Wafer Resistivity
See Also: Wafer, Wafer Thickness, Wafer Failure Analysis, Wafer Edge, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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4-Probe Resistivity and Resistance Tester
HS-MPRT-5
t used for measuring resistivity of silicon rods and wafers, and sheet resistance of diffused layers, epitaxial layers, LTO conductive films and conductive rubbers, etc.
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Hand Held Probe Type Eddy Current Sheet Resistance/resistivity Measurement Instrument
EC-80P (Portable)
*Auto-measurement start by probe head contacting to sample*3 measurement modes for wafer resistivity, bulk resistivity and sheet resistance*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range*Resistivity probe can be changed by sample’s resistivity range
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Wafer Chucks
ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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Wafer Chucks
American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Wafer Prober
Precio octo
200mm wafer prober. The system adapts ultra-high speed indexing and high-speed wafer exchange functions to reduce test cost and improve overall equipment effectiveness (OEE) markedly enhancing productivity.
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Wafer Test
Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Earth Resistance & Resistivity Meter
MRU-200
MRU-200 is the only meter in the market which uses all measurement methods.Possible measurements:- earth resistance measurment with 2-pole, 3-pole,4-pole method,- impulse earth resistance measurement, two kinds of measuring impulse 4/10s, 10/350s,- earth resistance measurement without disconnecting measured earths (using clamp),
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Bare Wafer Inspection System
LS-6700
Hitachi High-Technologies Corp.
High sensitivity (50nm:Bare). High accuracy for COP/CMP discrimination (85%). High throughput (80 wph @300mm).High positioning accuracy (+/-30m). Wafer Size 300mm / 200mm.
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Resistance Meter
MS8-2L
M-module MC8-2L is a mezzanine module designed to measure resistance using a two-wire measurement scheme in eight channels (eight-channel digitizer). М-module МС8-2Л is installed on the mezzanine carrier - NM module and is connected to it via a local information highway. Up to four m-modules of various types can be installed on the HM module. The NM module, together with the m-modules installed on it, forms a VXI module of size C-1 and is used to create information measuring VXI systems.
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Resistivity Meters
SSR-MP-ATS
Integrated Geo Instruments & Services Private Limited
The instrument design incorporates several innovative features and advanced techniques of digital circuitry to make it a reliable Geophysical tool providing high quality data useful for mineral and groundwater exploration and any other Geophysical applications. The SSR-MP-ATS sends the entire current into the ground without wasting power for constant current generation thus increasing the signal strength to probe deeper layers.
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Resistance & Resistivity Probes
Surface and/or volume resistance measurements are key parameters in describing materials' electrical properties. ETS offers a variety of probes to support numerous industry requirements and applications.
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Wafer Inspection System
JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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WDXRF Wafer Analyzer
2830 ZT
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Wafer Test
Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level
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Wafer Bonding Systems
ith over 15 years experience in designing and manufacturing precision wafer bonding equipment, EVG wafer bonding systems are well recognized in setting industry standards for the MEMS production industry. Besides supporting wafer level and advanced packaging, 3D interconnects and MEMS fabrication, the EVG500 series wafer bonding systems can be configured for R&D, pilot-line or volume production. They accommodate the most demanding applications by bonding under high vacuum, precisely controlled fine vacuum, temperature or high pressure conditions. Multiple bonding methods including anodic, thermo compression, glass-frit, epoxy, UV and fusion bonding are covered. Based on a unique modular bond chamber design the EVG500 series allow for an easy technology transfer from R&D to high volume production.
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Resistance Tester
KT-2000RD
This equipment represents the wanted resistance value in digital figures and at the same time, is an ohmmeter which decides products to be bad in case of being out of the previously set range of H,L and to be good in case of being within the range. Moreover, because it is designed and manufactured on the basis of KAST's business experiences and know-hows accumulated through on-the-spot works for a long time, it is highly trustable, especially strong to noise and impulse that occur on the bad electric condition of on-the-spot or on the connection with any other equipments, and also is convenient for use.
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Wafer Test
WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Wafer Probers
Devices to align probes to test the electrical properties of IC chips or TEGs (Test Element Groups) formed on wafers. The vast options available will meet various needs, from research to mass production.
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Resistance Measurement
PROMET
High-precision micro-ohm measuring systems with adjustable DC test current for determining resistances on circuit breakers or inductive loads such as transformers, for example. The high-precision ohm meters of the PROMET series are used to determine very low electrical resistances in the µΩ range. The adjustable test current of up to 600 A in combination with a four-wire measuring method delivers measurement results which meet stringent accuracy requirements. State-of-the-art power electronics coupled with a robust design guarantee excellent reliability for use as a portable device in switching stations and industrial environments. Typical applications include determining the contact resistance of switchgear devices and determining the resistance on inductive loads such as transformers.
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Wafer Analyzer
RAMANdrive
RAMANdrive is the specialized Raman microscope for wafer analysis equipped with our dedicated 300 mm stage. RAMANdrive gives you an ultra-fast, highest resolution analysis of the whole wafer with unique stability and accuracy
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Earth Resistance Testers
.Multi Test Voltage.Conductor resistance measurement(DET4300).Soil resistivity measurement(DET4300).LCD background light.Data hold.Working LED indicator.Low battery warning.Function symbol display
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Decade Resistance Box
TEK903
The TEK903 is a very reliable decade resistance box with high quality rotary switches providing in-line readouts. Ideal for laboratory, educational and calibration applications. The extra terminal forms an accurate potential divider.
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Earth Resistance Meter
EM 4058
earth tester is a digital, microprocessor controlled instrument that allows to measure the earth resistance and ground resistivity (using Wenner´s method), as well as to detect parasitic voltages present in the ground. This instrument is suitable to measure earth systems in power substations, industries, distribution networks, etc., according to IEC 61557-5.
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Insulation Resistance Tester
HT2671 / 761
Wuhan Huatian Electric Power Automation Co., Ltd.
Mainly used to check the insulation resistance of electrical equipment or electrical lines to ground and phase to ensure the normal operation of these equipment.
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Insulation Resistance Measurement
MD 10KVR
The digital insulation tester model MD-10KVR is Megabras' cutting edge insulation analyzer equipment and it is one of the most complete and sophisticated available in the international market. A powerful software allows for further analysis of tests results, including features such as graphical representation and automatic report generation. Its proven technology provides safe, reliable and accurate measurements of insulation resistances up to 10 TΩ, with 4 pre-selected test voltages, 500 V - 5 kV - 10 kV - 15 kV. Other test voltages may be selected in steps of 25 V, 100 V or 500 V.
