Simulation Testing
See Also: Simulation, Simulators, Simulation Software
-
Product
PXI Strain Gauge Simulator Module 2-Channel, 350 Ohm
40-265-012
-
The 40-265 range consists of 6, 4 or 2 channel modules (this version is the 2-channel, 350Ω) that simulate the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems. The range provides a simple way of replacing in house developed sensors with a low cost simulator having excellent performance. The 40-265 uses the same resistor bridge techniques that real life strain gauges are based on, ensuring accurate emulation under all conditions.
-
Product
PCI Strain Gauge Simulator Card, 6-Channel, 1.5k
50-265-406
-
Designed to simulate the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems. It provides a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
-
Product
PXI/PXIe Battery Simulator Module, 4-Channel, 750 V Isolation
43-752A-002
-
Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 4-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
-
Product
Parametric Test Fixture
U2941A
-
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
-
Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
-
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
-
Product
JTAG Functional Test
JFT
-
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
Configurable Functional Test System
ATS-5000
-
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
-
Product
Magnetic Material Test Fixture
16454A
-
The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
-
Product
4-Module ICT System, I307x Series 6
E9903G
-
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
-
Product
Hybrid Single Site Test Handler
3110
-
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
-
Product
Memory Test System
T5230
-
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
-
Product
SAS Protocol Test System
M124A
-
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
-
Product
In-Line Test System
-
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
-
Product
Asynchronous System Level Test Platform
Titan
-
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
-
Product
PXIe Optical Test Modules
-
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
-
Product
Test Handler
M4841
-
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
-
Product
NI Real-Time Test Cell Reference System
780590-35
-
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
-
Product
Die Test Handler
3112
-
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
-
Product
PXI Millivolt Thermocouple Simulator Module - 32 Channel
41-760-001
-
This series of PXI Thermocouple Simulator Modules is available in a choice of 32, 24, 16 or 8 channels—each channel providing a low-voltage output across two connector pins capable of providing ±20mV with 0.7µV resolution, ±50mV with 1.7µV resolution and ±100mV with 3.3µV resolution, covering most thermocouple types.
-
Product
Memory Test Systems
T5503HS2
-
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
-
Product
Mobile Comm DC Source w/ Battery Emulation
66321B
-
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.The Keysight 66321B mobile communications dc source provides fast transient response, exceptional sourcing, output resistance programming, and precision measurement. This product is specially designed for testing next generation digital wireless communications products. The 66321B mobile communications dc source offers a new capability that simulates the internal resistance of a battery or battery pack. Additionally, these high performance models offer improved transient response and stable output operation with either short or long load leads.
-
Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
-
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
-
Product
Compact Functional Test System
E2230C / TS-5040
-
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
-
Product
Massively Parallel Parametric Test System
P9001A
-
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
-
Product
PXI Strain Gauge Simulator Module 4-Channel, 350
40-265-014
-
This module simulates the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems.
-
Product
Application Software for Electronic Test & Instrumentation
-
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
-
Product
EFT Module for Teststand
-
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
-
Product
3-Axis Non-Robotic Automated Testing System
AT3
-
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
-
Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
-
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
-
Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
-
The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
