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Product
Probes
71 Series
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American Probe & Technologies, Inc.
10 mil (0.010") shank sizesAvailable in straight and bent shapes
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Product
Probes
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SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Product
Probes
72 Series
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American Probe & Technologies, Inc.
20 mil (0.020") shank sizesAvailable in straight and bent shapes to fit most industry standard analytical probe holders
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Product
Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Product
Passive Probes
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Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a /10 attenuation and feature a high input resistance of 10 MOhm. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400 V, some as high as 600 V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.
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Product
Analyzer Probes
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The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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Product
ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Product
Renishaw Scanning Probes
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Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
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Product
Battery Probes
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C.C.P. Contact Probes Co., LTD.
CCP offers a variety of different high current battery testing probes.
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Product
Contact Probes
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Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Product
Ultrasonic Immersion Probes
SONOSCAN I
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The SONOSCAN immersion transducers for Non-destructive Testing (NDT) are mainly used to test metals and plastics for the smallest material defects. For example, binding defects, welding defects or cracks and pores in metal parts can be detected. The powerful, robust ultrasonic probes can be connected to all common ultrasonic testing devices. Due to variable designs and sizes, the immersion probes guarantee optimal use. In addition to ultrasonic standard pobes, we also offer customized transducers according to your individual specifications.
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Product
Logic Analyzer Probes
FS2354 & FS2355
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The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
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Product
Scanning Probes
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3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.
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Product
UV-measurement probes
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For example, some UV probes must work reliably at high temperatures, in rain or under water. Meander MDR-10 (available in our shop). EMC-tested switching power supply with protective conductor connection, eg Meanwell MDR-10.
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Product
Thermocouple Probes
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sensor that measures temperature. It consists of two different types of metals, joined together at one end. When the junction of the two metals is heated or cooled, a voltage is created that can be correlated back to the temperature.
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Product
Voltage Probes
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An oscilloscope is only as good as its probes. Our range includes high voltage, differential, active, low capacitance, and passive types, with ranges to 30kV and frequency bandwidths to 5 GHz.
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Product
Bead Target Probes
Bead Target Probe
A methodology for placing test points directly on a PCB's copper traces, or top metal, thus forming a “Bead Probe”.
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Product
High Impedance Active Probes
28 AND 29
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Designed to serve the needs of integrated circuit engineers working in the most advanced high speed, submicron, MOS technology. These high frequency instruments include the attractive features of the Models 18C and 19 including full dc capability, negligible dc current drain, and extremely low input capacitance. In addition the frequency range of the Models 28 and 29 has been extended to a full 1 GHz.
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Product
Scanning Probes
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Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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Product
Current Probes
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Tektronix current probe solutions offer:*The broadest range of AC/DC and AC-only current probes*Measurement accuracy from uAs to 2000 A*Best-in-class bandwidth up to 120 MHz*Best-in-class current clamp sensitivity down to 1 mA*The only products with 3rd Party Safety Certification (UL, CSA, ETL)*The only products with bare wire voltage ratings*Automatic readout and scaling when used with Tektronix oscilloscopes so you don’t have to convert volts to amps or manually set the scaling
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Product
Mercury Probes
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Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
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Product
Solar Panel Probes
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*Effective *Reliable solution for non-destructive electrical contacting *For standard or custom applications
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Product
CP-2XX-6 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 69Full Travel (mm): 1.75Recommended Travel (mil): 59Recommended Travel (mm): 1.50Overall Length (mil): 236Overall Length (mm): 6.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Resistance & Resistivity Probes
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Surface and/or volume resistance measurements are key parameters in describing materials' electrical properties. ETS offers a variety of probes to support numerous industry requirements and applications.
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Product
HPA-50 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 590Overall Length (mm): 14.99
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Product
Ultrasonic Probes And Cables
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The cable connects the main body of ultrasound diagnostic equipment and the probe used for echographic investigation.
