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Deep-Level Transient Spectroscopy System
FT 1030
The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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Oil-in-Water Analyzer
HR25K
The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Liquid Cooling High Amp
qCf 12 High Amp
qCf Liquid Cooling High Amp: Our system for the professional characterization of fuel cells for high current densities and direct flow field cooling.
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Materials Test Systems
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Surface Plasmon Resonance Analysis
Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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WavePulser 40iX High-speed Interconnect Analyzer
WavePulser 40iX Series
WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox provides unmatched characterization insight of high-speed interconnects.
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Physical Contact Connectors
Amphenol Fiber Systems International
Physical Contact (PC) connections are characterized by the physical mating of two optical fibers. Precision ceramic ferrules are typically utilized for PC connections. A PC connection is accomplished by terminating the optical fiber into a precision ceramic ferrule. Epoxy is used to affix the fiber into the ferrule. The tip of the ceramic ferrule is polished in a precise manner to ensure that light enters and exits at a known trajectory with little scattering or optical loss. Polishing the terminated ceramic ferrule is a critical process in Physical Contact fiber optic connectors.
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Chromatography Detectors
Brookhaven Instruments Corporation
Detailed size or molar mass distribution information is useful in many areas such as investigating protein aggregation and understanding (or predicting) polymer properties. Since chromatography fractionates a sample before analysis, it is an ideal tool for characterizing these distributions.
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Oscilloscopes
Berkeley Nucleonics Corporation
Is a type of electronic test instrument that graphically displays varying voltages of one or more signals as a function of time. Their main purpose is capturing information on electrical signals for debugging, analysis, or characterization.
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Vector Signal Analyzers
Vector signal analyzers combine superheterodyne technology with high speed ADCs and other DSP technologies to provide fast FFT-based, high-resolution in-channel spectrum measurements, demodulation, and advanced time-domain analysis. A vector signal analyzer is especially useful for characterizing complex burst, transient, or modulated signals in aerospace & defense, radar, wireless communications, and avionics.
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ENA Vector Network Analyzer
E5071C
9 kHz to 4.5/6.5/8.5/14/20 GHz2- or 4-port, 50 ohm, S-parameter test set Improve accuracy, yield and margins with wide dynamic range 130 dB, fast measurement speed 8 ms and excellent temperature stability 0.005 dB/CObtain design confidence through complete characterization of high-speed serial interconnects with enhanced time domain analysis option Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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5U 6 slot ATCA backplane
109ATCA506-3013R
The 5U 6 slot ATCA backplane is a 6 slot replicated Mesh with radial IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Custom Bench Test
TestEdge provides customized bench test. If your device has specialized test requirements, it may be necessary to test your device using specialized bench equipment rather than traditional ATE. In other situations, both ATE and a custom bench setup may be required to fully characterize the device and provide necessary correlation. Finally, it may be useful to create a custom bench setup to facilitate device debug.
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EMC & RF Solutions
Microwave Absorbing Material Characterization System that measures the signal loss through a material sample in a frequency range of 5 15GHz (with the option of extension to lower frequencies).
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Scatterometers / Thin Film Metrology Systems
OptiPrime Series
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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Network Infrastructure Testing
Xena VulcanBay
Xena Networks’ VulcanBay is a scalable Gigabit TCP test chassis that offers extreme performance for stateful traffic load testing, analysis and characterizing of Ethernet equipment and network infrastructure. It supports 1/2.5/5/10/25/40GE interfaces and can be used for simulating millions of real-world end-user environments to test and validate infrastructure, a single device, or an entire system.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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PNA-L Microwave Network Analyzer
N5235B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to50 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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High Temperature Test System
129620A
Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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LXI Microwave Matrix, 10GHz, Single 3x3
60-750-133
The 60-750-133 is a single 3x3 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Ultra High Frequency Vibrometer
UHF-120
Polytec?s New UHF-120 Vibrometer Laser-Doppler Vibrometers (LDV) can characterize the out-of-plane vibrations at ultra-high frequencies. Polytec?s UHF-120 extends the vibration frequency bandwidthup to 600 MHz.
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Intelligent Sensors
Silicon Labs is a leading supplier of intelligent sensor solutions that are characterized by superb reliability, compact size, high levels of integration and unmatched ease of use for a variety of applications. Our diverse sensor product portfolio includes optical sensors, digital relative I2C humidity and temperature sensor ICs, biometric sensors and capacitive touch sense microcontroller devices.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Magnet Testing
Helmholtz Coils
A coil arrangement consisting of two coils with the same radius or edge length is called a Helmholtz coil. At the correct distance, these coils are arranged in parallel on the same axis and current flows through them in the same direction. Their magnetic field is then characterized by a large homogeneous area in the center of the coil, which is freely accessible for experiments and measurement tasks. Helmholtz coils can have a circular or square geometric shape.
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Characterization Of VCSEL Arrays Including Polarization Analysis
Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
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Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Power Device Analyzer / Curve Tracer
B1505A
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
