ultrasonic transducers and tooling for demanding in-situ test and inspection applications. Engineered for precision, ease of use, and maximum durability, our offerings include Phased Array ultrasonic transducers, fixtures, couplant-delivery systems, qualification/calibration standards, procedure development, personnel training and instrumentation.
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Debug Fixture
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Tracing-Type Non-Contact Inspection System For LCD/STN/Touch Panel/FPC
TTS
*"Probe + Non-Contact Sensor" enables to delect SHORT after sticking LCD*No Fixture in LCD Inspection*Applicable to FPC Inspection
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IR LightSource
Universal LightSources emit Infrared (IR) radiant energy and are designed for the testing of IR(infrared) sensors used in remotely-controlled products.The Universal LightSources use a standard 5-volt DC power supply connected via a connecting cable with mating coaxial power plug and terminated with clearly polarized push-on connectors to access fixture 5-volt D.C. supply wire-wrap pins wherever available. Alternatively, the Universal LightSource can be connected to a serial-digital pulse-code-modulated signal source.
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High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
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9025TR - 25 Module Solution with Platform
The 9025TR has over twice the I/O as the G12 and is outfitted with the same 20-inch platform to support enclosures while engaging and disengaging. The front-mount ITA is user-friendly, allowing the enclosure or fixture to be fastened from the mating side. The docking feature of the 9025TR provides an easy way of guiding a fixture into position prior to engagement. Runners along the platform provide a smooth-sliding action, ideal when using fixtures up to 180 pounds. The 9025TR uses all standard modules and contacts, includes a microswitch and is available with optional table legs and keyboard tray kit.
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Becker NAV/RMU/RMI/OBS Test Fixture
TA-3320
This NAV test fixture is specific to the requirements for testing Becker Avionics NAV, RMI and RMU products. The panel incorporates specific functionality required for testing these Becker products by the book including special requirements for the RMU 5000 and the IN 3300 series of nav indicators. This BAEE NAV test fixture also facilitates resolver alignment and discrete meter testing through the PG 3300 interface connector. The RM 3300 portion of the panel tests the Becker RMI indicators and allows for sourcing the composite signal from the paired radio or from an external generator. The DME channeling outputs are monitored with discrete LED's as well as the ILS, V/LOC, Glideslope and NAV TEST valids. Discrete test jacks are provided for all the meters and the resolver of the NAV indicator and a dimming source is also provided. When testing the RMU 5000 computer access is through a dedicated connector.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
