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Precision Mechanical Calibration Kit, DC To 26.5 GHz, 3.5 Mm
85052C
The Keysight 85052C precision mechanical calibration kit contains precision standard devices to characterize the systematic errors of Keysight network analyzers in the 3.5 mm interface. This kit also contains adapters to change the gender of the test port and a torque wrench for proper connection.
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PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
784777-02
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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PNA Microwave Network Analyzer
N5222B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Thermal/Mechanical Testing
Accolade Engineering Solutions
As new products employ advanced materials and processes, the need to measure and characterize those material properties becomes increasingly important. DSC is used to measure heat flow in to or out of a material. Some DSC applications include measurement of melting temperature, polymorphic transitions, crystallization temperature, thermal stability, heat of fusion and degree of cure. TMA is used to measure dimensional changes of a material as a function of temperature.
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Embedded DisplayPort Electrical Performance and Characterization Toolset Software
D9040EDPV
Characterization testing of eDP designs now supporting AUX channel automation.
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High-Performance Multifunction Calibrator
5730A
The new 50 MHz wideband option for the 5730A High-Performance Multifunction Calibrator provides expanded wideband capabilities to self-maintaining laboratories by providing a method to calibrate the 50 MHz input of the 5790B AC Meaasurement Standard. This is accomplished by characterizing the 5730A's 50 MHz output using a precision thermal voltage converter (TVC), thus reducing uncertainties to calibrate the 5790B.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Fiber Optic Network Test
Test and characterize fiber optic cables, assemblies and network with unmatched speed, precision and spatial resolution. Luna’s OBR reflectometers can analyze loss with a spatial resolution and sensitivity unmatched in the industry.
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Low Voltage Differential Oscilloscope Probes
Differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a Tektronix low voltage differential oscilloscope probe ensures that you see every possible detail. Tektronix offers TriMode™ architecture which streamlines measurement acquisition by enabling you to make differential, single-ended, and common mode measurements with a single connection!
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Full-Size Loudspeakers
UPQ
Meyer Sound’s award-winning UPQ loudspeakers have been core components in both portable and installed systems for more than a decade. Characterized by a high power-to-size ratio; smooth, uniform coverage; and consistent polar response; these two-way, self-powered loudspeakers are available in three coverage patterns to fit any application, from FOH mains in small-to-midscale systems to fills in large systems.
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Dynamic Particle Image Analysis System
iSpect DIA-10
Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Bluetooth Measurement Interface
BTC-4148
The Portland Tool & Die BTC-4148 is a complete interface for measuring and characterizing Bluetooth audio devices including handsets, headsets, speakers, car kits and other devices with Bluetooth audio input or output.
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Mechanical Tester
TriboLab CMP
Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process.
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MUX-scrambling Modulator
SFT3316
Hangzhou Softel Optic Co., Ltd.
SFT3316 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 16 multiplexing channels, 16 scrambling channels and 16 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 16 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
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Functional Analyzers
Functional analyzers characterize the key properties of flour and grains to help manufacturers produce consistently high-quality baked goods and snack foods. Widely used in the wheat breeding, milling, and baking industries, our unique analyzers measure starch damage, sprout damage, solvent retention capacity, and impurities in flour and grain, providing multiple indicators for quality control.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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Power, Energy and Disturbance Analysers
Designed for test and maintenance departments working in industrial or administrative buildings, it can be used to obtain a snapshot of the main features characterizing the quality of the electrical network.
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Electronic Autocollimators
The concept of autocollimation as an optical instrument was conceived about a century ago for accurate, non-contact measurements of angles. Recent novel photonics upgrades have created a new breed of Autocollimators, offering intricate measurement capabilities for optics, laser profiling, AR/VR/XR goggles alignment, cameras for auto-driving, VCSEL characterization and many more applications with a single instrument packed with multi-tech technologies.
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Nanomechanical Test System
Hysitron TS 77 Select
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Battery Analyzers
BA6010 Series
The BA6010 Series battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. The BA6010 Series is suitable for characterizing battery chemistries that are responsive to a 1 kHz AC stimulus signal including lead acid, lithium and alkaline type batteries used in consumer products, electric vehicles, power backup, security, and fire alarm systems.
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Peak Power Analyzer
4500C
The Boonton Model 4500C is the instrument of choice for capturing, displaying, analyzing and characterizing microwave and RF power in both the time and statistical domains. It is ideal for design, verification, and troubleshooting of pulsed and noise-like signals used in commercial and military radar, electronic warfare (EW), wireless communications (e.g., LTE, LTE-A, and 5G), and consumer electronics (WLAN), as well as education and research applications.
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Device Modeling Products
Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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Microcalorimeters
TA Instruments’ Isothermal Titration Calorimetry (ITC), Differential Scanning Calorimetry (DSC), and Isothermal Calorimetry systems are powerful analytical techniques for in-depth characterization of molecular binding events and structural stability. Thermodynamic binding signatures not only reveal the strength of a binding event, but the specific or nonspecific driving forces involved. Structural stability profiles from DSC reveal strengths and weaknesses in higher order structure and define the behavior of individual domains and their interactions. The TA Instruments Affinity ITC, Nano ITC and Nano DSC provide the performance, reliability and ease-of-use required for the most demanding applications in drug discovery, protein-protein interactions, structure-function characterization and more.
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Keithley Automated Characterization Suite Software
ACS
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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WiGig RF Tester
IQgig-RF Model B
When used in conjunction with IQgig-IF, an optimized test solution for conducted testing of WiGig chipsets and baseband modules, the IQgig family products provide a total test solution for R&D characterization and high volume manufacturing.
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ATCA 5U 7 Slot replicated Mesh - dual shelf managers
109ATCA507-3000R
The 5U 7-slot ATCA backplane is a Replicated Mesh, compliant to the PICMG 3.0 Rev 3.0 specification. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-01
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
