High Speed Internet Test
Determines the amount of data transferred per second.
-
product
Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
-
product
CC15010X, 10 MHz, 150 A Current Oscilloscope Probe
786849-01
The CC15010X, or Hioki 3274, is a clamp-on current probe that offers a wide DC to 10 MHz bandwidth and 150 A of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
-
product
HPC High Current Probe
HCP-13
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
High Speed Cameras
TETHERED HEAD SERIES
The FASTCAM Multi is a unique high-speed camera system featuring two compact and lightweight, sealed camera heads tethered to a remote processor. Benefiting from a high light sensitivity sensor delivering 1.3 megapixel resolution at 4,800fps, built-in data acquisition and options for long duration direct-to-SSD recording with the additional of the optional FASTDRIVE, the FASTCAM Multi is truly innovative.
-
product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
-
product
Industrial Internet Of Things
IIoT
Integrate intelligent devices, sensors, and software applications to gather, analyze, and utilize machine data for optimizing processes, increasing efficiency, and improving overall productivity.
-
product
High Speed Slip Rings
High Speed Slip Rings transfer power and data in rotating environments at speeds of up to 20,000 rpm. They provide low noise, high reliability and long life.
-
product
Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
-
product
High Speed Communication Board
MS 1712
- 12 Channel RS422 Standard Communication interface- 4 Channel Configurable Manchester Bi-Phase Signal communications- 4MBPS configurable baud rate- VIRTEX4 FPGA based design- Hardware Frame formation- Hardware Data validation with START & END frame identification and Checksum calculation for RS422 communication- 1MB DPRAM for PCI interface- Separate set of FIFO's for Transmit and Receive channel- 16 Channels data recording through CF (Compact Flash Storage - Capacity up to 8Gbyte) up to 30min @ 2Mb/sec- Online download through USB interface- Driver interface for Windows2000/XP/VISTA and LINUX OS- 6U size cPCI Board- Hot Swap facility is provided for the live Insertion and removing of the board- 12 RS422 channels in front panel interface using two 25-pin D-Type connector
-
product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
-
product
RF Testing Platform for ATx05
AT118
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
-
product
Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
-
product
PCIe Gen3 High speed, compact Camera for Testing
CB013MG-LX-X8G3
High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
-
product
High Speed Links
HSL
ADLINK's Intelligent Remote Data Acquisition & Control Modules (NuDAM) are designed for data acquisition systems based on PCs and other processor based equipment with standard serial I/O ports (RS-232 or RS-485 with auto direction control).
-
product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
-
product
High Speed Controllers
Anfatec's brand-new SPM controller development integrates cutting-edge D/A- and A/D-conversion technology into a unique state-of-the-art multiple DSP system.The digital real-time feedback loop provides an outstanding performance with ~1 µs latency in contact and dynamic mode. A synchronized digital scan generator with programmable output filtering guarantees an absolutely jitter free image. Intelligent data acquisition features allow to eliminate image non-linearities caused by the user's mechanical system.
-
product
PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
-
product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
-
product
High Speed Digital I/O
ADLINK's high-speed digital I/O cards features 32 or 64 high-speed single-ended I/O channels and up to 50 MHz data transfer rate with 200 MB/s data throughput—ideal for large-scale digital data exchange.
-
product
Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
-
product
High-Voltage Differential Probe, 25 MHz
N2791A
Use the N2791A 25-MHz low-cost high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2791A differential probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 700 V of differential voltage and common mode voltage.
-
product
High Speed Link Extension Module
HSL-Terminator
The HSL-Terminator can be used for stable communication. The HSLTerminator provides an adjustable resistor to allow the impedance of the wiring of the HSL system or Motionnet system to be adjusted to ensure the quality of the transmission.
-
product
High Speed Spectroscopy Camera
SynapsePlus CCD
Superfast electronics (up to thousands of spectra per second). Very low read noise. Best linearity in its class. Different chip types to suit every spectroscopy need. Open Electrode (OE) 1024 x 256 pixels, Front-illuminated UV enhanced (FIUV) - 2048 x 512 pixels, Front-illuminated visible (FIVS) - 2048 x 512 pixels, Back-illuminated UV enhanced (BIUV) - 1024 x 256 and 2048 x 512 pixels, Back-illuminated visible (BIVS) - 1024 x 256 and 2048 x 512 pixels, Back-illuminated deep depletion (BIDD) – 1024 x 256 pixels.
-
product
High Speed IR Camera
TACHYON 1024 µCAMERA
*Miniaturized uncooled MWIR camera for industry*32×32 resolution*IP67 rated*Industrial M12 USB connector*1000 frames per second*CS-mount
-
product
Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
-
product
Standard & High Speed Amplifiers
Advanced Energy's Trek high voltage power amplifiers employ unique and proprietary circuitry. Benefit from closed-loop amplifier systems that feature exceptional DC stability and excellent wideband performance characteristics. And thanks to all-solid-state designs, our amplifiers are protected from output short circuits and overvoltages.
-
product
High Speed VNIR/SWIR Hyperspectral Imager
Compact VNIR/SWIR HSI sensor compatible with small rotary wing UAS operation with application to disturbed earth detection and vegetation/mineral mapping
-
product
Internet of Things (IoT)
When an IoT device is being designed, it’s important to consider the antenna in relation to the housing and environment. It can seem intimidating, but antenna design doesn’t need to be daunting. With the large increase of wireless IoT devices connecting our world, understanding IoT antenna design is even more important than ever. That’s why we gathered some of our best resources for IoT designers ranging from application notes to eBooks from Microwave Journal.
-
product
High Speed Digital Analog
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
-
product
Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
