High Speed Internet Test
Determines the amount of data transferred per second.
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Internet Speed Measurement
Onlineeye Pro
Measure, analyze and record the bandwidth and speed of your Internet connection.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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High Speed And High Resolution Cameras (PCI Cameras)
XiB
*High speed interface with bandwidth of 20 GBit up to 64 Gbit / sec*CMOSIS / ams sensors: CMV12000, CMV20000, CMV50000*High image resolution and high throughput with 12 Mpix, 20 and 50 Megapixel*Speed of 133 - 333 Fps, 33 and 30 Fps respectively*Fast speed models with 1 Mpix at 3500 and HD at 2500 Fps*Robust PCI Express and Power/GPIO connectors*Integrated Canon EF-mount control with dynamic aperture and focus control*Support for Windows, macOS, Linux, ARM*Suitable for OEM customization and Embedded vision systems*Distances up to 300m over fiberoptic cable*Compact housing: 60 x 60 x 38 mm
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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High speed linear THz camera
High Speed Linear THz camera is our brand new product, which features both, unprecedented imaging speed of 5000 frames per second and ease of integration into any industrial process. Its ultrafast linear sensor array is built to satisfy the needs in Non- Destructive Testing (NDT) and Quality Control (QC) for many industrial applications employing high speed conveyors belts. This product fits most conveyors with a belt speed up to 15 m/s.
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High Speed Dielectric Cure Monitor
LTF-631
The LTF-631 High Speed Dielectric Cure Monitor is designed for the study of rapidly reacting materials in research and development, quality assurance/quality control, and manufacturing applications involving thermoset materials such as resins, composites, paints, and coatings.
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Dual-Channel High Speed Power meter
JW8103
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
JW8103 Bentch top Dual-channel High Speed Power Meter is according to the newest optical power test requirements ,combined with the technology characteristics of the power meter in domestic and overseas; the dual channel high speed power meter with very fast sampling rate(can achieve 51200 sampling point per second) and fast stable time, greatly improve the test efficiency；provide large InGaAs detector and adaptors，make it suitable for bare fiber environment and dynamic range test；provide more comprehensive menu settings function，for many test situations to use.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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High Speed Data Acquisition Board
MS 1800
*Bus Interface:- 64 Bit PCI Bus with PMC Interface*Virtex-4 FPGA based design*32 channel digital I/O signal*RS232 & RS485 Interface*32MB Flash*2MB Static RAM for data storage*Analog Inputs:- 2 Channel*Input Resolution:- 14 Bits*Sampling rate up to 80MSPS*Filter:- Low Pass Filter for all channels*Two Analog Outputs*14 bit Resolution*Driver interface for Windows2000/XP/VISTA and LINUX OS*Self Test future
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
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High Speed Logic and Data Path Management
The ADI Data Path Management portfolio offers Data Path Signal Conditioners, Digital Crosspoint Switches, Level Translators, Serializer/Deserializer & Selector Muxes and Track/Hold Amplifiers for meeting the tight requirements of modern high data rate system. ADI's system solution focused products are easy to integrate to any signal chain with single supply usage while achieving low jitter, high output swing, fast rise/fall time.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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High Speed Cable Production Tester
GRL-V-DI20
GRL-V-DI20 provides a fast and easy way for anyone to test cables for manufacturing defects and signal integrity specification requirements. GRL-V-DI20 provides comprehensive test coverage in seconds at a fraction of the cost of similarly-capable bench test equipment.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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High Speed Photodetectors
Macom Technology Solutions Holdings Inc.
MACOM offers photodetectors from 20 – 70 GHz for ultra-clean, high-speed performance that enable precise characterization of ultrafast optical signals. These products are available in with different bandwidths and packages to provide solutions many applications.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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High Speed Phase Inverter - Buffer
WMA-IB-HS
The WMA-IB-HS can be used to double the output voltage of two high voltage amplifiers by driving them in bridge mode, or as high impedance input buffer while maintaining precision, high speed and low noise. Because of its high bandwidth, the WMA-IB-HS model is ideal for the Falco Systems WMA-100 or WMA-300 amplifiers. It can also be used with all other Falco Systems HV amplifiers, or even with high voltage amplifiers of another brand.
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High Speed Rotation Type Torque Detector
DD series
The DD series torque detector is the high-end equipment of the SS series to use in high speed measurement and large capacity measurement. It can be recommended to use in the heavy-duty application from DD-505 to DD-108. Double bearings provides three to five times the strength of our conventional torque detector under radial and thrust load, which enables direct coupling to automobile engines and saves the space as it makes a conventional intermediate bearing unnecessary. The oil drip lubricant (option) is necessary for the DD series.
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Unipolar Variable Gain High Speed Amplifier
F70PV
The F70PV is a very fast, unipolar, linear amplifier having a variable amplification of 0-10 times and capable of voltage output of +70V. Any functiongenerator or arbitrary waveform generatoror any othe signal source can be used as an input device. The amplifier's output is linear from DC up to ca 10 megahertz range. It can be used in a wide range of high speed applications.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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High Speed Camera Systems
MEMRECAM MX
The nac MEMRECAM MX is a robust, turnkey solution for multi-camera onboard and offboard automotive testing and occupant safety applications. Each system supports up to eight, tightly synchronized camera views, and integrates seamlessly with all current and legacy MEMRECAM imaging systems.
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High Speed IR Camera
LUXELL CAMERA-S
The LUXELL CAMERA-S is the industrial version with IP67-rated housing of the linear scanning array LUXELL-CORE-S with FPA 256 pixels.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Brute High Current Probe
P4301-1R
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Standard - 1.44 (41.00) - 4.50 (128.00) High Current Probe
HCP-13A
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
