Simulation Testing
See Also: Simulation, Simulators, Simulation Software
-
Product
PXI Isolated Millivolt Thermocouple Simulator - 24 Channel
41-761-002
Simulator
The 41-761-002 is a low voltage 24-channel output module ideal for simulating theoperation of a thermocouple, also available with 32, 16 or 8 channels. Each channel of the 41-761 provides a low voltage output across two connector pins capable of providing ±20mV with 0.7μV resolution, ±50mV with 1.7μV resolution and ±100mV with 3.3μV resolution, covering most thermocouple types.
-
Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
-
Product
PXI Strain Gauge Simulator Module 6-Channel, 1k
40-265-206
Strain Gauge Simulator
The 40-265 range consists of 6, 4 or 2 channel modules (this version is the 6-channel, 1kΩ) that simulate the operation of a range of strain gauges making it ideal for testing strain gauge meters and a wide variety of industrial control systems. The range provides a simple way of replacing in house developed sensors with a low cost simulator having excellent performance. The 40-265 uses the same resistor bridge techniques that real life strain gauges are based on, ensuring accurate emulation under all conditions.
-
Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
-
Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
-
Product
Verification And Diagnostic Tools
Y1131A
Test Fixture
Provides module-specific tests to troubleshoot relay failures and predict maintenance requirements.
-
Product
PXI/PXIe Battery Simulator Module, 2-Channel With V/I Readback
41-752A-013
Simulator
Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 2-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
-
Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
-
Product
Battery Emulator And Profiler
E36731A
Battery Simulator
The Keysight E36731A battery emulator and profiler is an integrated electronic load and power supply developed to use with Keysight PathWave BenchVue battery emulation software. An emulated battery gives you a known good reference for testing at any charge level. Quickly assess the effect of design or software changes on battery life by emulating any battery charge state. Leverage emulation and precise current drain analysis to achieve longer battery life or to reduce the size of your device.
-
Product
PXI RTD Simulator Module 6-Channel PT1000
40-262-102
Simulator
The 40-262 is a 3U PXI module range that supports 6 (in one slot), 12 or 18 (in two slots) channels of RTD simulation. Based on the 40-260 design principles the module can provide a setting resolution of <8mΩ (PT100) or <90mΩ (PT1000) and a resistance accuracy of better than 0.1% on all channels. Each simulation channel is able to provide a short or open circuit setting to simulate faulty wiring connections to a sensor. Calibration or verification of each resistor channel can be verified by using the calibration port connected to a high performance DMM and a supplied software package.
-
Product
Headlamp Test Platform
Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
-
Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
-
Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
-
Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
-
Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
-
Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
-
Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
Product
Single Stream STANAG3910/EFEX Test And Simulation Module for PCI
APXX3910
Simulator
STANAG3910/EFEX Test and Simulation module for PCI with 1 dual redundant HS/LS channel and onboardFibre Optic Front End (FOFE). Easily select between EFAbus and EFEX modes for Tranche II Eurofighter. The APXX3910 is a functional replacementfor model APX3910.
-
Product
PXI/PXIe LVDT/RVDT Simulator Module, 4-Banks
41-670-101-AABBCC
Simulator
The 41/43-670-101 is ideal for the simulation of variable differential transformers (VDT), both linear (LVDT) and rotary (RVDT) types. It has four banks, each capable of simulating the output of a single 5 or 6-wire VDT or resolver, or dual 4-wire utilizing a shared excitation signal. This allows the module to simulate up to 4 channels of 5 or 6-wire or 8 channels of 4-wire.
-
Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
-
Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
-
Product
VDT/Resolver Simulation Module for SLSC
Simulator
Bloomy's VDT/Resolver Simulation Module offers eight channels of variable differential transformer (VDT) sensor simulation at an unmatched price point. Its highly-flexible nature allows each channel to be configured independently for simulation of a linear variable differential transformer (LVDT), a rotary variable differential transformer (RVDT), or a resolver. Versatile, separate E1 and E2 returns allow each channel to be connected in a 4-, 5- or 6-wire configuration. The included VeriStand SLSC driver also allows each channel to simulate two 4-wire sensors where shared excitation is acceptable.
-
Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
-
Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
-
Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
-
Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
-
Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
-
Product
PXI RTD Simulator Module 18 Channel PT100
40-262-001
Simulator
The 40-262 is a 3U PXI module range that supports 6 (in one slot), 12 or 18 (in two slots) channels of RTD simulation. Based on the design principles of our 40-260 PXI Precision Resistor, this RTD simulator module can provide a setting resolution of <8mΩ (PT100) or <90mΩ (PT1000) and a resistance accuracy of better than 0.1% on all channels.
-
Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
-
Product
P104 Synchro/Resolver Simulation Board
73DS2
Simulator
NAI’s 73DS2 is a PC104-compatible Synchro/Resolver Simulation Board with three isolated channels. These channels can incorporate up to three Digital-to-Synchro/Resolver Converters with 1.2 VA drive capability in a stack-through module. With galvanic isolation, one of the outputs can be grounded without affecting performance.
