Simulation Testing
See Also: Simulation, Simulators, Simulation Software
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Product
VXI 16-Channel, 2-Wire LVDT/RVDT Simulation
65DL1
Simulator
NAI’s 65DL1 is a 16-channel, 2-wire, LVDT/RVDT Simulation Instrument on a VXI board. This single-slot, message-based board provides 16 independent, transformer-isolated, LVDT/RVDT, programmable 2-wire outputs (up to 34 V), wrap-around self-test, and an onboard programmable excitation supply.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Intelligent Interface Card
IIB-1553-PC104
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The IIB-1553-PC104 is an intelligent interface card providing full MIL-STD-1553 test, simulation and bus analysis capability for PC compatible computers, with 1553A, 1553B, McAir and STANAG 3838 variants in one card. The IIB-1553-PC104 supports concurrent Bus Controller (BC) and up to 31 Remote Terminals (RT) with Bus Monitor (BM). An additional stand-alone Chronological Bus Monitor (CBM) facility is also provided, with powerful multi-level triggering capability. Full error injection capability is provided in BC and RT modes, with full error detection in BC, RT, BM and CBM modes. The unit provides a single, dual redundant 1553 interface. 2 Mbytes of dual ported RAM are provided. PC memory space utilised by the board is selectable. The board is supplied with C drivers in source code and Windows menu driven software as standard
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Product
Test Handler
M4841
Test Handler
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
PXI Isolated Millivolt Thermocouple Simulator - 24 Channel
41-761-002
Simulator
The 41-761-002 is a low voltage 24-channel output module ideal for simulating theoperation of a thermocouple, also available with 32, 16 or 8 channels. Each channel of the 41-761 provides a low voltage output across two connector pins capable of providing ±20mV with 0.7μV resolution, ±50mV with 1.7μV resolution and ±100mV with 3.3μV resolution, covering most thermocouple types.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
PCI Strain Gauge Simulator Card, 6-Channel, 1k
50-265-206
Strain Gauge Simulator
These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
PXI/PXIe Battery Simulator Module, 4-Channel
41-752A-002
Simulator
Targeting EV, automotive, aerospace, energy storage and electric aircraft applications, the new battery simulator modules occupy a single PXI slot. These 4-channel battery simulators are capable of supplying up to 7 V and 300 mA per channel. The channels are fully isolated from ground and from each other, allowing series connection to simulate batteries in a stacked architecture.
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
Synchro Simulator
SPA-CASE
Simulator
Computer Conversions Corporation
The Synchro Simulator has two modes of operation: Static and Dynamic. The mode of operation is selected by the position of the mode switch. In the static mode, the thumbwheel switches select the output angle. In the dynamic mode, the speed and direction switches determine the rate and direction of synchro outputs. Self test circuitry continuously monitors and displays the output.
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Single Stream STANAG3910/EFEX Test And Simulation Module for PCIe
APEX3910
Simulator
STANAG3910/EFEX Test and Simulation module for PCIe with 1 dual redundant HS/LS channel and onboardFibre Optic Front End (FOFE). Easily select between EFAbus and EFEX modes for Tranche II Eurofighter. The APEX3910 is a functional replacementfor model APE3910.
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
Compact EMS/EMI Test Platform
CEMS100
Test Platform
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
PXI Millivolt Thermocouple Simulator Module - 8 Channel
41-760-004
Simulator
This series of PXI Thermocouple Simulator Modules is available in a choice of 32, 24, 26 or 8 channels—each channel providing a low-voltage output across two connector pins capable of providing ±20mV with 0.7µV resolution, ±50mV with 1.7µV resolution and ±100mV with 3.3µV resolution, covering most thermocouple types.
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Product
RTD Simulator PCI Card 6-Channel PT1000
50-262-102
Simulator
This RTD Simulator is a PCI card that supports 6 channels of RTD simulation. The card can provides a setting resolution of <90mΩ (also available in <8mΩ - PT100) and a resistance accuracy of better than 0.1% on all channels. Each simulation channel is able to provide a short or open circuit setting to simulate faulty wiring connections to a sensor. Calibration or verification of each resistor channel can be verified by using the calibration port connected to a high performance DMM and a supplied software package.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
PCI Strain Gauge Simulator Card, 6-Channel, 3k
50-265-106
Strain Gauge Simulator
These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
