Test Jumpers
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Product
MEASUREMENT QUALITY JUMPERS
4000-1065
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This kit includes two (2) Singlemode Enhanced MQJs (ST-to-Socket, 1 meter, SinglemodeEnhanced), two (2) Singlemode Enhanced MQJs (ST-to-Pin, 1 meter, SinglemodeEnhanced), two (2) Multimode MQJs (ST-to-Socket, 1 meter, Multimode), two (2)Multimode MQJs (ST-to-Pin, 1 meter, Multimode), two Snap Lock Plugs, and two SnapLock Receptacles.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Load-to-Line Jumpers
200
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TESCO’s Load-to-Line Jumpers (Catalog No. 200) allows the utility to perform meter maintenance without interruption of service to the downstream occupant. TESCO bypass jumpers are rated for 200 amps continuous duty and are made from a durable 1/8″ thick tin-plated copper with a durable insulating material covering everything except the blades.
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Product
Other Test Systems
Test System
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Physical Testing Test
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Physical Testing by Aero Nav: mechanical, weathering, environmental, immersion, electrical, luminance, thermal analysis, thermal conductivity, water exposure, saltwater exposure, etc.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Regenerative Battery Pack Test System
17020E
Test System
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Product
n-Line Jumpers on 0.100 [2.54] Centers
Series 152, 156 & 157
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In-Line Jumpers on .100 [2.54] Centers. End connectors have Gold plated, solid Brass pins on .100 [2.54] centers. Available single-ended (Series 156), double-ended (Series 157), or bare-ended (Series 152). Reliable, electronically tested solder connections.
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Product
Testing
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Apogee Labs offers a wide variety of modular chassis types used for test applications with various Data Link Test Modules.
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Product
Load Testing vs. Stress Testing
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A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
Compliance Test, Development and Test Service
DinoStor
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With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
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Product
Testing Services
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We are professionals who deliver software testing services. We are able to boost your software testing, increase product quality and reduce costs.
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Product
Game Testing
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Here at UpDoerTech, we strive to improve the gaming industry by providing the most comprehensive, accurate, and efficient testing mechanism. We've built an A/B testing framework so that you don't have to guess or speculate what gamers think of all your features. Our team of QA experts will help you find bugs early in the development process so that your product ships with fewer issues.
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Product
Test Enclosures
Enclosure
The HV test hood, developed by us in accordance with EN50191 standard (erection and operation of fixed and temporary electrical test installations), is designed for testing large quantities in ongoing production. The ergonomic design ensures fatigue-free operation even during repetitive work sequences. Equipped with all safety-relevant functions, such as safety switch and locking of the hood cover during the test sequence, the operator is optimally protected at all times.The interchangeable adapter plate within the test cell allows quick adaptation for different test conditions and test situations.
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Product
Test Fixtures
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Test fixtures are a product for the test and the testing of printed circuit boards. The test adapters offered by uwe electronic are suitable for both manual testing and automated testing with vacuum operation. The test fixture can be either fully equipped and wired or delivered without installed components. Pneumatic, Mechanical and Vacuum Fixtures.
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Product
Test Compliance
CTS Series 3.2
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AMETEK Programmable Power, Inc.
The CTS Series is a complete, turn-key compliance test system for EN IEC 1000-3-2 (Harmonics) Including A14, EN IEC 1000-3-3 (Flicker) and various EN IEC 1000-4 AC immunity tests. Consisting of an AC power source, a power analysis conditioning system (PACS) and a PC based data acquisition system, the CTS provides a complete turn-key solution for IEC testing. The Windows™ based CTS software performs the IEC tests and generates detailed test reports. Comprehensive data files are stored on disk to allow post test analysis.
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Product
Lightning Test
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Lightning testing is used to determine the ability of externally mounted electrical and electronic equipment to withstand the direct effects of a lightning strike.
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Product
Test Facility
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Emprise has extensive experience designing test facilities for the aerospace, automotive, industrial and power generation marketplaces. The cost of a test facility is usually directly proportional to the accuracy of the test simulation.
